|  | Item ID | Photo | Item Description | Description | Condition | # | Price | Notes | Location |
---|
Make | Model |
---|
| | | | | | | | $ | | |
 |
178308
|
| Accretech | Win-Win 50 | | |
1
|  |
Inquire |
F* |
Taichung, Taichung City, Taiwan |
 |
207367
|
| Accretech | Win-Win 50 | Bright Field Inspection | |
1
|  |
Inquire |
 |
Taichung, Taichung City, Taiwan |
 |
207378
|
| Accretech | Win-Win 50 | TSK1600 | |
1
|  |
Inquire |
 |
Taichung, Taichung City, Taiwan |
 |
190445
|
| Accretech | Win-Win 50 - A5000, Hurricane | Bright Field Inspection | Very Good |
1
|  |
Inquire |
 |
Dresden, Saxony, Germany |
 |
190446
|
| Accretech | Win-Win 50 - A5000, Hurricane | Bright Field Inspection | |
1
|  |
Inquire |
F* |
Dresden, Saxony, Germany |
 |
178310
|
| AMAT | Uvision 200 | | |
1
|  |
Inquire |
 |
Taichung, Taichung City, Taiwan |
 |
205259
|
| Applied Materials | Uvision 5 | Brightfield inspection | |
1
|  |
Inquire |
 |
Malta, New York, United States |
 |
204277
|
| KLA-Tencor | 3905 | Broadband Plasma Patterned Wafer Inspection | |
1
|  |
Inquire |
 |
Malta, New York, United States |
 |
204281
|
| KLA-Tencor | 3905 | Broadband Plasma Patterned Wafer Inspection | |
1
|  |
Inquire |
 |
Malta, New York, United States |
 |
204911
|
| KLA-Tencor | Uvision 5 | Brightfield inspection | |
1
|  |
Inquire |
 |
Malta, New York, United States |
 |
183758
|
| Lasertech | Reticle Inspection Tool | For Reticle Inspection | |
1
|  |
Inquire |
|
Singapore, Singapore |
 |
178322
|
| Negevtech Ltd. | NT3100 | Bright Field Inspection, 300mm | |
1
|  |
Inquire |
|
Taichung, Taichung City, Taiwan |
 |
178323
|
| Rudolph Technologies | Macro Defect WV320 YVS SERVER | | |
1
|  |
Inquire |
|
Taichung, Taichung City, Taiwan |
 |
213184
|
| Rudolph Technologies | S-300 | Macro Defect inspection | |
1
|  |
Inquire |
 |
Taichung, Taichung City, Taiwan |
 |
178713
|
| Rudolph Technologies | S300 | Rudolph Macro Defect S300 inspection system | |
1
|  |
Inquire |
 |
Taichung, Taichung City, Taiwan |
 |
180919
|
| Rudolph Technologies | Waferview 320 | Macro Defect Insepection tool | Good |
1
|  |
Inquire |
 |
Taichung, Taichung City, Taiwan |
 |
207380
|
| Rudolph Technologies | Waferview 320 | Macro Defect inspection | |
1
|  |
Inquire |
 |
Taichung, Taichung City, Taiwan |
 |
212830
|
| Rudolph Technologies | Waferview 320 | Macro Defect inspection | |
1
|  |
Inquire |
 |
Dresden, Saxony, Germany |
 |
213186
|
| Rudolph Technologies | Waferview 320 | Macro Defect inspection | |
1
|  |
Inquire |
 |
Dresden, Saxony, Germany |
 |
213187
|
| Rudolph Technologies | Waferview 320 | Macro Defect inspection | |
1
|  |
Inquire |
 |
Dresden, Saxony, Germany |
 |
178324
|
| Rudolph Technologies | WV320 | WV320 Macro Defect, 300mm | |
1
|  |
Inquire |
 |
Taichung, Taichung City, Taiwan |
 |
207377
|
| Rudolph, WV320 Macro Defect, 300mm | | |
1
|  |
Inquire |
 |
Taichung, Taichung City, Taiwan |
NOTE:
photo available
reference document attached
F* if the item is specially featured
N* if the item is newly added, and/or
R* if the item's price is recently reduced.
|
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