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Item ID  Photo Short Description Product Type / Details # Price Notes Location Make Model   $   238042 Advantest   Advantest   93000  Reliability Test Equipment in Metrology Equipment ADVANTEST 93000, sn: DE04601132, Logic and Memory functional tester: ADVANTEST 93000, sn: DE04601132, Logic and Memory functional tester 1 Inquire East Fishkill, New York, United States 238044 Advantest   Advantest   93000  Reliability Test Equipment in Metrology Equipment ADVANTEST 93000, sn: DE04601138, Logic and memory functional test: ADVANTEST 93000, sn: DE04601138, Logic and memory functional test 1 Inquire East Fishkill, New York, United States 244640 Advantest   Advantest   93000  Reliability Test Equipment in Metrology Equipment ADVANTEST 93000, sn: DE04601388, Logic and memory functional test: ADVANTEST 93000, sn: DE04601388, Logic and memory functional test 1 Inquire East Fishkill, New York, United States 238045 Advantest   Advantest   93000  Reliability Test Equipment in Metrology Equipment ADVANTEST 93000, sn: MY04600193, Logic and memory functional test: ADVANTEST 93000, sn: MY04600193, Logic and memory functional test 1 Inquire East Fishkill, New York, United States 238046 Advantest   Advantest   93000  Reliability Test Equipment in Metrology Equipment ADVANTEST 93000, sn: MY04600539, Logic and memory functional test: ADVANTEST 93000, sn: MY04600539, Logic and memory functional test 1 Inquire East Fishkill, New York, United States 246604 Applied Materials   Applied Materials   CENTURA EPI  Single Chamber RTP Tools in Wafer Fabrication Equipment AMAT, CENTURA EPI, 200mm, S/N 21792: AMAT, CENTURA EPI, 200mm, S/N 21792 1 Inquire Singapore, Singapore 246375 Applied Materials   Applied Materials   CENTURA  Single Chamber RTP Tools in Wafer Fabrication Equipment AMAT, Centura, sn: 402970-R3-MAC, 300mm: AMAT Centura 300mm 1 Inquire East Fishkill, New York, United States 248208 Applied Materials   Applied Materials   G3 Lite  Scanning Electron Microscopes in Microscopes, Optical Inspection AMAT, G3 Lite, 300mm, S/N W3041: AMAT, G3 Lite, 300mm, S/N W3041 1 Inquire Singapore, Singapore 204911 Applied Materials   Applied Materials   Uvision 5  Optical Inspection - Other in Microscopes, Optical Inspection Applied Materials, Uvision5, Bright Field Inspection, 300mm: Applied Materials, Uvision5, Bright Field Inspection, 300mm In the fab, Idle       1 Inquire Malta, New York, United States 248206 ASM   ASM   ASM3200  Single Chamber RTP Tools in Wafer Fabrication Equipment ASM, ASM3200, 300mm, S/N 034120: ASM, ASM3200, 300mm, S/N 034120 1 Inquire Singapore, Singapore 209828 Bruker, D8FABLINE, 300mm, X-Ray Metrology  Bruker, D8FABLINE, 300mm, X-Ray Metrology  Microscope Inspection Items - Other in Microscopes, Optical Inspection Bruker, D8FABLINE, 300mm, X-Ray Metrology: Bruker, D8FABLINE, 300mm, X-Ray Metrology   1 Inquire Malta, New York, United States 240475 ECEC   ECEC   Micron2  Scientific and Laboratory Equipment - Other in Metrology Equipment ECEC, Micron2, s/n:15-308, Assembly, Die Attach: ECEC, Micron2, s/n:15-308, Assembly, Die Attach 1 Inquire Dresden, Saxony, Germany 230317 FEI   FEI   ExSolve CLM next Gen  Microscopes - Other in Microscopes, Optical Inspection FEI, ExSolve CLM next Gen, 300mm, S/N 9923535: FEI, ExSolve CLM next Gen, 300mm, S/N 9923535 1 Inquire Malta, New York, United States 230318 FEI   FEI   ExSolve CLM next Gen  Microscopes - Other in Microscopes, Optical Inspection FEI, ExSolve CLM next Gen, 300mm, S/N 9923609: FEI, ExSolve CLM next Gen, 300mm, S/N 9923609 1 Inquire Malta, New York, United States 237745 HMI   HMI   eScan 500  Scanning Electron Microscopes in Microscopes, Optical Inspection HMI eScan 500, sn: ML07114, Defect Review, 300mm: HMI eScan 500, sn: ML07114, Defect Review, 300mm 1 Inquire Malta, New York, United States 202816 HSEB   HSEB   Axiospect 301  Wafer Inspection Microscopes in Microscopes, Optical Inspection HSEB, Axiospect 301, Optical Microscope, 300mm: HSEB, Axiospect 301, Optical Microscope, 300mm Cold.  