Critical Dimension Scanning Electron Microscopes

AMAT VeritySEM 300 mm system, built in 2007 and located in Woodlands, Singapore. Configured for CDSEM measurement with a main frame, VHP robot handler, and three FOUP factory interfaces. Suitable for metrology applications.Specifications Manufacturer: AMAT Model: VeritySEM Vintage: 2007 Wafer Size: 300 mm Serial Number: U808 Location: Woodlands, Singapore Tool ID: MSEM736 (PM-CDA-51) Tool Status: Disconnected Fab Section: Metrology Software Version: 1440b CIM: SEC/GEM Process: CDSEM Configuration Main Frame AMAT FI 3 × FOUP Factory Interface

Make: Applied Materials

Model: VeritySEM

1 unit @ Best Price

AMAT NanoSEM 3D 300 mm system, built in 2004 and located in Woodlands, Singapore. Configured for CDSEM metrology with an ETU handler and a FOUP factory interface.Specifications Manufacturer: AMAT Model: NanoSEM 3D Vintage: 2004 Wafer Size: 300 mm Serial Number: U-666 Location: Woodlands, Singapore Tool ID: MSEM762 (F7 MSEM703) Tool Status: Disconnected Fab Section: Metrology Software Version: 14.3.0 CIM: SECS/GEM Process: CDSEM Configuration FOUP Factory Interface ETU Handler Main System

Make: Applied Materials

Model: NanoSEM 3D

1 unit @ Best Price

Applied Materials Verity 1 SEM 300 mm system, built in 2004 and located in Woodlands, Singapore. Configured for CD SEM measurement in metrology with a FOUP factory interface. Software version 1440b and SEC/GEM CIM interface included.Specifications Manufacturer: AMAT Model: Applied Materials Verity 1 SEM Vintage: 2004 Wafer Size: 300 mm Serial Number: U710 Location: Woodlands, Singapore Tool ID: MSEM737 (F7 MSEM705) Tool Status: Disconnected Fab Section: Metrology Software Version: 1440b CIM: SEC/GEM Process: CD SEM Measurement Configuration 3 × FOUP Factory Interface Main Frame AMAT FI Handler Not Included VACR HVPS

Make: Applied Materials

Model: Applied Materials Verity 1 SEM

1 unit @ Best Price