Scanning Electron Microscopes

Thermo Fischer (FEI) DB STRATA400 system, built in 2005 and located in Dresden, Germany. Configured for sample analysis and measurement, it features a fully digital Field Emission Scanning Electron Microscope (FE-SEM) with Focused Ion Beam (FIB) technology for failure analysis.Specifications Manufacturer: Thermo Fischer (FEI) Model: DB STRATA400 Vintage: 2005 Serial Number: D1053 Location: Dresden, Germany Tool ID: FIB302 Tool Status: Connected Fab Section: Failure Analysis Process: Sample Analysis / Measurement Configuration Main Tool Not Included Chiller

Make: Thermo Fischer (FEI)

Model: DB STRATA400

1 unit @ Best Price

Tool ID: MDRS601

Make: AMAT

Model: OPAL 9300

1 unit @ Best Price

Darkfield inspection Tool ID: YDFI731

Make: KLA -Tencor

Model: AITXUV

1 unit @ Best Price

Wafer scanning Tool ID: YDFI735

Make: KLA -Tencor

Model: AITXUV

1 unit @ Best Price

Wafer scanning Tool ID: YDFI734

Make: KLA -Tencor

Model: AITXUV

1 unit @ Best Price

Wafer scanning Tool ID: YDFI733

Make: KLA -Tencor

Model: AITXUV

1 unit @ Best Price

Wafer scanning Tool ID: YDFI732

Make: KLA -Tencor

Model: AITXUV

1 unit @ Best Price

Defect review SEM Tool ID: YSEM732

Make: AMAT

Model: G3 Lite

1 unit @ Best Price