Not working parts include:  Tango Controller (Microscope Stage controller Joystick and keyboard controller Micromotor for fingers edge gripper few powers supplies The tool was running with Windows XP professional 2002 service pack 3. 1 Inquire Malta, New York, United States 202817 HSEB   HSEB   Axiospect 301  Wafer Inspection Microscopes in Microscopes, Optical Inspection HSEB, Axiospect 301, Optical Microscope, 300mm: HSEB, Axiospect 301, Optical Microscope, 300mm 1 Inquire Malta, New York, United States 240478 Instron   Instron   5564  Scientific and Laboratory Equipment - Other in Metrology Equipment INSTRON, 5564, s/n: 5564J2710, Pull Tester: INSTRON, 5564, s/n: 5564J2710, Pull Tester 1 Inquire Dresden, Saxony, Germany 236360 Keithley   Keithley   S425  Reliability Test Equipment in Metrology Equipment KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2591: KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2591 1 Inquire Burlington, Vermont, United States 236359 Keithley   Keithley   S425  Reliability Test Equipment in Metrology Equipment KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2593: KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2593 1 Inquire Burlington, Vermont, United States 192419 Keithley Instruments   Keithley Instruments   S425  Reliability Test Equipment in Metrology Equipment Keithley, S425, Kerf Test, S/N QMO2572: Keithley, S425, Kerf Test, S/N QMO2572 Keithley standard matrix kerf tester 1 Inquire Burlington, Vermont, United States 192418 Keithley Instruments   Keithley Instruments   S425  Reliability Test Equipment in Metrology Equipment Keithley, S450, Kerf Parametric Tester, S/N: QMO2573: Keithley, S450, Kerf Parametric Tester, S/N: QMO2573 1 Inquire Burlington, Vermont, United States 238974 Keithley   Keithley   S475  Reliability Test Equipment in Metrology Equipment KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2593: KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2593 1 Inquire Burlington, Vermont, United States 238977 Keithley   Keithley   S475  Reliability Test Equipment in Metrology Equipment KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2733: KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2733 1 Inquire Burlington, Vermont, United States 238976 Keithley   Keithley   S475  Reliability Test Equipment in Metrology Equipment KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2734: KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2734 1 Inquire Burlington, Vermont, United States 238975 Keithley   Keithley   S475  Reliability Test Equipment in Metrology Equipment KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2738: KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2738 1 Inquire Burlington, Vermont, United States 238973 Keithley   Keithley   S475  Reliability Test Equipment in Metrology Equipment KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2792: KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2792 1 Inquire Burlington, Vermont, United States 238978 Keithley   Keithley   S600  Reliability Test Equipment in Metrology Equipment KEITHLEY, S600, 25 pin kerf tester, s/n: QMO4104: KEITHLEY, S600, 25 pin kerf tester, s/n: QMO4104 1 Inquire Burlington, Vermont, United States 242655 Keithley   Keithley   S630  Reliability Test Equipment in Metrology Equipment KEITHLEY, S630, 200mm, Parametric Test System, s/n: QM04103: KEITHLEY, S630, 200mm, Parametric Test System, s/n: QM04103 1 Inquire Burlington, Vermont, United States 242614 Keithley   Keithley   S630  Reliability Test Equipment in Metrology Equipment KEITHLEY, S630, 200mm, Parametric Test System, s/n: QMO4105: KEITHLEY, S630, Parametric Test System, s/n: QMO4105 1 Inquire Burlington, Vermont, United States 242615 Keithley   Keithley   S630  Reliability Test Equipment in Metrology Equipment KEITHLEY, S630, 