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	Item ID	Photo	Short Description		Product Type / Details	#		Price	Notes	Location
			Make	Model
								$
	206534	ABB Engineering	ABB Engineering	IRB120	Polishing & Grinding Sample Preparation Equipment in Laboratory Equipment ABB, IRB120, Sample Polishing Robot. : ABB, IRB120, Sample Polishing Robot.  This equipment comes with 2 ABB robots (1 x IRB120 and 1 x IRB1200).	1		Inquire	F*	Singapore, Singapore
	198239	Adixen	Adixen	APR 4300 Pod Regenerator	Wafer Production Equipment - Other in Wafer Fabrication Equipment ADIXEN, APR 4300, 300mm Pod Regenerator: ADIXEN,  APR 4300, 300mm Pod Regenerator	1		Inquire	F*	Malta, New York, United States
	205373	Adixen	Adixen	APR4300	Wafer Production Equipment - Other in Wafer Fabrication Equipment ADIXEN, APR 4300, 300mm Pod Regenerator: ADIXEN, APR 4300, 300mm Pod Regenerator In Crate, In warehouse	1		Inquire	F*	Malta, New York, United States
	203973	Adixen	Adixen	APR4300	Wet Process Equipment - Other in Wafer Fabrication Equipment Adixen, APR4300, 300mm Wafer Decontamination Tool: Adixen, APR4300, 300mm Wafer Decontamination Tool Unhooked.  In warehouse.	1		Inquire	F*	Malta, New York, United States
	221385	Agilent	Agilent	E8510C	Test & Measurement - Other in Test, Analysis and Measurement Equipment Agilent, E8510C, Network analyzers: Agilent, E8510C, Network analyzers 4 sets together. Serial number: 3936A10048, 3901A07502, 3602A00845, 3844A00844	1		Inquire		Singapore, Singapore
	195986	Akrion	Akrion	300mm Solvent Sink	Wafer Cleaners in Wafer Fabrication Equipment AKRION, 300mm, UP V2 MP.2000, Solvent Sink: AKRION, 300mm, UP V2 MP.2000, Sink Wet bench for parts cleaning Tool is sitting in Subfab, disconnected. Wrapped in shrink wrap	1		Inquire	F*	Singapore, Singapore
	216829	Akrion	Akrion	MP-2000	Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items Akrion, MP-2000, Parts Clean Sink sink: Akrion,  MP-2000, Parts Clean Sink  sink Unhooked, dismatlted and packed	1		Inquire		Singapore, Singapore
	232897	Applied Materials In	Applied Materials In	0040-62020	Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items AMAT, 300mm, CMP Retaining Rings: AMAT, 300mm, CMP Retaining Rings	1		Inquire		Malta, New York, United States
	227879	Applied Materials In	Applied Materials In	Dfinder	Scientific and Laboratory Equipment - Other in Metrology Equipment AMAT, Dfinder, 300mm, S/N T3007: AMAT, Dfinder, 300mm, S/N T3007	1		Inquire		Dresden, Saxony, Germany
	235045	Applied Materials	Applied Materials	Nanosem 3D	Scanning Electron Microscopes in Microscopes, Optical Inspection AMAT, Nanosem 3D, 300mm, S/N U648: AMAT, Nanosem 3D, 300mm, S/N U648	1		Inquire	N*	East Fishkill, New York, United States
	227148	Applied Materials	Applied Materials	Producer SE	Chemical Vapor Deposition Equipment - Other in Chemical Vapor Deposition Equipment AMAT, Producer SE, 300mm, S/N 402278: AMAT, Producer SE, 300mm, S/N 402278	1		Inquire		East Fishkill, New York, United States
	233427	Applied Materials	Applied Materials	Producer SE	Chemical Vapor Deposition Equipment - Other in Chemical Vapor Deposition Equipment AMAT, Producer SE, 300mm, S/N 422966: AMAT, Producer SE, 300mm, S/N 422966 Please see pdf for missing parts.	1		Inquire		Malta, New York, United States
	219673	Applied Materials	Applied Materials	Producer SE	Chemical Vapor Deposition Equipment - Other in Chemical Vapor Deposition Equipment AMAT, Producer SE, 300mm, S/N 425704: AMAT, Producer SE, 300mm, S/N 425704, Low-K Dielectric CVD Please check out missing parts in the pdf. Inspection strongly advised.	1		Inquire		Malta, New York, United States
