 |
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
Make |
Model |
|
|
$ |
|
 |
236971
|
FSI
|
FSI |
Mercury MP |
in Wafer Fabrication Equipment
93886X, FSI Mercury MP, s/n: 0106-0256-0995, Hot Process Tool: DHF, SP, Huang AB:93886X, FSI Mercury MP, s/n: 0106-0256-0995, 200mm Hot Process Tool: DHF, SP, Huang AB
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
236972
|
FSI
|
FSI |
Mercury |
in Wafer Fabrication Equipment
93888X, FSI, Mercury, s/n: 0106-0178-0295, Hot Process Tool: DHF, SP, Huang AB:93888X FSI Mercury (PN: 4079933-001), s/n: 0106-0178-0295, Hot Process Tool: DHF, SP, Huang AB, 200mm
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
236973
|
FSI
|
FSI |
Mercury MP |
in Wafer Fabrication Equipment
93889X, FSI Mercury MP, s/n: 0106-0257-099, Hot Process Tool, DHF, SP, Huang AB:93889X FSI Mercury MP, s/n: 0106-0257-099, Hot Process Tool, DHF, SP, Huang AB, 200mm
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
237614
|
ABLEPRINT TECHNOLOGY
|
ABLEPRINT TECHNOLOGY |
VTS-60A |
in Chambers, Components, Accessories and Other Items
AblePrint Technology Co. VTS-60A, sn: HU-17-020, Pressure Curing Oven:AblePrint Technology Co. VTS-60A, sn: HU-17-020 Pressure Curing Oven used for de-voiding in materials PCO01
|
1
|
|
Inquire |
N* |
East Fishkill, New York, United States |
|
 |
237616
|
AIR-VAC
|
AIR-VAC |
DRS2 |
in Chambers, Components, Accessories and Other Items
Air-Vac Engineering, DRS25, sn: U3093, Repair tool for Surface Mount Technology:Air-Vac Engineering, DRS25, sn: U3093, Repair tool for Surface Mount Technology
|
1
|
|
Inquire |
N* |
East Fishkill, New York, United States |
|
 |
236594
|
Advanced Energy
|
Advanced Energy |
APEX 3013 1513 |
in Chambers, Components, Accessories and Other Items
AMAT - Advanced Energy Generators, Apex 3013, 1513, Paramount 1513:AMAT - Advanced Energy Generators, Apex 3013, 1513, Paramount 1513 Apex 3013 qty 7 Apex 1513 qty 7 Paramount 3013 qty 2 Paramount 1513 qty 2 2010 Vintage
|
1
|
|
Inquire |
 |
East Fishkill, New York, United States |
|
 |
236881
|
Applied Materials
|
Applied Materials |
CENTURA |
in Chemical Vapor Deposition Equipment
AMAT Centura Mainfraim and Enabler Chambers:ETX659 - AMAT Centura Enabler, s/n 414191
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
237620
|
AMAT
|
AMAT |
PRODUCER SE |
in Chemical Vapor Deposition Equipment
AMAT Producer SE, sn:409829, UVC, eHARP, Nitride:AMAT Producer SE, sn:409829, UVC, eHARP, Nitride
|
1
|
|
Inquire |
N* |
East Fishkill, New York, United States |
|
 |
232897
|
Applied Materials In
|
Applied Materials In |
0040-62020 |
in Chambers, Components, Accessories and Other Items
AMAT, 300mm, CMP Retaining Rings:AMAT, 300mm, CMP Retaining Rings
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
219723
|
Applied Materials
|
Applied Materials |
PECVD Producer GT BDII ---- 3ch - CHA-BCHD, CHB-BC |
in Chemical Vapor Deposition Equipment
AMAT, PECVD Producer GT BDII ---- 3ch - CHA-BCHD, CHB-BCHD, C, 300mm, S/N 428039:AMAT, PECVD Producer GT BDII ---- 3ch - CHA-BCHD, CHB-BCHD, CHC-BCHD, 300mm, S/N 428039 Tool is missing Many Parts. Inspection highly advised, to confirm tool serial ID.
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
233427
|
Applied Materials
|
Applied Materials |
Producer SE |
in Chemical Vapor Deposition Equipment
AMAT, Producer SE, 300mm, S/N 422966:AMAT, Producer SE, 300mm, S/N 422966 Please see pdf for missing parts.
