 |
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
Make |
Model |
|
|
$ |
|
 |
254374
|
Advantest
|
Advantest |
V93000 |
in Metrology Equipment
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
249580
|
Advantest
|
Advantest |
Verigy |
in Metrology Equipment
|
1
|
|
Inquire |
 |
East Fishkill, New York, United States |
|
 |
257118
|
Aetrium
|
Aetrium |
1164 |
in Metrology Equipment
AETRIUM 1164, S/N: 130:Reliability Test System
|
1
|
|
Inquire |
N* |
Dresden, Saxony, Germany |
|
 |
257119
|
Aetrium
|
Aetrium |
1164 |
in Metrology Equipment
AETRIUM 1164, S/N: 130:Reliability Test System
|
1
|
|
Inquire |
N* |
Dresden, Saxony, Germany |
|
 |
257146
|
Aetrium
|
Aetrium |
1164 |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Dresden, Saxony, Germany |
|
 |
257148
|
Aetrium
|
Aetrium |
1164 |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Dresden, Saxony, Germany |
|
 |
257147
|
Aetrium
|
Aetrium |
1164 |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Dresden, Saxony, Germany |
|
 |
257153
|
AMAT
|
AMAT |
Complus MP |
in Metrology Equipment
AMAT Complus MP, 200mm, s/n: T236:Defect Inspection
|
1
|
|
Inquire |
N* |
Burlington, Vermont, United States |
|
 |
251076
|
Applied Materials
|
Applied Materials |
NanoSEM 3D |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
254250
|
AMAT
|
AMAT |
UVision 6 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
252611
|
Applied Materials
|
Applied Materials |
Verity1 SEM |
in Microscopes, Optical Inspection
AMAT Verity1 SEM, 300mm, s/n: U-757:Applied VeritySEM
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
248208
|
Applied Materials
|
Applied Materials |
G3 Lite |
in Microscopes, Optical Inspection
AMAT, G3 Lite, 300mm, S/N W3041:AMAT, G3 Lite, 300mm, S/N W3041
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
204911
|
Applied Materials
|
Applied Materials |
Uvision 5 |
in Microscopes, Optical Inspection
Applied Materials, Uvision5, Bright Field Inspection, 300mm:Applied Materials, Uvision5, Bright Field Inspection, 300mm In the fab, Idle
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
257150
|
Arcadia Engineering
|
Arcadia Engineering |
AG-112A |
in Metrology Equipment
Arcadia AG-112A, 300mm, s/n: N331372:CONTACT ANGLE MEASUREMENT
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
 |
252767
|
BRUKER D8 Davinci, s/n: 12/12-113
|
BRUKER D8 Davinci, s/n: 12/12-113 |
in Metrology Equipment
BRUKER D8 Davinci, s/n: 12/12-113:Bruker D8 DaVinci X-Ray Diffractometer
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
254246
|
BRUKER D8 Discover, 300mm, s/n: 205935
|
BRUKER D8 Discover, 300mm, s/n: 205935 |
in Metrology Equipment
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
252770
|
BRUKER D8 Fabline, 300mm, s/n: 205934
|
BRUKER D8 Fabline, 300mm, s/n: 205934 |
in Metrology Equipment
BRUKER D8 Fabline, 300mm, s/n: 205934:Bruker D8 Fabline X-Ray Diffractometer
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
253457
|
BRUKER D8 Fabline, 300mm, s/n: 208564
|
BRUKER D8 Fabline, 300mm, s/n: 208564 |
in Metrology Equipment
BRUKER D8 Fabline, 300mm, s/n: 208564:BRUKER D8 FABLINE XRAY DEFRACTION
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
252773
|
Bruker
|
Bruker |
Dimension 5000 |
in Metrology Equipment
BRUKER Dimension 5000, 300mm, s/n: 239-CAP:Bruker Dimension 5000 AFM
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
252774
|
Cameca
|
Cameca |
FlexTAP |
in Metrology Equipment
CAMECA FlexTAP, s/n: 16:Atom Probe Tomography
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
252772
|
CAMECA LEAP 4000x Si, s/n: 5059
|
CAMECA LEAP 4000x Si, s/n: 5059 |
in Metrology Equipment
CAMECA LEAP 4000x Si, s/n: 5059:Cameca LEAP 4000x Si Atom Probe Tomography
|
1
|
|
Inquire |
 |
Santa Clara, California, United States |
|
 |
254378
|
FEI
|
FEI |
Titan cubed G2 60-300 |
in Metrology Equipment
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
253754
|
FILMETRICS
|
FILMETRICS |
F50 |
in Test, Analysis and Measurement Equipment
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
251081
|
HMI
|
HMI |
ESCAN380 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
253752
|
HSEB
|
HSEB |
MMT 300 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
253234
|
HSEB
|
HSEB |
MMT300 V2 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
202816
|
HSEB
|
HSEB |
Axiospect 301 |
in Microscopes, Optical Inspection
HSEB, Axiospect 301, Optical Microscope, 300mm:HSEB, Axiospect 301, Optical Microscope, 300mm Cold. Not working parts include: - Tango Controller (Microscope Stage controller
- Joystick and keyboard controller
- Micromotor for fingers edge gripper
- few powers supplies
The tool was running with Windows XP professional 2002 service pack 3.