	219723	Applied Materials	Applied Materials	Producer SE	Chemical Vapor Deposition Equipment - Other in Chemical Vapor Deposition Equipment AMAT, Producer SE, 300mm, S/N 428039: AMAT, Producer SE, 300mm, S/N 428039   Inspection highly advised, to confirm tool serial ID.	1		Inquire		Malta, New York, United States
	178357	AMAT	AMAT	Centura	Plasma Processing Equipment and Tools - Other in Wafer Fabrication Equipment Applied Materials, Etch, Centura Carina Chamber 300mm: Tool ID : ETX2291-c Chamber Only. Carina Etch Chamber.  Chamber Materials: ADVANCED CERAMIC Lid Materials:  AG 1000 Process Ring: QUARTZ SINGLE RING Plasma Exposed Chamber Oring: KALREZ Cathode Temperature Range: 130 TO 250C Carina Etch Swap Kit: 1 Chamber Viewport: STANDARD VIEWPORT Endpoint Type: EyeD IEP CCM Cover: NO Location is Malta, NY.	1		Inquire		Malta, New York, United States
	204911	Applied Materials	Applied Materials	Uvision 5	Optical Inspection - Other in Microscopes, Optical Inspection Applied Materials, Uvision5, Bright Field Inspection, 300mm: Applied Materials, Uvision5, Bright Field Inspection, 300mm In the fab, Idle	1		Inquire		Malta, New York, United States
	183169	ASM	ASM	A412	Vertical LPCVD Furnaces in Chemical Vapor Deposition Equipment ASM A412 Vertical Furnace, 300mm, LPCVD SiN & SiN: ASM A412 Vertical Furnace, 300mm, LPCVD SiN & SiN Twin LPCVD SiN Reactors TOOL ID: FVX2541 Serial Number: 2E0082 2011 Vintage	1		Inquire	F*	Malta, New York, United States
	178741	ASM	ASM	Eagle XP	Chemical Vapor Deposition Equipment - Other in Chemical Vapor Deposition Equipment ASM Eagle XP ALD 300mm, S/N 3E0159: ASM Eagle XP ALD  300mm, S/N 3E0159	1		Inquire		Dresden, Saxony, Germany
	213685	ASM	ASM	E3200 RP	Chemical Vapor Deposition Equipment - Other in Chemical Vapor Deposition Equipment ASM, E3200 Reduced Pressure, 300mm, Epi Deposition System E3200 RP: ASM, E3200 Reduced Pressure, 300mm, Epi Deposition System E3200 RP SiGe depositon system. Single chamber. The WHC door/entrance is on the right hand side	1		Inquire		East Fishkill, New York, United States
	227909	ASM	ASM	E3200	Single Chamber RTP Tools in Wafer Fabrication Equipment ASM, E3200, 300mm, S/N 034030: ASM, E3200, 300mm, S/N 034030	1		Inquire		East Fishkill, New York, United States
	209252	ASML	ASML	XT: 1250B	Wafer Production Equipment - Other in Wafer Fabrication Equipment ASML, XT:1250B, 300mm, ArF : ASML, XT:1250B, 300mm, ArF    In the Fab.  Running wafers.	1		Inquire		Dresden, Saxony, Germany
	230320	ASML	ASML	XT1250B	Deep UV Wafer Stepper in Wafer Fabrication Equipment ASML, XT1250B, 300mm, S/N 7924: ASML, XT1250B, 300mm, S/N 7924	1		Inquire		Dresden, Saxony, Germany
	226062	ASML	ASML	XT1250D	Deep UV Wafer Stepper in Wafer Fabrication Equipment ASML, XT1250D, 300mm, S/N 7337: ASML, XT1250D, 300mm, S/N 7337	1		Inquire		Singapore, Singapore
	226818	ASML	ASML	XT1700FI	Deep UV Wafer Stepper in Wafer Fabrication Equipment ASML, XT1700FI, 300mm S/N 4839: ASML, XT1700FI, 300mm S/N 4839 Immersion scanner.	1		Inquire		Singapore, Singapore
	230289	ASML	ASML	XT1700FI	Deep UV Wafer Stepper in Wafer Fabrication Equipment ASML, XT1700FI, 300mm S/N 5633: ASML, XT1700FI, 300mm S/N 5633	1		Inquire		East Fishkill, New York, United States
	183772	Axcelis Technologies	Axcelis Technologies	Compact II	Clean Room Ovens in Wafer Fabrication Equipment Axcelis Compact II, 300mm, H2 Reflow Furnace, : Axcelis Compact II, 300mm, H2 Reflow Furnace, C4 Processing. Tool ID: OVN222 Serial Number :  H08046	1		Inquire	F*	Dresden, SN, Germany
	229744	Axcelis Technologies	Axcelis Technologies	Optima MD	Wafer Production Equipment - Other in Wafer Fabrication Equipment Axcelis, Optima MD, 300mm, S/N 083013: Axcelis, Optima MD, 300mm, S/N 083013   Tool is in a warehouse.	1		Inquire		Dresden, Saxony, Germany
	204937	Brooks	Brooks	M1900	Wafer Production Equipment - Other in Wafer Fabrication Equipment Brooks, M1900, Reticle Stocker: Brooks, M1900, Reticle Stocker	1		Inquire		Malta, New York, United States
