![Offered (box) or Wanted (coins)](images/sides.gif) |
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
Make |
Model |
|
|
$ |
|
![Offer](/dpimages/istat0.gif) |
238042
|
Advantest
|
Advantest |
93000 |
in Metrology Equipment
ADVANTEST 93000, sn: DE04601132, Logic and Memory functional tester:ADVANTEST 93000, sn: DE04601132, Logic and Memory functional tester
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
East Fishkill, New York, United States |
|
![Offer](/dpimages/istat0.gif) |
238044
|
Advantest
|
Advantest |
93000 |
in Metrology Equipment
ADVANTEST 93000, sn: DE04601138, Logic and memory functional test:ADVANTEST 93000, sn: DE04601138, Logic and memory functional test
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
East Fishkill, New York, United States |
|
![Offer](/dpimages/istat0.gif) |
244640
|
Advantest
|
Advantest |
93000 |
in Metrology Equipment
ADVANTEST 93000, sn: DE04601388, Logic and memory functional test:ADVANTEST 93000, sn: DE04601388, Logic and memory functional test
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
East Fishkill, New York, United States |
|
![Offer](/dpimages/istat0.gif) |
238045
|
Advantest
|
Advantest |
93000 |
in Metrology Equipment
ADVANTEST 93000, sn: MY04600193, Logic and memory functional test:ADVANTEST 93000, sn: MY04600193, Logic and memory functional test
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
East Fishkill, New York, United States |
|
![Offer](/dpimages/istat0.gif) |
238046
|
Advantest
|
Advantest |
93000 |
in Metrology Equipment
ADVANTEST 93000, sn: MY04600539, Logic and memory functional test:ADVANTEST 93000, sn: MY04600539, Logic and memory functional test
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
East Fishkill, New York, United States |
|
![Offer](/dpimages/istat0.gif) |
249580
|
Advantest
|
Advantest |
Verigy |
in Metrology Equipment
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
East Fishkill, New York, United States |
|
![Offer](/dpimages/istat0.gif) |
248208
|
Applied Materials
|
Applied Materials |
G3 Lite |
in Microscopes, Optical Inspection
AMAT, G3 Lite, 300mm, S/N W3041:AMAT, G3 Lite, 300mm, S/N W3041
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
Singapore, Singapore |
|
![Offer](/dpimages/istat0.gif) |
204911
|
Applied Materials
|
Applied Materials |
Uvision 5 |
in Microscopes, Optical Inspection
Applied Materials, Uvision5, Bright Field Inspection, 300mm:Applied Materials, Uvision5, Bright Field Inspection, 300mm In the fab, Idle
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
Malta, New York, United States |
|
![Offer](/dpimages/istat0.gif) |
248206
|
ASM
|
ASM |
ASM3200 |
in Wafer Fabrication Equipment
ASM, ASM3200, 300mm, S/N 034120:ASM, ASM3200, 300mm, S/N 034120
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
Singapore, Singapore |
|
![Offer](/dpimages/istat0.gif) |
209828
|
Bruker, D8FABLINE, 300mm, X-Ray Metrology
|
Bruker, D8FABLINE, 300mm, X-Ray Metrology |
in Microscopes, Optical Inspection
Bruker, D8FABLINE, 300mm, X-Ray Metrology:Bruker, D8FABLINE, 300mm, X-Ray Metrology
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
Malta, New York, United States |
|
![Offer](/dpimages/istat0.gif) |
248238
|
Hitachi
|
Hitachi |
CG4100 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
East Fishkill, New York, United States |
|
![Offer](/dpimages/istat0.gif) |
249581
|
Hitachi
|
Hitachi |
CG4100 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
East Fishkill, New York, United States |
|
![Offer](/dpimages/istat0.gif) |
237745
|
HMI
|
HMI |
eScan 500 |
in Microscopes, Optical Inspection
HMI eScan 500, sn: ML07114, Defect Review, 300mm:HMI eScan 500, sn: ML07114, Defect Review, 300mm
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
Malta, New York, United States |
|
![Offer](/dpimages/istat0.gif) |
202816
|
HSEB
|
HSEB |
Axiospect 301 |
in Microscopes, Optical Inspection
HSEB, Axiospect 301, Optical Microscope, 300mm:HSEB, Axiospect 301, Optical Microscope, 300mm Cold. Not working parts include: - Tango Controller (Microscope Stage controller
- Joystick and keyboard controller
- Micromotor for fingers edge gripper
- few powers supplies
The tool was running with Windows XP professional 2002 service pack 3.