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
202817
|
HSEB
|
HSEB |
Axiospect 301 |
in Microscopes, Optical Inspection
HSEB, Axiospect 301, Optical Microscope, 300mm:HSEB, Axiospect 301, Optical Microscope, 300mm
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
257149
|
Instron
|
Instron |
5564 |
in Metrology Equipment
INSTRON 5564, s/n: 5564J2710:Pull Tester
|
1
|
|
Inquire |
N* |
Dresden, Saxony, Germany |
|
 |
254068
|
Keithley Instruments
|
Keithley Instruments |
S425 |
in Test, Analysis and Measurement Equipment
KEITHLEY S425, s/n: QMO2572:Keithley standard matrix kerf tester
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
254069
|
Keithley Instruments
|
Keithley Instruments |
S425 |
in Test, Analysis and Measurement Equipment
KEITHLEY S425, s/n: QMO2573:Kerf Parametric Tester
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
254076
|
Keithley Instruments
|
Keithley Instruments |
S425 |
in Test, Analysis and Measurement Equipment
KEITHLEY S425, s/n: QMO2591:Kerf Parametric Tester
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
254070
|
Keithley Instruments
|
Keithley Instruments |
S425 |
in Test, Analysis and Measurement Equipment
KEITHLEY S425, s/n: QMO2593:Kerf Parametric Tester
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
254071
|
Keithley Instruments
|
Keithley Instruments |
S475 |
in Test, Analysis and Measurement Equipment
KEITHLEY S475, s/n: QMO2733:25 pin kerf tester
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
254072
|
Keithley Instruments
|
Keithley Instruments |
S475 |
in Test, Analysis and Measurement Equipment
KEITHLEY S475, s/n: QMO2734:1x25 Kerf Tester
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
254073
|
Keithley Instruments
|
Keithley Instruments |
S475 |
in Test, Analysis and Measurement Equipment
KEITHLEY S475, s/n: QMO2738:1x25 pin kerf tester
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
254074
|
Keithley Instruments
|
Keithley Instruments |
S475 |
in Test, Analysis and Measurement Equipment
KEITHLEY S475, s/n: QMO2739:1x25 Kerf Tester
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
254075
|
Keithley Instruments
|
Keithley Instruments |
S475 |
in Test, Analysis and Measurement Equipment
KEITHLEY S475, s/n: QMO2792:Keithley 475 Kerf Tester
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
254077
|
Keithley Instruments
|
Keithley Instruments |
S600 |
in Test, Analysis and Measurement Equipment
KEITHLEY S600, s/n: QMO4104:25 pin kerf tester
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
254235
|
Keithley Instruments
|
Keithley Instruments |
S630 |
in Test, Analysis and Measurement Equipment
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
254152
|
Keysight
|
Keysight |
4062UX |
in Metrology Equipment
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
254151
|
Keysight
|
Keysight |
4062UX |
in Metrology Equipment
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
254153
|
Keysight
|
Keysight |
4062UX |
in Metrology Equipment
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
254154
|
Keysight
|
Keysight |
4062UX |
in Metrology Equipment
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
251079
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
251077
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
254255
|
KLA-Tencor
|
KLA-Tencor |
2835 |
in Microscopes, Optical Inspection
KLA 2835, 300mm, s/n: 1340334:Brightfield Inspection
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
251078
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
251080
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
251617
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
257171
|
KLA -Tencor
|
KLA -Tencor |
alpha step |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Burlington, Vermont, United States |
|
 |
257170
|
KLA -Tencor
|
KLA -Tencor |
alpha step |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Burlington, Vermont, United States |
|
 |
257152
|
KLA -Tencor
|
KLA -Tencor |
ASET-F5x |
in Metrology Equipment
KLA ASET-F5x, 300mm, s/n: 200608080726:Thickness Measurement
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
 |
257174
|
KLA-Tencor
|
KLA-Tencor |
RS100C |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
 |
255109
|
KLA-Tencor
|
KLA-Tencor |
SPECTRACD-XT |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
252339
|
KLA-Tencor
|
KLA-Tencor |
SPECTRACD-XT |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
252340
|
KLA-Tencor
|
KLA-Tencor |
SPECTRACD-XT |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
253040
|
KLA-Tencor
|
KLA-Tencor |
AIT II |
in Microscopes, Optical Inspection
KLA Tencor AIT II, 200mm, s/n: 9145:KLA-Tencor AIT II w/ ADC. Defect Inspection