	233544	Brooks	Brooks	7850	Materials Handling Equipment - Other in Wafer Fabrication Equipment BROOKS, PRI 7850, 200mm, Reticle stocker, S/N 059972355: BROOKS, PRI 7850, 200mm, Reticle stocker, S/N 059972355	1		Inquire		Singapore, Singapore
	209828	Bruker, D8FABLINE, 300mm, X-Ray Metrology	Bruker, D8FABLINE, 300mm, X-Ray Metrology		Microscope Inspection Items - Other in Microscopes, Optical Inspection Bruker, D8FABLINE, 300mm, X-Ray Metrology: Bruker, D8FABLINE, 300mm, X-Ray Metrology	1		Inquire		Malta, New York, United States
	199780	BTU Engineering	BTU Engineering	TCAS 181-7-72-E-36	Clean Room Ovens in Wafer Fabrication Equipment BTU, Ovens / Furnaces, 200mm, Controlled Atmosphere Furnace: BTU, Ovens / Furnaces, 200mm, Controlled Atmosphere Furnace S/N: IBVT-1	1		Inquire	F*	Burlington, Vermont, United States
	204314	Check Point Technolo	Check Point Technolo	InfraScanTDM 300 TDE	Scientific and Laboratory Equipment - Other in Metrology Equipment CheckPoint, InfraScanTDM 300 TDE, Laser Scanning Emisson: CheckPoint, InfraScanTDM  300 TDE, Laser Scanning Emisson  The system is comprised of the following: 1 InfraScan 300 TDE Laser Probing / Emission System Includes the following assemblies: * LSM 300 scanner with integrated emission camera port; * CCD camera for sample navigation with separate display; * 5-position motorized turret; * X, Y, Z motorized movement of LSM assembly; * PC with digitizer, Windows XP, Proscan 2000 Acquisition Software; * Moveable Operator Console, with  flat panel displays, Semi S8 compliant; * SLS-1000 1064 nm 300 mW * SLS-1000 1319 nm 350 mW * ASP-1000 3A Amplifier source package * Laser power adjustment, 0 to 100%, with incident power monitoring for all objectives; * Dark chamber with laser safety interlock, Class I (with service override), vibration isolation * User’s manual. Emission Camera Options InGaAs LN2 cooled 640 x 640 array 18 ?m pixels. LN2 Auto-fill system with two (2) 160 L Dewars InfraScan™ LTM 9Hz laser timing module. Includes the following: 9 GHz laser timing module Digital Oscilloscope 12.5 GHz Bandwidth Electronic Spectrum Analyzer APD and electronic amplifier High power/ high stability laser for timing stimulus Objective Options 5X NIR, Mitutoyo 378-822 20X IR Plan Apo, NA 0.5, Seiwa 50X IR Plan Apo, NA 0.6, Seiwa 100X NIR HR Mitutoyo 378-864-5 1X Macro Lens Specifications and Features: LSM 300/Optics- Optimized for high transmission at 1064nm and 1340nm. * T => 100mW at 1064nm 5X objective; T =>300mW at 1340nm 5X objective Image distortion <2%, 2X slow scan. Spot size 0.61?/NA of objective. * Scan rate 310 lines/sec to 2 sec/line. Field of view with 5X objective at 1X zoom: 3.2mm. Optical zoom range 1X to 8X (scanned field). * Image registration better than 2% for various wavelengths. * 5-position motorized turret, non-winding, Software settable crash protection limits for all objective lenses. Software controlled, par-centered and parfocal objectives. Built-in CCD camera for sample navigation with color monitor. External sync circuit. Computer and Inputs - PC with 3-channel digitizer input, one for LSM imaging and two for laser stimulation methods. Signal inputs are synchronized with LSM scan rate. Independent Gain and Offset control for input 1 and input 2. Scan rates adjustable from 310 lines/sec to 2048X slow to match response of DUT. 2-way communication with Knights CAD link. SLS 1000 RD – 300mW 1064 nm linearly polarized laser * Continuously adjustable Laser Power, from near 0% to full maximum. Real-time, incident laser power monitoring. Power limit feature to prevent overexposure of DUT. FC fiber optical coupler with 3 meter PM patchcord. ASP 1000 Amplifier-Source Package - Source