|  | Item ID | Photo | Item Description | Description | Microscope Type | Microscp Config | Illum Type | # | Price | Notes | Location |
---|
Make | Model |
---|
| | | | | | | | | | $ | | |
 |
205918
|
| Camtek | X-ACT | TEM Sample Preparation System | | | |
1
|  |
Inquire |
 |
East Fishkill, New York, United States |
 |
203117
|
| FEI | ExSolve 2 WTP EFEM | High Accuracy FIB | | | |
1
|  |
Inquire |
 |
Malta, New York, United States |
 |
230317
|
| FEI | ExSolve CLM next Gen | Cut samples from wafers | | | |
1
|  |
Inquire |
 |
Malta, New York, United States |
 |
230318
|
| FEI | ExSolve CLM next Gen | Cut samples from wafers | | | |
1
|  |
Inquire |
 |
Malta, New York, United States |
 |
230561
|
| FEI | TEMLink 150 | | | | |
1
|  |
Inquire |
 |
Malta, New York, United States |
 |
202146
|
| Hitachi | HF-2000 | EDX/EELs/STEM imaging | | | |
1
|  |
Inquire |
 |
East Fishkill, New York, United States |
 |
231792
|
| KLA-Tencor | 2367 | Brightfield Defect Inspection | | | |
1
|  |
Inquire |
 |
Dresden, Saxony, Germany |
 |
204285
|
| Lyncee | Holographic Microscope | | | | |
1
|  |
Inquire |
F* |
Malta, New York, United States |
 |
205919
|
| Olympus | PMG3 | Metallurgical Microscope | | | |
1
|  |
Inquire |
F* |
East Fishkill, New York, United States |
NOTE:
photo available
reference document attached
F* if the item is specially featured
N* if the item is newly added, and/or
R* if the item's price is recently reduced.
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