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Item IDPhotoItem DescriptionDescriptionAperture SizeFocal LengthCondition#PriceNotes Location
MakeModel
»in  cm(mm)$
210076 ADE EpiScanEpi Thickness Measurement System 1 Inquire Burlington, Vermont, United States
219679 Cameca EX300 Shallow ProbeLow energy Electron induced X-ray Emission Spectro 1 Inquire East Fishkill, New York, United States
200771 Nicolet ECO-1000 1 Inquire Burlington, Vermont, United States
219678 Nova V2600TSV (Through-Silicon Via) metrology system 1 Inquire East Fishkill, New York, United States

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  F* if the item is specially featured
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  R* if the item's price is recently reduced.