Selections: Constant Current Programmable Range: 0.5nA – 1A; (3A optional) Minimum Program Step: .5nA Constant Voltage Programmable Range: 1uV – 10V (20V if protection diode removed) Minimum Program Step: 1uV Amplifier Selections: AC Voltage Amplifier Bias Current: .5nA - 1A; (3A optional) Maximum Input: 10V Input impedance: >4.7M Ohm Maximum Gain: 120 dB Detectability: 1 nV at full gain Bandwidth: 0.3 to 400K Hz High Pass Filter: .3, 50, 100, 200, 400, 800, 1.6K, 3.2K, 6.4K, 12.8K, 25K, 50K, 100K, 200K, 400K HZ, Low Pass Filter: 50, 100, 200, 400, 800, 1.6K, 3.2K, 6.4K, 12.8K, 25K, 50K, 100K, 200K, 400K HZ Output Offset Voltage: +/- 5V DC Current Amplifier (OBIC mode) Bias Voltage Range: 1uV - 10V Maximum Input: 20 mA Maximum Gain: 80 V/nA Detectability: 1 pA at full gain Bandwidth: DC to 400K Hz	1		Inquire		Malta, New York, United States
	221395	Credence	Credence	D10	Test & Measurement - Other in Test, Analysis and Measurement Equipment Credence, D10, S/N D10-1101: Credence, D10, S/N D10-1101 Known Tool Problems:  the tester workstation is unable to boot up hardware configuration only have DIBU that failed diagnostic	1		Inquire		Singapore, Singapore
	232536	CTI Cryogenics	CTI Cryogenics	Various	Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items CTI Cryogenics, various components: CTI Cryogenics, various components. Please see details for part numbers. These are sold as components.	1		Inquire		East Fishkill, New York, United States
	218565	Despatch	Despatch	PWB-48X38X64-3E	Clean Room Equipment in Chambers, Components, Accessories and Other Items DESPATCH, PWB-48X38X64-3E, Bake-out Cabinet Oven : DESPATCH, PWB-48X38X64-3E, Bake-out Cabinet Oven  S/N : 183007 Installed. Idle.   Tool ID: MNA2100	1		Inquire		Malta, New York, United States
	211632	Despatch	Despatch	PWB-48X38X64-3E	Clean Room Equipment in Chambers, Components, Accessories and Other Items DESPATCH, PWB-48X38X64-3E, Bake-out Cabinet Oven : DESPATCH, PWB-48X38X64-3E, Bake-out Cabinet Oven    Installed. Idle.	1		Inquire	F*	Malta, New York, United States
	211633	Despatch	Despatch	PWB-48X38X64-3E	Clean Room Equipment in Chambers, Components, Accessories and Other Items DESPATCH, PWB-48X38X64-3E, Bake-out Cabinet Oven : DESPATCH, PWB-48X38X64-3E, Bake-out Cabinet Oven  S/N : 183009 Installed. Idle.	1		Inquire		Malta, New York, United States
	211634	Despatch	Despatch	PWB-48X38X64-3E	Clean Room Equipment in Chambers, Components, Accessories and Other Items DESPATCH, PWB-48X38X64-3E, Bake-out Cabinet Oven : DESPATCH, PWB-48X38X64-3E, Bake-out Cabinet Oven  S/N : 183010 Installed. Idle.	1		Inquire		Malta, New York, United States
	207722	Disco	Disco	DFG-82IF/8	Reliability Test Equipment in Metrology Equipment Disco, DFG-82IF/8, Backside Grind, 200mm : Disco, DFG-82IF/8, Backside Grind, 200mm   S/N : GG0220	1		Inquire		Burlington, Vermont, United States
	228197	Dainippon Screen	Dainippon Screen	SR3000	Wet Process Equipment - Other in Wafer Fabrication Equipment DNS, SR3000, 300mm, S/N 62700-8181: DNS, SR3000, 300mm, S/N 62700-8181	1		Inquire		East Fishkill, New York, United States
	217023	Dainippon Screen	Dainippon Screen	SU-3100	Wafer Cleaners in Wafer Fabrication Equipment DNS, SU-3100, 300mm, Wafer Cleaning System: DNS, SU-3100, 300mm, Wafer Cleaning System 4 CHAMBER AQUASPIN Installed  Running wafers Available 11/27/2022  S/N: 530L00230A	1		Inquire		East Fishkill, New York, United States
	203282	E.A. Fischione Instr	E.A. Fischione Instr	1030	Polishing & Grinding Sample Preparation Equipment in Laboratory Equipment E.A. Fischione Instruments Inc., 1030, NanoMill: E.A. Fischione Instruments Inc., 1030, NanoMill, Sample Prep. Automated Sample Preparation System	1		Inquire	F*	East Fishkill, New York, United States