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
219673
|
Applied Materials
|
Applied Materials |
Producer SE |
in Chemical Vapor Deposition Equipment
AMAT, Producer SE, 300mm, S/N 425704:AMAT, Producer SE, 300mm, S/N 425704, Low-K Dielectric CVD Please check out missing parts in the pdf. Inspection strongly advised.
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
204911
|
Applied Materials
|
Applied Materials |
Uvision 5 |
in Microscopes, Optical Inspection
Applied Materials, Uvision5, Bright Field Inspection, 300mm:Applied Materials, Uvision5, Bright Field Inspection, 300mm In the fab, Idle
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
237610
|
AQUEOUS
|
AQUEOUS |
Trident LDO |
in Chambers, Components, Accessories and Other Items
Aqueous Technologies Trident LDO, sn: 9679, Solder Clean Tool:Aqueous Technologies Trident LDO, sn: 9679, Solder Clean Tool, CLEN2
|
1
|
|
Inquire |
N* |
East Fishkill, New York, United States |
|
 |
209252
|
ASML
|
ASML |
XT: 1250B |
in Wafer Fabrication Equipment
ASML, XT:1250B, 300mm, ArF :ASML, XT:1250B, 300mm, ArF In the Fab. Running wafers.
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
230320
|
ASML
|
ASML |
XT1250B |
in Wafer Fabrication Equipment
ASML, XT1250B, 300mm, S/N 7924:ASML, XT1250B, 300mm, S/N 7924
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
226062
|
ASML
|
ASML |
XT1250D |
in Wafer Fabrication Equipment
ASML, XT1250D, 300mm, S/N 7337:ASML, XT1250D, 300mm, S/N 7337
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
230289
|
ASML
|
ASML |
XT1700FI |
in Wafer Fabrication Equipment
ASML, XT1700FI, 300mm S/N 5633:ASML, XT1700FI, 300mm S/N 5633
|
1
|
|
Inquire |
 |
East Fishkill, New York, United States |
|
 |
233544
|
Brooks
|
Brooks |
7850 |
in Wafer Fabrication Equipment
BROOKS, PRI 7850, 200mm, Reticle stocker, S/N 059972355:BROOKS, PRI 7850, 200mm, Reticle stocker, S/N 059972355
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
235938
|
Bruker-AXS
|
Bruker-AXS |
D8S - 2DB10 |
in Metrology Equipment
Bruker AXS, D8S - 2DB10, S/N 202653:Bruker AXS, D8S - 2DB10, S/N 202653
|
1
|
|
Inquire |
|
Dresden, Saxony, Germany |
|
 |
209828
|
Bruker, D8FABLINE, 300mm, X-Ray Metrology
|
Bruker, D8FABLINE, 300mm, X-Ray Metrology |
in Microscopes, Optical Inspection
Bruker, D8FABLINE, 300mm, X-Ray Metrology:Bruker, D8FABLINE, 300mm, X-Ray Metrology
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
204314
|
Check Point Technolo
|
Check Point Technolo |
InfraScanTDM 300 TDE |
in Metrology Equipment
CheckPoint, InfraScanTDM 300 TDE, Laser Scanning Emisson:CheckPoint, InfraScanTDM 300 TDE, Laser Scanning Emisson The system is comprised of the following: 1 InfraScan 300 TDE Laser Probing / Emission System Includes the following assemblies: * LSM 300 scanner with integrated emission camera port; * CCD camera for sample navigation with separate display; * 5-position motorized turret; * X, Y, Z motorized movement of LSM assembly; * PC with digitizer, Windows XP, Proscan 2000 Acquisition Software; * Moveable Operator Console, with flat panel displays, Semi S8 compliant; * SLS-1000 1064 nm 300 mW * SLS-1000 1319 nm 350 mW * ASP-1000 3A Amplifier source package * Laser power adjustment, 0 to 100%, with incident power monitoring for all objectives; * Dark chamber with laser safety interlock, Class I (with service override), vibration isolation * User’s manual. Emission Camera Options InGaAs LN2 cooled 640 x 640 array 18 ?m pixels. LN2 Auto-fill system with two (2) 160 L Dewars InfraScan™ LTM 9Hz laser timing module. Includes the following: 9 