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
Malta, New York, United States |
|
![Offer](/dpimages/istat0.gif) |
202817
|
HSEB
|
HSEB |
Axiospect 301 |
in Microscopes, Optical Inspection
HSEB, Axiospect 301, Optical Microscope, 300mm:HSEB, Axiospect 301, Optical Microscope, 300mm
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
Malta, New York, United States |
|
![Offer](/dpimages/istat0.gif) |
236360
|
Keithley
|
Keithley |
S425 |
in Metrology Equipment
KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2591:KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2591
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
Burlington, Vermont, United States |
|
![Offer](/dpimages/istat0.gif) |
236359
|
Keithley
|
Keithley |
S425 |
in Metrology Equipment
KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2593:KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2593
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
Burlington, Vermont, United States |
|
![Offer](/dpimages/istat0.gif) |
192419
|
Keithley Instruments
|
Keithley Instruments |
S425 |
in Metrology Equipment
Keithley, S425, Kerf Test, S/N QMO2572:Keithley, S425, Kerf Test, S/N QMO2572 Keithley standard matrix kerf tester
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
Burlington, Vermont, United States |
|
![Offer](/dpimages/istat0.gif) |
192418
|
Keithley Instruments
|
Keithley Instruments |
S425 |
in Metrology Equipment
Keithley, S450, Kerf Parametric Tester, S/N: QMO2573:Keithley, S450, Kerf Parametric Tester, S/N: QMO2573
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
Burlington, Vermont, United States |
|
![Offer](/dpimages/istat0.gif) |
238974
|
Keithley
|
Keithley |
S475 |
in Metrology Equipment
KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2593:KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2593
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
Burlington, Vermont, United States |
|
![Offer](/dpimages/istat0.gif) |
238977
|
Keithley
|
Keithley |
S475 |
in Metrology Equipment
KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2733:KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2733
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
![Offer](/dpimages/istat0.gif) |
238976
|
Keithley
|
Keithley |
S475 |
in Metrology Equipment
KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2734:KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2734
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
Burlington, Vermont, United States |
|
![Offer](/dpimages/istat0.gif) |
238975
|
Keithley
|
Keithley |
S475 |
in Metrology Equipment
KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2738:KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2738
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
Burlington, Vermont, United States |
|
![Offer](/dpimages/istat0.gif) |
238973
|
Keithley
|
Keithley |
S475 |
in Metrology Equipment
KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2792:KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2792
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
Burlington, Vermont, United States |
|
![Offer](/dpimages/istat0.gif) |
238978
|
Keithley
|
Keithley |
S600 |
in Metrology Equipment
KEITHLEY, S600, 25 pin kerf tester, s/n: QMO4104:KEITHLEY, S600, 25 pin kerf tester, s/n: QMO4104
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
Burlington, Vermont, United States |
|
![Offer](/dpimages/istat0.gif) |
237748
|
KLA-Tencor
|
KLA-Tencor |
AMI2900 |
in Microscopes, Optical Inspection
KLA AMI2900, sn: V000283, 300mm:KLA AMI2900, sn: V000283, 300mm KLA Advanced Macro Inspection Module
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
Malta, New York, United States |
|
![Offer](/dpimages/istat0.gif) |
248207
|
KLA
|
KLA |
QTX-300 |
in Metrology Equipment
KLA, QTX-300, 300mm, S/N 1006304891:KLA, QTX-300, 300mm, S/N 1006304891
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
Singapore, Singapore |
|
![Offer](/dpimages/istat0.gif) |
236970
|
Advantest
|
Advantest |
V93000 |
in Metrology Equipment
LD96, Advantest, V93000, s/n PL000396, Logic and Memory Functional Tester:LD96 Advantest, V93000, s/n PL000396, Logic and Memory Functional Tester
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
East Fishkill, New York, United States |
|
![Offer](/dpimages/istat0.gif) |
241510
|
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm
|
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm |
in Microscopes, Optical Inspection
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm:NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
Malta, New York, United States |
|
![Offer](/dpimages/istat0.gif) |
246474
|
Nitto
|
Nitto |
NEL-DR3000IV |
in Metrology Equipment
NITTO, NEL-DR3000IV, sn: B491L22, 300mm, BSTA2:NITTO, NEL-DR3000IV, sn: B491L22, 300mm, BSTA2 Nitto Backside Taper
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
East Fishkill, New York, United States |
|
![Offer](/dpimages/istat0.gif) |
249037
|
RCS
|
RCS |
300PS-M100 |
in Metrology Equipment
RCS 300PS-M100, SN: B141PS-001, 300 mm:Semi Auto Pad Shave Tool RSV Automation PDS01
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
East Fishkill, New York, United States |
|
![Offer](/dpimages/istat0.gif) |
250932
|
Rudolph Research
|
Rudolph Research |
ws-3000hs |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Burlington, Vermont, United States |
|
![Offer](/dpimages/istat0.gif) |
245895
|
RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa
|
RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa |
in Microscopes, Optical Inspection
RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa:RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa RVSI VISUAL DEFECT SCANNER
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
Burlington, Vermont, United States |
|
![Offer](/dpimages/istat0.gif) |
245894
|
RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra
|
RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra |
in Microscopes, Optical Inspection
RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra:RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra inspection scanner
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
Burlington, Vermont, United States |
|
![Offer](/dpimages/istat0.gif) |
248242
|
Tokyo Electron Ltd
|
Tokyo Electron Ltd |
P12XL |
in Metrology Equipment
TEL, P12XL, 300mm, s/n: PH04204:TEL P12XL Prober
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
East Fishkill, New York, United States |
|
![Offer](/dpimages/istat0.gif) |
246567
|
Ultratech Inc
|
Ultratech Inc |
LSA100A |
in Wafer Fabrication Equipment
ULTRATECH LSA100A, s/n: 6114, Laser Spike Anneal:Laser Spike Anneal
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
Dresden, Saxony, Germany |
|
![Offer](/dpimages/istat0.gif) |
249575
|
Ultratech Inc
|
Ultratech Inc |
LSA100A |
in Wafer Fabrication Equipment
ULTRATECH LSA100A, s/n: 6125, 300mm:ULTRATECH LASER ANNEAL CT02
|
1
|
|
Inquire |
![Click for Picture](images/pixi.gif) |
East Fishkill, New York, United States |
|
|
![](/dpimages/s.gif) |