	226695	ESI	ESI	9300	Reliability Test Equipment in Metrology Equipment ESI, 9300, 200mm, S/N 64057: ESI, 9300, 200mm, S/N 64057	1		Inquire		Burlington, Vermont, United States
	215848	Estion	Estion	E-RETICLE V 4M	Scientific and Laboratory Equipment - Other in Metrology Equipment Estion, E-RETICLE V 4M, Electrostatic Charge Measurement: Estion, E-RETICLE V 4M, Electrostatic Charge Measurement Reticle Electrostatic Charge Measurement System Installed, Idle. Vintage :  2010	1		Inquire		Burlington, Vermont, United States
	219850	FEI	FEI	CLM3D	Scientific and Laboratory Equipment - Other in Metrology Equipment FEI, CLM3D, 300mm, S/N CLM000070, FIB: FEI, CLM3D, 300mm, S/N CLM000070, FIB	1		Inquire		East Fishkill, New York, United States
	203117	FEI	FEI	ExSolve 2 WTP EFEM	Microscopes - Other in Microscopes, Optical Inspection FEI, ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB: FEI,  ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB In the fab.  Warm shutdown.	1		Inquire		Malta, New York, United States
	230317	FEI	FEI	ExSolve CLM next Gen	Microscopes - Other in Microscopes, Optical Inspection FEI, ExSolve CLM next Gen, 300mm, S/N 9923535: FEI, ExSolve CLM next Gen, 300mm, S/N 9923535	1		Inquire		Malta, New York, United States
	230318	FEI	FEI	ExSolve CLM next Gen	Microscopes - Other in Microscopes, Optical Inspection FEI, ExSolve CLM next Gen, 300mm, S/N 9923609: FEI, ExSolve CLM next Gen, 300mm, S/N 9923609	1		Inquire		Malta, New York, United States
	227826	FEI	FEI	FP5600 30 Titan80-300	Scanning Electron Microscopes in Microscopes, Optical Inspection FEI, FP5600 30 Titan80-300, S/N D3174: FEI, FP5600 30 Titan80-300, S/N D3174	1		Inquire		Dresden, Saxony, Germany
	211546	FEI	FEI	Meridian-IV	Scientific and Laboratory Equipment - Other in Metrology Equipment FEI, Meridian-IV, Fault localization and analysis: FEI, Meridian-IV, Fault localization and analysis	1		Inquire		Singapore, Singapore
	225318	FEI	FEI	QUANTA 600F	Scanning Electron Microscopes in Microscopes, Optical Inspection FEI, QUANTA 600F, S/N QFV17 / D8086: FEI, QUANTA 600F, S/N QFV17 / D8086	1		Inquire		East Fishkill, New York, United States
	230561	FEI	FEI	TEMLink 150	Microscopes - Other in Microscopes, Optical Inspection FEI, TEMLink 150, 300mm, S/N 4471-03-14: FEI, TEMLink 150, 300mm, S/N 4471-03-14	1		Inquire		Malta, New York, United States
	230847	Fein Focus	Fein Focus	FOX 160.25	Particle Counters in Metrology Equipment Fein Focus, FOX 160.25, 300mm. S/N 112540 1764: Fein Focus, FOX 160.25, 300mm. S/N 112540 1764	1		Inquire		East Fishkill, New York, United States
	232425	Gatan Inc	Gatan Inc	1002248.FEI	Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items Gatan Inc, 1002248.FEI, S/N 12021701W0994: Gatan Inc, 1002248.FEI, S/N 12021701W0994 These are components only.	1		Inquire		Dresden, Saxony, Germany
	233426	Genmark Automation	Genmark Automation	Porta300P	Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items Genmark, Porta300P, 2 loadports: Genmark, Porta300P, 2 loadports with some spare parts. See pdf for details.	1		Inquire		Malta, New York, United States
	224905	Kokusai	Kokusai	DD-1206VN-DF	Vertical LPCVD Furnaces in Chemical Vapor Deposition Equipment Hitachi Kokusai, DD-1206VN-DF , 300mm, S/N T2DD6-17012-1: Hitachi Kokusai, DD-1206VN-DF , 300mm, S/N T2DD6-17012-1 Oxide furnace. Missing parts unable to confirm, inspection is highly recommended.	1		Inquire		Singapore, Singapore
	224903	Kokusai	Kokusai	DJ-1206VN-DM	Vertical LPCVD Furnaces in Chemical Vapor Deposition Equipment Hitachi Kokusai, DJ-1206VN-DM, 300mm, S/N T1DC6-12251-1: Hitachi Kokusai, DJ-1206VN-DM, 300mm, S/N T1DC6-12251-1 Nitride Furnace.	1		Inquire		Singapore, Singapore