GHz laser timing module Digital Oscilloscope 12.5 GHz Bandwidth Electronic Spectrum Analyzer APD and electronic amplifier High power/ high stability laser for timing stimulus Objective Options 5X NIR, Mitutoyo 378-822 20X IR Plan Apo, NA 0.5, Seiwa 50X IR Plan Apo, NA 0.6, Seiwa 100X NIR HR Mitutoyo 378-864-5 1X Macro Lens Specifications and Features: LSM 300/Optics- Optimized for high transmission at 1064nm and 1340nm. * T => 100mW at 1064nm 5X objective; T =>300mW at 1340nm 5X objective Image distortion <2%, 2X slow scan. Spot size 0.61?/NA of objective. * Scan rate 310 lines/sec to 2 sec/line. Field of view with 5X objective at 1X zoom: 3.2mm. Optical zoom range 1X to 8X (scanned field). * Image registration better than 2% for various wavelengths. * 5-position motorized turret, non-winding, Software settable crash protection limits for all objective lenses. Software controlled, par-centered and parfocal objectives. Built-in CCD camera for sample navigation with color monitor. External sync circuit. Computer and Inputs - PC with 3-channel digitizer input, one for LSM imaging and two for laser stimulation methods. Signal inputs are synchronized with LSM scan rate. Independent Gain and Offset control for input 1 and input 2. Scan rates adjustable from 310 lines/sec to 2048X slow to match response of DUT. 2-way communication with Knights CAD link. SLS 1000 RD – 300mW 1064 nm linearly polarized laser * Continuously adjustable Laser Power, from near 0% to full maximum. Real-time, incident laser power monitoring. Power limit feature to prevent overexposure of DUT. FC fiber optical coupler with 3 meter PM patchcord. ASP 1000 Amplifier-Source Package - Source Selections: Constant Current Programmable Range: 0.5nA – 1A; (3A optional) Minimum Program Step: .5nA Constant Voltage Programmable Range: 1uV – 10V (20V if protection diode removed) Minimum Program Step: 1uV Amplifier Selections: AC Voltage Amplifier Bias Current: .5nA - 1A; (3A optional) Maximum Input: 10V Input impedance: >4.7M Ohm Maximum Gain: 120 dB Detectability: 1 nV at full gain Bandwidth: 0.3 to 400K Hz High Pass Filter: .3, 50, 100, 200, 400, 800, 1.6K, 3.2K, 6.4K, 12.8K, 25K, 50K, 100K, 200K, 400K HZ, Low Pass Filter: 50, 100, 200, 400, 800, 1.6K, 3.2K, 6.4K, 12.8K, 25K, 50K, 100K, 200K, 400K HZ Output Offset Voltage: +/- 5V DC Current Amplifier (OBIC mode) Bias Voltage Range: 1uV - 10V Maximum Input: 20 mA Maximum Gain: 80 V/nA Detectability: 1 pA at full gain Bandwidth: DC to 400K Hz
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
237618
|
Crest Ultrasonics
|
Crest Ultrasonics |
SS-1550A |
in Chambers, Components, Accessories and Other Items
Crest Ultrasonics, SS-1550A, SN: 0815ST 290 0020, Stencil Clean:Crest Ultrasonics, SS-1550A, SN: 0815ST 290 0020, Stencil Clean
|
1
|
|
Inquire |
N* |
East Fishkill, New York, United States |
|
 |
236199
|
Despatch
|
Despatch |
PWB-48X38X64-3E, |
in Metrology Equipment
DESPATCH, PWB-48X38X64-3E, Bake Out Oven Cabinet, S/N 183009:DESPATCH, PWB-48X38X64-3E, Bake Out Oven Cabinet, S/N 183009
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
236200
|
Despatch
|
Despatch |
PWB-48X38X64-3E |
in Metrology Equipment
DESPATCH, PWB-48X38X64-3E, Bake Out Oven Cabinet, S/N 183010:DESPATCH, PWB-48X38X64-3E, Bake Out Oven Cabinet, S/N 183010
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
211632
|
Despatch
|
Despatch |
PWB-48X38X64-3E |
in Chambers, Components, Accessories and Other Items
DESPATCH, PWB-48X38X64-3E, Bake-out Cabinet Oven :DESPATCH, PWB-48X38X64-3E, Bake-out Cabinet Oven Installed. Idle.
