Your reliable source for surplus semiconductor equipment!
 Fast  FIND      full search   tips    
SPECIALS LISTINGS About Us Contact Us
Serving  Our Guest Log in    Register to manage deal making
ALL CATEGORIES   Metrology Equipment    View    Search-by-Specs   
View All Listings Under

Interferometers


» Switch Major Category
Click an item's ID# below for its full specifications , or:

List other sub-categories under Metrology EquipmentList other sub-categories under Metrology Equipment

Show other product types under Metrology EquipmentShow other product types under Metrology Equipment


  • To sort on a column, click the column head; click it again to reverse the sort.  View measures in specified units, or  click to change units of measureMetric  click to change units of measureUS
  • Hide photos, compress data table
Item IDPhotoItem DescriptionDescriptionAperture SizeFocal LengthCondition#PriceNotes Location
MakeModel
»in  cm(mm)$
210076 ADE EpiScanEpi Thickness Measurement System 1 Inquire Burlington, Vermont, United States
219679 Cameca EX300 Shallow ProbeLow energy Electron induced X-ray Emission Spectro 1 Inquire East Fishkill, New York, United States
200771 Nicolet ECO-1000 1 Inquire Burlington, Vermont, United States
219678 Nova V2600TSV (Through-Silicon Via) metrology system 1 Inquire East Fishkill, New York, United States

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.