	224904	Kokusai	Kokusai	DJ-1206VN-DM	Vertical LPCVD Furnaces in Chemical Vapor Deposition Equipment Hitachi Kokusai, DJ-1206VN-DM, 300mm, S/N T1DC6-12426-1: Hitachi Kokusai, DJ-1206VN-DM, 300mm, S/N T1DC6-12426-1 Nitride Furnace.	1		Inquire		Singapore, Singapore
	219849	Kokusai	Kokusai	DJ-1206VN-DM	Vertical LPCVD Furnaces in Chemical Vapor Deposition Equipment Hitachi Kokusai, DJ-1206VN-DM, 300mm, S/N T2DC6-12427-1, LPCVD Nitride: Hitachi Kokusai, DJ-1206VN-DM, 300mm, S/N T2DC6-12427-1, LPCVD Nitride Tool is available as of 18 Feb 2021 for sale. But the tool will be shipped to warehouse on 22 Mar 2021 for storage.	1		Inquire		Singapore, Singapore
	204280	Hitachi	Hitachi	M-8190XT	Plasma Processing Equipment and Tools - Other in Wafer Fabrication Equipment Hitachi, M-8190XT, 300mm, Plasma Etch: Hitachi, M-8190XT, 300mm, Plasma Etch 3 Chambers In Fab, Warm Idle	1		Inquire		Malta, New York, United States
	204305	HMI, eP4 320, 300mm, ebeam Inspection	HMI, eP4 320, 300mm, ebeam Inspection		Microscope Inspection Items - Other in Microscopes, Optical Inspection HMI, eP4 320, 300mm, ebeam Inspection: HMI, eP4 320, 300mm, ebeam Inspection   In the Fab.  Cold Idle	1		Inquire		Malta, New York, United States
	202816	HSEB	HSEB	Axiospect 301	Wafer Inspection Microscopes in Microscopes, Optical Inspection HSEB, Axiospect 301, Optical Microscope, 300mm: HSEB, Axiospect 301, Optical Microscope, 300mm Cold.  Not working parts include:  Tango Controller (Microscope Stage controller Joystick and keyboard controller Micromotor for fingers edge gripper few powers supplies The tool was running with Windows XP professional 2002 service pack 3.	1		Inquire		Malta, New York, United States
	202817	HSEB	HSEB	Axiospect 301	Wafer Inspection Microscopes in Microscopes, Optical Inspection HSEB, Axiospect 301, Optical Microscope, 300mm: HSEB, Axiospect 301, Optical Microscope, 300mm	1		Inquire		Malta, New York, United States
	189689	JEOL	JEOL	JWS-7515	Scanning Electron Microscopes in Microscopes, Optical Inspection JEOL, JWS-7515, 200mm, SEM: JEOL, JWS-7515, 200mm, SEM S/N: WS179028-108	1		Inquire		Singapore, Singapore
	229837	John Blanz Co	John Blanz Co	CRYOTEST MODEL 105	Reliability Test Equipment in Metrology Equipment JOHN BLANZ COMPANY, CRYOTEST MODEL 105: JOHN BLANZ COMPANY, CRYOTEST MODEL 105 No serial number found.	1		Inquire		East Fishkill, New York, United States
	202818	Jordan Valley	Jordan Valley	JVX6200i	Xray Diffractometers in Metrology Equipment Jordan Valley, JVX6200i, 300mm, Film Thickness Measurement: Jordan Valley, JVX6200i, 300mm, Film Thickness Measurement	1		Inquire		Malta, New York, United States
	204276	KINIK	KINIK	BI2	Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items KINIK, BI2, Manual Polishing Pad Break In Tool: KINIK, BI2, Manual Polishing Pad Break In Tool   In warehouse	1		Inquire		Singapore, Singapore
	204284	KLA-Tencor	KLA-Tencor	Viper 2438	Particle Counters in Metrology Equipment KLA - Tencor, Viper2438, Macro Defect Detection System, 300mm: KLA - Tencor, Viper 2438, Macro Defect Detection System, 300mm Bagged & Skidded in Warehouse	1		Inquire		Singapore, Singapore
	231792	KLA-Tencor	KLA-Tencor	2367	Microscopes - Other in Microscopes, Optical Inspection KLA 2367 IS, 300mm, Defect Inspection : KLA 2367 IS, 300mm, Defect Inspection SN: W23673312 Vintage: 2005 Take note of faulty parts.	1		Inquire		Dresden, Saxony, Germany
	219778	KLA-Tencor	KLA-Tencor	Archer AIM A500	Lithography Equipment in Metrology Equipment KLA, Archer AIM A500, 300mm, S/N 6032414: KLA, Archer AIM A500, 300mm, S/N 6032414	1		Inquire		East Fishkill, New York, United States
	231156	KLA-Tencor	KLA-Tencor	Archer AIM+	Lithography Equipment in Metrology Equipment KLA, Archer AIM+, 300m , S/N 3531: KLA, Archer AIM+, 300m , S/N 3531 NOTE : AVAILABLE -  21-OCT-22	1		Inquire		Singapore, Singapore