|
1
|
|
Inquire |
F* |
Malta, New York, United States |
|
 |
207722
|
Disco
|
Disco |
DFG-82IF/8 |
in Metrology Equipment
Disco, DFG-82IF/8, Backside Grind, 200mm :Disco, DFG-82IF/8, Backside Grind, 200mm S/N : GG0220
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
226695
|
ESI
|
ESI |
9300 |
in Metrology Equipment
ESI, 9300, 200mm, S/N 64057:ESI, 9300, 200mm, S/N 64057
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
215848
|
Estion
|
Estion |
E-RETICLE V 4M |
in Metrology Equipment
Estion, E-RETICLE V 4M, Electrostatic Charge Measurement:Estion, E-RETICLE V 4M, Electrostatic Charge Measurement Reticle Electrostatic Charge Measurement System Installed, Idle. Vintage : 2010
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
236338
|
Extraction Systems I
|
Extraction Systems I |
PROFILE DUV |
in Wafer Fabrication Equipment
Extraction Systems Inc, PROFILE DUV, 200mm:Extraction Systems Inc, PROFILE DUV, 200mm No serial number, DUV MAKE-UP AIR FILTER PROFILE 1250F
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
236975
|
DEK International Gm
|
DEK International Gm |
Galaxy |
in Chambers, Components, Accessories and Other Items
F10 PRINT, DEK Galaxy, s/n: 282942:F10 PRINT, DEK Galaxy, s/n: 282942 Solder Paste Screen Dispense Tool
|
1
|
|
Inquire |
 |
East Fishkill, New York, United States |
|
 |
236974
|
Applied Materials
|
Applied Materials |
|
in Chambers, Components, Accessories and Other Items
F10 RF Generators:Multiple RF Generators (source and bias) from AMAT Centura platform w/ Minos and Carina chambers AMAT - Advanced Energy Generators
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
 |
219850
|
FEI
|
FEI |
CLM3D |
in Metrology Equipment
FEI, CLM3D, 300mm, S/N CLM000070, FIB:FEI, CLM3D, 300mm, S/N CLM000070, FIB
|
1
|
|
Inquire |
 |
East Fishkill, New York, United States |
|
 |
203117
|
FEI
|
FEI |
ExSolve 2 WTP EFEM |
in Microscopes, Optical Inspection
FEI, ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB:FEI, ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB In the fab. Warm shutdown.
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
230317
|
FEI
|
FEI |
ExSolve CLM next Gen |
in Microscopes, Optical Inspection
FEI, ExSolve CLM next Gen, 300mm, S/N 9923535:FEI, ExSolve CLM next Gen, 300mm, S/N 9923535
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
230318
|
FEI
|
FEI |
ExSolve CLM next Gen |
in Microscopes, Optical Inspection
FEI, ExSolve CLM next Gen, 300mm, S/N 9923609:FEI, ExSolve CLM next Gen, 300mm, S/N 9923609
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
233426
|
Genmark Automation
|
Genmark Automation |
Porta300P |
in Chambers, Components, Accessories and Other Items
Genmark, Porta300P, 2 loadports:Genmark, Porta300P, 2 loadports with some spare parts. See pdf for details.
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
237624
|
Hitachi
|
Hitachi |
CG4100 |
in Metrology Equipment
HITACHI CG4100, sn: 4138-01, 300mm:HITACHI CG4100, sn: 4138-01, 300mm
|
1
|
|
Inquire |
N* |
East Fishkill, New York, United States |
|
 |
204280
|
Hitachi
|
Hitachi |
M-8190XT |
in Wafer Fabrication Equipment
Hitachi, M-8190XT, 300mm, Plasma Etch:Hitachi, M-8190XT, 300mm, Plasma Etch 3 Chambers In Fab, Warm Idle
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
204305
|
HMI, eP4 320, 300mm, ebeam Inspection
|
HMI, eP4 320, 300mm, ebeam Inspection |
in Microscopes, Optical Inspection
HMI, eP4 320, 300mm, ebeam Inspection:HMI, eP4 320, 300mm, ebeam Inspection In the Fab. Cold Idle
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
202816
|
HSEB
|
HSEB |
Axiospect 301 |
in Microscopes, Optical Inspection
HSEB, Axiospect 301, Optical Microscope, 300mm:HSEB, Axiospect 301, Optical Microscope, 300mm Cold. Not working parts include: - Tango Controller (Microscope Stage controller
- Joystick and keyboard controller
- Micromotor for fingers edge gripper
- few powers supplies
The tool was running with Windows XP professional 2002 service pack 3.