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
253033
|
KLA-Tencor
|
KLA-Tencor |
AIT II |
in Microscopes, Optical Inspection
KLA Tencor AIT II, 200mm, s/n: 9234:AIT II w/ ADC. Defect Inspection Tool
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
254149
|
KLA-Tencor
|
KLA-Tencor |
OP3260I |
in Microscopes, Optical Inspection
KLA Tencor OP3260I, 200mm, s/n: 6678:Film thickness measurement
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
254147
|
KLA-Tencor
|
KLA-Tencor |
UV1280SE |
in Microscopes, Optical Inspection
KLA Tencor UV1280SE, 200mm, s/n: 991098:Film thickness measurement tool
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
253038
|
KLA-Tencor
|
KLA-Tencor |
AIT II |
in Microscopes, Optical Inspection
KLA-Tencor AIT II, 200mm, s/n: 9152:AIT II w/ ADC. Defect Inspection
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
253037
|
KLA-Tencor
|
KLA-Tencor |
AIT II |
in Microscopes, Optical Inspection
KLA-Tencor AIT II, 200mm, s/n: 9262:AIT II w/ ADC. Defect Inspection Tool
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
253039
|
KLA-Tencor
|
KLA-Tencor |
AIT |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
254084
|
KLA-Tencor
|
KLA-Tencor |
EDR 5200 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
254087
|
KLA-Tencor
|
KLA-Tencor |
EDR 5210 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
254086
|
KLA-Tencor
|
KLA-Tencor |
EDR 5210 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
254085
|
KLA-Tencor
|
KLA-Tencor |
EDR 5210 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
252775
|
Kobelco
|
Kobelco |
HRBS |
in Metrology Equipment
KOBELCO HRBS, s/n: ED10020:High Resolution Rutherford Backscattering
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
250990
|
MDC
|
MDC |
SIGNATION S480 |
in Metrology Equipment
MDC, SIGNATION S480, 200mm, sn: 309:MDC FOR GATE OXIDE ANALYSIS
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
241510
|
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm
|
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm |
in Microscopes, Optical Inspection
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm:NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
257115
|
Nova
|
Nova |
3090next |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
N* |
Dresden, Saxony, Germany |
|
 |
257116
|
Nova
|
Nova |
3090next |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
N* |
Dresden, Saxony, Germany |
|
 |
257117
|
Nova
|
Nova |
3090next |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
N* |
Dresden, Saxony, Germany |
|
 |
252607
|
Nova
|
Nova |
T500 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
East Fishkill, New York, United States |
|
 |
254369
|
Park System NX-Hivac, 300mm, s/n: 40788
|
Park System NX-Hivac, 300mm, s/n: 40788 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Santa Clara, California, United States |
|
 |
253236
|
Phoenix
|
Phoenix |
Micromex SE160T |
in Metrology Equipment
PHOENIX Micromex SE160T, 300mm, s/n: PA1529:PHOENIX_X-Ray Systems
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
257166
|
QUALITAU
|
QUALITAU |
MIRA |
in Metrology Equipment
QualiTau MIRA, 300mm, s/n: M2200011:MIRA Mainframe Controller, S/N M2200011 - 450C oven, Model Z-450: S/N 397 - S/N 398 - S/N 405 - S/N 407
|
1
|
|
Inquire |
N* |
Dresden, Saxony, Germany |
|
 |
249037
|
RCS
|
RCS |
300PS-M100 |
in Metrology Equipment
RCS 300PS-M100, SN: B141PS-001, 300 mm:Semi Auto Pad Shave Tool RSV Automation PDS01
|
1
|
|
Inquire |
 |
East Fishkill, New York, United States |
|
 |
253031
|
Rudolph Technologies
|
Rudolph Technologies |
S3000-S |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
250932
|
Rudolph Research
|
Rudolph Research |
ws-3000hs |
in Metrology Equipment
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
254201
|
RVSI
|
RVSI |
ws3500/3800 upgrade |
in Metrology Equipment
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
254200
|
RVSI
|
RVSI |
ws3500/3800 upgrade |
in Metrology Equipment
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
254079
|
Sartorius
|
Sartorius |
LA310S |
in Metrology Equipment
Sartorius LA310S, s/n: 13110486:Scale for Weight Control
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
257172
|
Sonix
|
Sonix |
Quantum Q350 |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Dresden, Saxony, Germany |
|
 |
248242
|
Tokyo Electron Ltd
|
Tokyo Electron Ltd |
P12XL |
in Metrology Equipment
TEL, P12XL, 300mm, s/n: PH04204:TEL P12XL Prober
|
1
|
|
Inquire |
 |
East Fishkill, New York, United States |
|
 |
254108
|
Zeiss
|
Zeiss |
NanoFab |
in Metrology Equipment
Zeiss NanoFab, s/n: 6015:Focus Ion Beam Mill
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|