	231163	KLA-Tencor	KLA-Tencor	Archer AIM+	Lithography Equipment in Metrology Equipment KLA, Archer AIM+, 300m , S/N 3616: KLA, Archer AIM+, 300m, S/N 3616   NOTE: AVAILABLE - 4-NOV-22	1		Inquire		Singapore, Singapore
	225920	KLA-Tencor	KLA-Tencor	Viper 2435	Particle Counters in Metrology Equipment KLA, Viper 2435, 300mm, S/N 2306070577: KLA, Viper 2435, 300mm, S/N 2306070577	1		Inquire		Singapore, Singapore
	190993	Kokusai	Kokusai	Quixace Ultimate	Vertical LPCVD Furnaces in Chemical Vapor Deposition Equipment Kokusai Quixace Ultimate, 300mm, DJ-1236VN-DF: Kokusai Quixace Ultimate, 300mm, DJ-1236VN-DF Low Temp Steam Anneal - for SOD Cure S/N: T2DD6-18711	1		Inquire		Malta, New York, United States
	190750	Kokusai	Kokusai	DD-1223VN	Vertical LPCVD Furnaces in Chemical Vapor Deposition Equipment Kokusai Quixace, 300mm, DD-1223VN, ALD-TiN: Kokusai Quixace, 300mm, DD-1223VN ALD-TiN  S/N T2DC6-16441	1		Inquire		Malta, New York, United States
	204501	Kokusai	Kokusai	DJ-1206VN-DM,	Vertical LPCVD Furnaces in Chemical Vapor Deposition Equipment Kokusai Quixace, 300mm, DJ-1206VN-DM,: Kokusai Quixace, 300mm, LPCVD SiN,   S/N : T2DC6-12825 Bagged & Skidded in warehouse	1		Inquire		Singapore, Singapore
	205392	Kokusai	Kokusai	DJ-1206VN-DM	Vertical LPCVD Furnaces in Chemical Vapor Deposition Equipment Kokusai Quixace, 300mm, DJ-1206VN-DM, LPCVD SiN: Kokusai Quixace, 300mm, DJ-1206VN-DM,  LP SiN    Bagged & Skidded in Warehouse.	1		Inquire		Singapore, Singapore
	204500	Kokusai	Kokusai	DJ-1206VN-DM	Vertical LPCVD Furnaces in Chemical Vapor Deposition Equipment Kokusai Quixace, 300mm, DJ-1206VN-DM, LPCVD SiN: Kokusai Quixace, 300mm, DJ-1206VN-DM, LPCVD SiN S/N : T2DC6-12462 Bagged & Skidded in Warehouse	1		Inquire		Singapore, Singapore
	208405	Kokusai	Kokusai	Quixace	Vertical LPCVD Furnaces in Chemical Vapor Deposition Equipment Kokusai, Quixace, 300mm, Anneal, Cobalt : Kokusai, Quixace, 300mm, Anneal, Cobalt  In the Fab.  Idle. DOM : 2014 S/N : T2DD6-18973-1	1		Inquire	F*	Malta, New York, United States
	229836	Kulicke and Soffa	Kulicke and Soffa	8060	Reliability Test Equipment in Metrology Equipment KULICKE & SOFFA, 8060: KULICKE & SOFFA, 8060 No serial number found.	1		Inquire		East Fishkill, New York, United States
	227880	LAM	LAM	2300 v2	Plasma Processing Equipment and Tools - Other in Wafer Fabrication Equipment LAM, 2300 v2, 300mm, S/N 47687: LAM, 2300 v2, 300mm, S/N 47687	1		Inquire		East Fishkill, New York, United States
	227585	LAM	LAM	INOVA XT	Plasma Processing Equipment and Tools - Other in Wafer Fabrication Equipment LAM, INOVA XT, 300mm, S/N 03-7-IC30021 / 03-7-IC30022: LAM, INOVA XT, 300mm, S/N  03-7-IC30021 / 03-7-IC30022	1		Inquire		East Fishkill, New York, United States
	219677	LAM Research Corp.	LAM Research Corp.	INOVA	Plasma Processing Equipment and Tools - Other in Wafer Fabrication Equipment LAM, INOVA, 300mm, S/N 007823-0389: LAM, INOVA, 300mm, S/N 007823-0389	1		Inquire		Malta, New York, United States
	217388	LAM Research Corp.	LAM Research Corp.	Sabre 3D	Wafer Production Equipment - Other in Wafer Fabrication Equipment LAM, Sabre 3D, 300mm, S/N 20911: LAM, Sabre 3D, 300mm, S/N 20911	1		Inquire		East Fishkill, New York, United States
	219675	LAM Research Corp.	LAM Research Corp.	Vector Express	Chemical Vapor Deposition Equipment - Other in Chemical Vapor Deposition Equipment LAM, Vector Express, 300mm, S/N D22437A, Ashable Hard Mask CVD: LAM, Vector Express, 300mm, S/N D22437A, Ashable Hard Mask CVD	1		Inquire		Malta, New York, United States
	235046	LAM Research Corp.	LAM Research Corp.	Veeco Summit chm	Clean Room Equipment in Chambers, Components, Accessories and Other Items LAM, Veeco Summit chm, for MRAM, 300mm, S/N 9903-890-01 IBE C-1: LAM, Veeco Summit chm, for MRAM, 300mm, S/N 9903-890-01 IBE C-1	1		Inquire	N*	Singapore, Singapore