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
202817
|
HSEB
|
HSEB |
Axiospect 301 |
in Microscopes, Optical Inspection
HSEB, Axiospect 301, Optical Microscope, 300mm:HSEB, Axiospect 301, Optical Microscope, 300mm
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
236442
|
Insidix
|
Insidix |
TDM Compact 3 |
in Metrology Equipment
Insidix, TDM Compact 3, Topography & Deformation Measurement tool:Insidix, TDM Compact 3, Topography & Deformation Measurement tool 2017 Vintage, Serial Number : 2017/15/1
|
1
|
|
Inquire |
 |
East Fishkill, New York, United States |
|
 |
202818
|
Jordan Valley
|
Jordan Valley |
JVX6200i |
in Metrology Equipment
Jordan Valley, JVX6200i, 300mm, Film Thickness Measurement:Jordan Valley, JVX6200i, 300mm, Film Thickness Measurement
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
236360
|
Keithley
|
Keithley |
S425 |
in Metrology Equipment
KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2591:KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2591
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
236359
|
Keithley
|
Keithley |
S425 |
in Metrology Equipment
KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2593:KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2593
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
192419
|
Keithley Instruments
|
Keithley Instruments |
S425 |
in Metrology Equipment
Keithley, S425, Kerf Test, S/N QMO2572:Keithley, S425, Kerf Test, S/N QMO2572 Keithley standard matrix kerf tester
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
192418
|
Keithley Instruments
|
Keithley Instruments |
S425 |
in Metrology Equipment
Keithley, S450, Kerf Parametric Tester, S/N: QMO2573:Keithley, S450, Kerf Parametric Tester, S/N: QMO2573
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
236337
|
KLA-Tencor
|
KLA-Tencor |
5200XP |
in Metrology Equipment
KLA, 5200XP, 200mm, S/N 2200:KLA, 5200XP, 200mm, S/N 2200
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
231156
|
KLA-Tencor
|
KLA-Tencor |
Archer AIM+ |
in Metrology Equipment
KLA, Archer AIM+, 300m , S/N 3531:KLA, Archer AIM+, 300m , S/N 3531 NOTE : AVAILABLE - 21-OCT-22
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
231163
|
KLA-Tencor
|
KLA-Tencor |
Archer AIM+ |
in Metrology Equipment
KLA, Archer AIM+, 300m , S/N 3616:KLA, Archer AIM+, 300m, S/N 3616 NOTE: AVAILABLE - 4-NOV-22
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
235676
|
KLA-Tencor
|
KLA-Tencor |
EDR 5200 |
in Microscopes, Optical Inspection
KLA, EDR 5200, 300mm, S/N 5040128:KLA, EDR 5200, 300mm, S/N 5040128
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
235677
|
KLA-Tencor
|
KLA-Tencor |
EDR 5210 |
in Microscopes, Optical Inspection
KLA, EDR 5210, 300mm, S/N 5040135:KLA, EDR 5200, 300mm, S/N 5040135
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
190993
|
Kokusai
|
Kokusai |
Quixace Ultimate |
in Chemical Vapor Deposition Equipment
Kokusai Quixace Ultimate, 300mm, DJ-1236VN-DF:Kokusai Quixace Ultimate, 300mm, DJ-1236VN-DF
Low Temp Steam Anneal - for SOD Cure
S/N: T2DD6-18711
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
190750
|
Kokusai
|
Kokusai |
DD-1223VN |
in Chemical Vapor Deposition Equipment
Kokusai Quixace, 300mm, DD-1223VN, ALD-TiN:Kokusai Quixace, 300mm, DD-1223VN
ALD-TiN
S/N T2DC6-16441
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
 |
208405
|
Kokusai
|
Kokusai |
Quixace |
in Chemical Vapor Deposition Equipment
Kokusai, Quixace, 300mm, Anneal, Cobalt :Kokusai, Quixace, 300mm, Anneal, Cobalt Crated. In warehouse. Data Sheet is incorrect: Model is DD-1223VN-DF as shown in the Serial Number Tag photo. DOM : 2014 S/N : T2DD6-18973-1
|
1
|
|
Inquire |
F* |
Malta, New York, United States |
|
 |
219677
|
LAM Research Corp.
