Critical Dimension Scanning Electron Microscopes

  1. AMAT NanoSEM 3D, 300mm, s/n: U-666

    Critical Dimension Scanning Electron Microscopes

    AMAT NanoSEM 3D, 300mm, s/n: U-666

    The nanosem 3D by amat, vintage 2004, located in woodlands, singapore, is designed for advanced semiconductor inspection with a software version of 14.3.0, supporting secs/gem communication and cdsem processes. 

    Tool ID: MSEM762 (F7 MSEM703)

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