	204933	Lasertech	Lasertech	BI 100	Wafer Production Equipment - Other in Wafer Fabrication Equipment LaserTech, BI100, Reticle backside inspection, : LaserTech, BI100, Reticle backside inspection,	1		Inquire		Malta, New York, United States
	209076	Leica	Leica	POLYLITE 88 METALLURGICAL SCOPE	Wafer Inspection Microscopes in Microscopes, Optical Inspection Leica, POLYLITE 88 METALLURGICAL SCOPE: Leica, POLYLITE 88 METALLURGICAL SCOPE   REICHERT INCIDENT LIGHT MICROSCOPE Idle in the fab.	1		Inquire		Singapore, Singapore
	204285	Lyncee	Lyncee	Holographic Microscope	Microscopes - Other in Microscopes, Optical Inspection LYNCEE TEC, Holographic Microscope, : LYNCEE TEC, Holographic Microscope,    In Lab	1		Inquire	F*	Malta, New York, United States
	221389	Mosaid	Mosaid	MS348001	Test & Measurement - Other in Test, Analysis and Measurement Equipment MOSAID, MS348001, S/N 3480: MOSAID, MS348001, S/N 3480	1		Inquire		Singapore, Singapore
	179748	MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm	MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm		Microscope Inspection Items - Other in Microscopes, Optical Inspection MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm: MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm tool for micro probing of transistors at contact level 3 Probe heads, MP1-system with semiauto stage/optics Comes with :  electronic rack with controllers for heads + PCs, probing enclosure unit with optical microscope+3 probe heads Upgrades Include: semiautomatic stage, optics & probe head control, 4th probe head	1		Inquire	F*	Dresden, SN, Germany
	191539	Nanometrics	Nanometrics	Q200I	Lithography Equipment in Metrology Equipment Nanometrics, Q200I, 200mm,: Nanometrics, Q200I, 200mm, Biorad Overlay Tool   Bagged & Skidded in Warehouse. !!!MULTIPLE UNITS AVAILABLE!!!  PLEASE INQUIRE S/N: 200-00-11-02	1		Inquire		Singapore, Singapore
	191540	Nanometrics	Nanometrics	Q200I	Lithography Equipment in Metrology Equipment Nanometrics, Q200I, 200mm,: Nanometrics, Q200I, 200mm, Biorad Overlay Tool S/N: QS2216	1		Inquire		Singapore, Singapore
	234773	Nikon	Nikon	NSR-S208D	Deep UV Wafer Stepper in Wafer Fabrication Equipment Nikon, NSR-S208D, 300mm, S/N 8732008: Nikon, NSR-S208D, 300mm, S/N 8732008	1		Inquire	N*	Singapore, Singapore
	234789	Nikon	Nikon	NSR-S208D	Deep UV Wafer Stepper in Wafer Fabrication Equipment Nikon, NSR-S208D, 300mm, S/N 8732069: Nikon, NSR-S208D, 300mm, S/N 8732069	1		Inquire	N*	Singapore, Singapore
	234539	Nikon	Nikon	S204B	Deep UV Wafer Stepper in Wafer Fabrication Equipment Nikon, S204B, 200mm, S/N 6030134: Nikon, S204B, 200mm, S/N 6030134 X92V Lens Data: Distortion =  0.015 µm IU Flare = 1.80% Lens Flare = 9.0% Uniformity = 5.3% Power = 779 mW Total Focus Deviation = 0.202 µm  Astigmatism = 0.081 µm  Coma = 0.062 µm Iso DOF = N/A µm (>35nm of CD Range at Best Focus)	1		Inquire	N*	Burlington, Vermont, United States
	233209	Nikon	Nikon		Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items Nikon, S206 PM reticles: Nikon, S206 PM reticles 2 pieces. R2604HBVer8.10 R2504HAVer7.50	1		Inquire		Singapore, Singapore
	232929	Nikon	Nikon		Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items Nikon, S207 Components A: Nikon, S207 Components A See pdf for details.	1		Inquire		Singapore, Singapore
	232912	Nikon	Nikon		Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items Nikon, S207 Components B: Nikon, S207 Components B See pdf for more details.	1		Inquire		Singapore, Singapore
	232930	Nikon	Nikon		Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items Nikon, S207 Components C: Nikon, S207 Components C See pdf for details	1		Inquire		Singapore, Singapore
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*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.