|
LAM Research Corp. |
INOVA |
in Wafer Fabrication Equipment
LAM, INOVA, 300mm, S/N 007823-0389:LAM, INOVA, 300mm, S/N 007823-0389
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
219675
|
LAM Research Corp.
|
LAM Research Corp. |
Vector Express |
in Chemical Vapor Deposition Equipment
LAM, Vector Express, 300mm, S/N D22437A, Ashable Hard Mask CVD:LAM, Vector Express, 300mm, S/N D22437A, Ashable Hard Mask CVD
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1
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Inquire |
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Malta, New York, United States |
|
 |
204933
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Lasertech
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Lasertech |
BI 100 |
in Wafer Fabrication Equipment
LaserTech, BI100, Reticle backside inspection, :LaserTech, BI100, Reticle backside inspection,
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1
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Inquire |
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Malta, New York, United States |
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 |
236970
|
Advantest
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Advantest |
V93000 |
in Metrology Equipment
LD96, Advantest, V93000, s/n PL000396, Logic and Memory Functional Tester:LD96 Advantest, V93000, s/n PL000396, Logic and Memory Functional Tester
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1
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Inquire |
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East Fishkill, New York, United States |
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 |
204285
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Lyncee
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Lyncee |
Holographic Microscope |
in Microscopes, Optical Inspection
LYNCEE TEC, Holographic Microscope, :LYNCEE TEC, Holographic Microscope, In Lab
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1
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Inquire |
F* |
Malta, New York, United States |
|
 |
236069
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Nikon
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Nikon |
NSR-EX14C |
in Wafer Fabrication Equipment
Nikon, NSR-EX14C, 200mm, S/N 7573077:Nikon, NSR-EX14C, 200mm, S/N 7573077
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1
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Inquire |
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Singapore, Singapore |
|
 |
237202
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Nikon
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Nikon |
S204B |
in Wafer Fabrication Equipment
Nikon, NSR-S204B, 200mm, S/N 6030253:Nikon, NSR-S204B, 200mm, S/N 6030253
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1
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Inquire |
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Singapore, Singapore |
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 |
234539
|
Nikon
|
Nikon |
S204B |
in Wafer Fabrication Equipment
Nikon, S204B, 200mm, S/N 6030134:Nikon, S204B, 200mm, S/N 6030134 67X92V Lens Data: Distortion = 0.015 µm IU Flare = 1.80% Lens Flare = 9.0% Uniformity = 5.3% Power = 779 mW Total Focus Deviation = 0.202 µm Astigmatism = 0.081 µm Coma = 0.062 µm Iso DOF = N/A µm (>35nm of CD Range at Best Focus)
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1
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Inquire |
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Burlington, Vermont, United States |
|
 |
220257
|
Nova
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Nova |
T600 |
in Metrology Equipment
NOVA, T600, 300mm, S/N 107242:NOVA, T600, 300mm, S/N 107242
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1
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Inquire |
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East Fishkill, New York, United States |
|
 |
210035
|
Oryx
|
Oryx |
EX11000S M65X |
in Automatic Test Equipment
Oryx, EX11000S M65X, ESD Simulator , Final Test :Oryx, EX11000S M65X, ESD Simulator , Final Test Idle.
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1
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Inquire |
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Burlington, Vermont, United States |
|
 |
210036
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Oryx
|
Oryx |
EX11000S M65X |
in Automatic Test Equipment
Oryx, EX11000S M65X, ESD Simulator , Final Test:Oryx, EX11000S M65X, ESD Simulator , Final Test Idle
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1
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Inquire |
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Burlington, Vermont, United States |
|
 |
237608
|
PACTECH
|
PACTECH |
SB2-SM |
in Chambers, Components, Accessories and Other Items
PacTech SB2-SM, SN: 14610116, C4 300MM, BGAAT:PacTech SB2-SM, SN: 14610116, C4 300MM, BGAAT
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1
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Inquire |
N* |
East Fishkill, New York, United States |
|
 |
217845
|
Phoenix
|
Phoenix |
Micromex 160 |
in Automatic Test Equipment
Phoenix X-ray systems, Micromex 160, ANA01C0003-118507:Phoenix X-ray systems, Micromex 160, ANA01C0003-118507 Failure analysis 2-D Xray system
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1
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Inquire |
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Burlington, Vermont, United States |
|
 |
237573
|
PSK
|
PSK |
Tera 21 |
in Wafer Fabrication Equipment
PSK, Tera 21, 300mm, S/N PTK07024:PSK, Tera 21, 300mm, S/N PTK07024 Platform only, no chms. Inspection is strongly advised.