200mm, Parametric Test System, s/n: QMO4106: KEITHLEY, S630, Parametric Test System, s/n: QMO4106 1 Inquire Burlington, Vermont, United States 237748 KLA-Tencor   KLA-Tencor   AMI2900  Wafer Inspection Microscopes in Microscopes, Optical Inspection KLA AMI2900, sn: V000283, 300mm: KLA AMI2900, sn: V000283, 300mm KLA Advanced Macro Inspection Module   1 Inquire Malta, New York, United States 248207 KLA   KLA   QTX-300  Scientific and Laboratory Equipment - Other in Metrology Equipment KLA, QTX-300, 300mm, S/N 1006304891: KLA, QTX-300, 300mm, S/N 1006304891 1 Inquire Singapore, Singapore 236970 Advantest   Advantest   V93000  Reliability Test Equipment in Metrology Equipment LD96, Advantest, V93000, s/n PL000396, Logic and Memory Functional Tester: LD96 Advantest, V93000, s/n PL000396, Logic and Memory Functional Tester 1 Inquire East Fishkill, New York, United States 241155 Lintec   Lintec   RAD-2500M/8  Scientific and Laboratory Equipment - Other in Metrology Equipment Lintec Corp. RAD-2500M/8, 200mm, s/n: D1S-2575-AW: Lintec Corp. RAD-2500M/8, 200mm, s/n: D1S-2575-AW 1 Inquire Dresden, Saxony, Germany 247204 Mattson Technology   Mattson Technology   AST 2800  Single Chamber RTP Tools in Wafer Fabrication Equipment Mattson, AST 2800, 200mm, S/N 97060361: Mattson, AST 2800, 200mm, S/N 97060361 1 Inquire Singapore, Singapore 241510 NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm  NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm  Microscope Inspection Items - Other in Microscopes, Optical Inspection NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm: NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm 1 Inquire Malta, New York, United States 246474 Nitto   Nitto   NEL-DR3000IV  Scientific and Laboratory Equipment - Other in Metrology Equipment NITTO, NEL-DR3000IV, sn: B491L22, 300mm, BSTA2: NITTO, NEL-DR3000IV, sn: B491L22, 300mm, BSTA2 Nitto Backside Taper 1 Inquire East Fishkill, New York, United States 245895 RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa  RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa  Microscope Inspection Items - Other in Microscopes, Optical Inspection RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa: RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa RVSI VISUAL DEFECT SCANNER 1 Inquire Burlington, Vermont, United States 245894 RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra  RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra  Microscope Inspection Items - Other in Microscopes, Optical Inspection RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra: RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra inspection scanner 1 Inquire Burlington, Vermont, United States 240476 Sartorius   Sartorius   LA310S  Scientific and Laboratory Equipment - Other in Metrology Equipment SARTORIUS, LA310S, s/n: 13110486: SARTORIUS, LA310S, s/n: 13110486 1 Inquire Dresden, Saxony, Germany 240456 Sonix   Sonix   Quantum 350  Reliability Test Equipment in Metrology Equipment SONIX, Quantum 350, s/n: Q350C018-0103M, analysis, reliability, investigation: SONIX, Quantum 350, s/n: Q350C018-0103M, analysis, reliability, investigation 1 Inquire Dresden, Saxony, Germany 248242 Tokyo Electron Ltd   Tokyo Electron Ltd   P12XL  Reliability Test Equipment in Metrology Equipment TEL, P12XL, 300mm, s/n: PH04204: TEL P12XL Prober   1 Inquire East Fishkill, New York, United States 246567 Ultratech Inc   Ultratech Inc   LSA100A  Single Chamber RTP Tools in Wafer Fabrication Equipment ULTRATECH LSA100A, s/n: 6114, Laser Spike Anneal: Laser Spike Anneal 1 Inquire Dresden, Saxony, Germany 244284 Zeiss   Zeiss   Merlin  Scanning Electron Microscopes in Microscopes, Optical Inspection ZEISS, Merlin, sn: 4234, Zeiss Merlin Scanning Electron Microscope: ZEISS, Merlin, sn: 4234, Zeiss Merlin Scanning Electron Microscope   1 Inquire Malta, New York, United States

*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.