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Group Listings into sub-categories under Laboratory EquipmentGroup Listings into sub-categories under Laboratory Equipment

List all 24 product types under Laboratory EquipmentList all 24 product types under Laboratory Equipment


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 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
238042
Advantest  

Advantest  

93000 

List all items of this typeReliability Test Equipment

in Metrology Equipment

ADVANTEST 93000, sn: DE04601132, Logic and Memory functional tester:

ADVANTEST 93000, sn: DE04601132, Logic and Memory functional tester

1 Inquire East Fishkill, New York, United States
238044
Advantest  

Advantest  

93000 

List all items of this typeReliability Test Equipment

in Metrology Equipment

ADVANTEST 93000, sn: DE04601138, Logic and memory functional test:

ADVANTEST 93000, sn: DE04601138, Logic and memory functional test

1 Inquire East Fishkill, New York, United States
244640
Advantest  

Advantest  

93000 

List all items of this typeReliability Test Equipment

in Metrology Equipment

ADVANTEST 93000, sn: DE04601388, Logic and memory functional test:

ADVANTEST 93000, sn: DE04601388, Logic and memory functional test

1 Inquire East Fishkill, New York, United States
238045
Advantest  

Advantest  

93000 

List all items of this typeReliability Test Equipment

in Metrology Equipment

ADVANTEST 93000, sn: MY04600193, Logic and memory functional test:

ADVANTEST 93000, sn: MY04600193, Logic and memory functional test

1 Inquire East Fishkill, New York, United States
238046
Advantest  

Advantest  

93000 

List all items of this typeReliability Test Equipment

in Metrology Equipment

ADVANTEST 93000, sn: MY04600539, Logic and memory functional test:

ADVANTEST 93000, sn: MY04600539, Logic and memory functional test

1 Inquire East Fishkill, New York, United States
246604
Applied Materials  

Applied Materials  

CENTURA EPI 

List all items of this typeSingle Chamber RTP Tools

in Wafer Fabrication Equipment

AMAT, CENTURA EPI, 200mm, S/N 21792:

AMAT, CENTURA EPI, 200mm, S/N 21792

1 Inquire Singapore, Singapore
246375
Applied Materials  

Applied Materials  

CENTURA 

List all items of this typeSingle Chamber RTP Tools

in Wafer Fabrication Equipment

AMAT, Centura, sn: 402970-R3-MAC, 300mm:

AMAT Centura 300mm

1 Inquire East Fishkill, New York, United States
204911
Applied Materials  

Applied Materials  

Uvision 5 

List all items of this typeOptical Inspection - Other

in Microscopes, Optical Inspection

Applied Materials, Uvision5, Bright Field Inspection, 300mm:

Applied Materials, Uvision5, Bright Field Inspection, 300mm

In the fab, Idle

 

 

 

1 Inquire Malta, New York, United States
241154
Bruker  

Bruker  

D8 Fabline 

List all items of this typeXray Diffractometers

in Metrology Equipment

BRUKER, D8 Fabline, 300 mm, BRUKER D8 FABLINE XRAY DEFRACTION:

BRUKER, D8 Fabline, 300 mm

BRUKER D8 FABLINE XRAY DEFRACTION

1 Inquire Dresden, Saxony, Germany
209828
Bruker, D8FABLINE, 300mm, X-Ray Metrology 
Bruker, D8FABLINE, 300mm, X-Ray Metrology 

List all items of this typeMicroscope Inspection Items - Other

in Microscopes, Optical Inspection

Bruker, D8FABLINE, 300mm, X-Ray Metrology:

Bruker, D8FABLINE, 300mm, X-Ray Metrology

 

1 Inquire Malta, New York, United States
240475
ECEC  

ECEC  

Micron2 

List all items of this typeScientific and Laboratory Equipment - Other

in Metrology Equipment

ECEC, Micron2, s/n:15-308, Assembly, Die Attach:

ECEC, Micron2, s/n:15-308, Assembly, Die Attach

1 Inquire Dresden, Saxony, Germany
242920
Electroglas  

Electroglas  

2001X 

List all items of this typeParametric Wafer Testers

in Test, Analysis and Measurement Equipment

Electroglas, 2001X, s/n: 96040033. Tool ID: 514164B:

Electroglas, 2001X, s/n: 96040033. Tool ID: 514164B

ELECTROGLAS 2001X Wafer Prober

1 Inquire Santa Clara, California, United States
242919
Electroglas  

Electroglas  

2001X 

List all items of this typeParametric Wafer Testers

in Test, Analysis and Measurement Equipment

Electroglas, 2001X, s/n: P84020452/110152. Tool ID: 79X6817AG:

Electroglas, 2001X, s/n: P84020452/110152. Tool ID: 79X6817AG

ELECTROGLAS 2001X Wafer Prober

1 Inquire Burlington, Vermont, United States
242917
Electroglas  

Electroglas  

2001X 

List all items of this typeParametric Wafer Testers

in Test, Analysis and Measurement Equipment

Electroglas, 2001X, s/n: Unknown. Tool ID: 4785151CZ:

Electroglas, 2001X, s/n: Unknown. Tool ID: 4785151CZ

ELECTROGLAS 2001X Wafer Prober

1 Inquire Burlington, Vermont, United States
242916
Electroglas  

Electroglas  

2001X 

List all items of this typeParametric Wafer Testers

in Test, Analysis and Measurement Equipment

Electroglas, 2001X, s/n: WMP91030194/141911, ELECTROGLAS 2001X Wafer Prober:

Electroglas, 2001X, s/n: WMP91030194/141911

ELECTROGLAS 2001X Wafer Prober

1 Inquire Burlington, Vermont, United States
242918
Electroglas  

Electroglas  

2001X 

List all items of this typeParametric Wafer Testers

in Test, Analysis and Measurement Equipment

Electroglas, 2001X, s/n: WMP91110219/145449. Tool ID: 79X6817BX:

Electroglas, 2001X, s/n: WMP91110219/145449. Tool ID: 79X6817BX

ELECTROGLAS 2001X Wafer Prober

1 Inquire Burlington, Vermont, United States
230317
FEI  

FEI  

ExSolve CLM next Gen 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, ExSolve CLM next Gen, 300mm, S/N 9923535:

FEI, ExSolve CLM next Gen, 300mm, S/N 9923535

1 Inquire Malta, New York, United States
230318
FEI  

FEI  

ExSolve CLM next Gen 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, ExSolve CLM next Gen, 300mm, S/N 9923609:

FEI, ExSolve CLM next Gen, 300mm, S/N 9923609

1 Inquire Malta, New York, United States
237745
HMI  

HMI  

eScan 500 

List all items of this typeScanning Electron Microscopes

in Microscopes, Optical Inspection

HMI eScan 500, sn: ML07114, Defect Review, 300mm:

HMI eScan 500, sn: ML07114, Defect Review, 300mm

1 Inquire Malta, New York, United States
202816
HSEB  

HSEB  

Axiospect 301 

List all items of this typeWafer Inspection Microscopes

in Microscopes, Optical Inspection

HSEB, Axiospect 301, Optical Microscope, 300mm:

HSEB, Axiospect 301, Optical Microscope, 300mm

Cold.  Not working parts include: 

  • Tango Controller (Microscope Stage controller
  • Joystick and keyboard controller
  • Micromotor for fingers edge gripper
  • few powers supplies

The tool was running with Windows XP professional 2002 service pack 3.

1 Inquire Malta, New York, United States
202817
HSEB  

HSEB  

Axiospect 301 

List all items of this typeWafer Inspection Microscopes

in Microscopes, Optical Inspection

HSEB, Axiospect 301, Optical Microscope, 300mm:

HSEB, Axiospect 301, Optical Microscope, 300mm

1 Inquire Malta, New York, United States
240478
Instron  

Instron  

5564 

List all items of this typeScientific and Laboratory Equipment - Other

in Metrology Equipment

INSTRON, 5564, s/n: 5564J2710, Pull Tester:

INSTRON, 5564, s/n: 5564J2710, Pull Tester

1 Inquire Dresden, Saxony, Germany
236360
Keithley  

Keithley  

S425 

List all items of this typeReliability Test Equipment

in Metrology Equipment

KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2591:

KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2591

1 Inquire Burlington, Vermont, United States
236359
Keithley  

Keithley  

S425 

List all items of this typeReliability Test Equipment

in Metrology Equipment

KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2593:

KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2593

1 Inquire Burlington, Vermont, United States
192419
Keithley Instruments  

Keithley Instruments  

S425 

List all items of this typeReliability Test Equipment

in Metrology Equipment

Keithley, S425, Kerf Test, S/N QMO2572:

Keithley, S425, Kerf Test, S/N QMO2572

Keithley standard matrix kerf tester

1 Inquire Burlington, Vermont, United States
192418
Keithley Instruments  

Keithley Instruments  

S425 

List all items of this typeReliability Test Equipment

in Metrology Equipment

Keithley, S450, Kerf Parametric Tester, S/N: QMO2573:

Keithley, S450, Kerf Parametric Tester, S/N: QMO2573

1 Inquire Burlington, Vermont, United States
238974
Keithley  

Keithley  

S475 

List all items of this typeReliability Test Equipment

in Metrology Equipment

KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2593:

KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2593

1 Inquire Burlington, Vermont, United States
238977
Keithley  

Keithley  

S475 

List all items of this typeReliability Test Equipment

in Metrology Equipment

KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2733:

KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2733

1 Inquire Burlington, Vermont, United States
238976
Keithley  

Keithley  

S475 

List all items of this typeReliability Test Equipment

in Metrology Equipment

KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2734:

KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2734

1 Inquire Burlington, Vermont, United States
238975
Keithley  

Keithley  

S475 

List all items of this typeReliability Test Equipment

in Metrology Equipment

KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2738:

KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2738

1 Inquire Burlington, Vermont, United States
238973
Keithley  

Keithley  

S475 

List all items of this typeReliability Test Equipment

in Metrology Equipment

KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2792:

KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2792

1 Inquire Burlington, Vermont, United States
238978
Keithley  

Keithley  

S600 

List all items of this typeReliability Test Equipment

in Metrology Equipment

KEITHLEY, S600, 25 pin kerf tester, s/n: QMO4104:

KEITHLEY, S600, 25 pin kerf tester, s/n: QMO4104

1 Inquire Burlington, Vermont, United States
242614
Keithley  

Keithley  

S630 

List all items of this typeReliability Test Equipment

in Metrology Equipment

KEITHLEY, S630, 200mm, Parametric Test System, s/n: QMO4105:

KEITHLEY, S630, Parametric Test System, s/n: QMO4105

1 Inquire Burlington, Vermont, United States
237748
KLA-Tencor  

KLA-Tencor  

AMI2900 

List all items of this typeWafer Inspection Microscopes

in Microscopes, Optical Inspection

KLA AMI2900, sn: V000283, 300mm:

KLA AMI2900, sn: V000283, 300mm

KLA Advanced Macro Inspection Module

 

1 Inquire Malta, New York, United States
243279
LAM  

LAM  

2300 KIYO FX 

List all items of this typeSingle Chamber RTP Tools

in Wafer Fabrication Equipment

LAM, 2300 KIYO FX, 300mm, ETX2300U6:

ETX2300U2-T LAM-E5 KIYO FX

HYDRA ARIA CORVUS-UPGRADE TO REPURPOSE ETX

LAM, 2300 KIYO FX, 300mm, ETX2300U6

SN:

KFXE-482(F1514910) - PM2
KFXE-482(F1514910) - PM3
KFXE-482(F1514910) - PM4

1 Inquire F* Malta, New York, United States
236970
Advantest  

Advantest  

V93000 

List all items of this typeReliability Test Equipment

in Metrology Equipment

LD96, Advantest, V93000, s/n PL000396, Logic and Memory Functional Tester:

LD96

Advantest, V93000, s/n PL000396, Logic and Memory Functional Tester

1 Inquire East Fishkill, New York, United States
241155
Lintec  

Lintec  

RAD-2500M/8 

List all items of this typeScientific and Laboratory Equipment - Other

in Metrology Equipment

Lintec Corp. RAD-2500M/8, 200mm, s/n: D1S-2575-AW:

Lintec Corp. RAD-2500M/8, 200mm, s/n: D1S-2575-AW

1 Inquire Dresden, Saxony, Germany
242617
Mosaid  

Mosaid  

M420501 

List all items of this typeReliability Test Equipment

in Metrology Equipment

MOSAID, M420501, 200mm, s/n: 3654, Tool ID: KTH91M:

MOSAID, M420501, 200mm, s/n: 3654, Tool ID: KTH91M

MOSAID Memory Test System

1 Inquire Burlington, Vermont, United States
242616
Mosaid  

Mosaid  

M420501 

List all items of this typeReliability Test Equipment

in Metrology Equipment

MOSAID, M420501, 200mm, s/n: 3674, Tool ID: KTH90M:

MOSAID, M420501, 200mm, s/n: 3674, Tool ID: KTH90M

MOSAID Memory Test System

1 Inquire Burlington, Vermont, United States
241510
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm 
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm 

List all items of this typeMicroscope Inspection Items - Other

in Microscopes, Optical Inspection

NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm:

NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm

1 Inquire Malta, New York, United States
246474
Nitto  

Nitto  

NEL-DR3000IV 

List all items of this typeScientific and Laboratory Equipment - Other

in Metrology Equipment

NITTO, NEL-DR3000IV, sn: B491L22, 300mm, BSTA2:

NITTO, NEL-DR3000IV, sn: B491L22, 300mm, BSTA2

Nitto Backside Taper

1 Inquire East Fishkill, New York, United States
245895
RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa 
RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa 

List all items of this typeMicroscope Inspection Items - Other

in Microscopes, Optical Inspection

RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa:

RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa

RVSI VISUAL DEFECT SCANNER

1 Inquire Burlington, Vermont, United States
245894
RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra 
RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra 

List all items of this typeMicroscope Inspection Items - Other

in Microscopes, Optical Inspection

RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra:

RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra

inspection scanner

1 Inquire Burlington, Vermont, United States
240476
Sartorius  

Sartorius  

LA310S 

List all items of this typeScientific and Laboratory Equipment - Other

in Metrology Equipment

SARTORIUS, LA310S, s/n: 13110486:

SARTORIUS, LA310S, s/n: 13110486

1 Inquire Dresden, Saxony, Germany
240456
Sonix  

Sonix  

Quantum 350 

List all items of this typeReliability Test Equipment

in Metrology Equipment

SONIX, Quantum 350, s/n: Q350C018-0103M, analysis, reliability, investigation:

SONIX, Quantum 350, s/n: Q350C018-0103M, analysis, reliability, investigation

1 Inquire Dresden, Saxony, Germany
247028
Thermo Fisher  

Thermo Fisher  

THETA300 MKII 

List all items of this typeScientific and Laboratory Equipment - Other

in Metrology Equipment

THERMO FISHER, THETA300 MKII, 300mm, s/n: A1188, Physical Failure Analysis:

THERMO FISHER, THETA300 MKII, 300mm, s/n: A1188, Physical Failure Analysis

THETA 300XPS (X-Ray photo electron spectroscopy)

1 Inquire N* Dresden, Saxony, Germany
246567
Ultratech Inc  

Ultratech Inc  

LSA100A 

List all items of this typeSingle Chamber RTP Tools

in Wafer Fabrication Equipment

ULTRATECH LSA100A, s/n: 6114, Laser Spike Anneal:

Laser Spike Anneal

1 Inquire Dresden, Saxony, Germany
244284
Zeiss  

Zeiss  

Merlin 

List all items of this typeScanning Electron Microscopes

in Microscopes, Optical Inspection

ZEISS, Merlin, sn: 4234, Zeiss Merlin Scanning Electron Microscope:

ZEISS, Merlin, sn: 4234, Zeiss Merlin Scanning Electron Microscope

 

1 Inquire Malta, New York, United States


*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.