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1
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Inquire |
N* |
Singapore, Singapore |
|
 |
237611
|
PVA
|
PVA |
Delta 6 |
in Chambers, Components, Accessories and Other Items
PVA Delta 6, sn: W6789, Flux Spray Dispense Tool:PVA Delta 6, sn: W6789, Flux Spray Dispense Tool FSPR1
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1
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|
Inquire |
N* |
East Fishkill, New York, United States |
|
 |
236336
|
Rigaku
|
Rigaku |
3640 WAFER ANALYZER |
in Metrology Equipment
RIGAKU, 3640 WAFER ANALYZER, 200mm, S/N VR41002:RIGAKU, 3640 WAFER ANALYZER, 200mm, S/N VR41002
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1
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Inquire |
 |
Singapore, Singapore |
|
 |
204935
|
Rorze
|
Rorze |
RSR160 |
in Wafer Fabrication Equipment
Rorze, RSR160, Reticle Handler:Rorze, RSR160, Reticle Handler
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1
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|
Inquire |
 |
Malta, New York, United States |
|
 |
215723
|
Semilab
|
Semilab |
IR3100S |
in Metrology Equipment
Semilab, IR3100S, micro spot spectroscopic ellipsometer, 300mm :Semilab, IR3100S, Micro-Spot spectraocopic ellipsometer, 300mm Installed. Operational. S/N: 4010
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1
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Inquire |
 |
Dresden, Saxony, Germany |
|
 |
199985
|
SemiProbe
|
SemiProbe |
PS4L FA-12 |
in Metrology Equipment
SemiProbe, PS4L FA-12, Fully Automatic Prober with FOUP Capability, 300mm:SemiProbe, PS4L FA-12, Fully Automatic Prober with FOUP Capability, 300mm
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1
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Inquire |
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Malta, New York, United States |
|
 |
237609
|
ShibuYa Co. Ltd.
|
ShibuYa Co. Ltd. |
SBP696 |
in Chambers, Components, Accessories and Other Items
Shibuya SBP696, sn: CAW9006, Vacuum Ball Grid Array Screening:Shibuya SBP696, sn: CAW9006, Vacuum Ball Grid Array Screening
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1
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|
Inquire |
N* |
East Fishkill, New York, United States |
|
 |
237619
|
Speedline Tech
|
Speedline Tech |
8300-1 |
in Chambers, Components, Accessories and Other Items
Speedline Technologies, 8300-1, sn: 8300-20651, Underfill Camalot Prodigy Tool:Speedline Technologies, 8300-1, sn: 8300-20651, Underfill Camalot Prodigy Tool
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1
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|
Inquire |
N* |
East Fishkill, New York, United States |
|
 |
237574
|
TAE YANG TECH
|
TAE YANG TECH |
WET BENCH |
in Chambers, Components, Accessories and Other Items
TAE YANG TECH, WET BENCH, 200mm, parts cleaning sink:TAE YANG TECH, WET BENCH, 200mm, parts cleaning sink
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1
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Inquire |
N* |
Singapore, Singapore |
|
 |
236332
|
Tel
|
Tel |
ACT8 |
in Wafer Fabrication Equipment
TEL, ACT8, 200mm, S/N 9201480:TEL, ACT8, 200mm, S/N 9201480
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1
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|
Inquire |
 |
Singapore, Singapore |
|
 |
236788
|
Tel
|
Tel |
ALPHA-303i |
in Chemical Vapor Deposition Equipment
TEL, ALPHA-303i, 300mm, S/N L00000545156:TEL, ALPHA-303i, 300mm, S/N L00000545156
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1
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|
Inquire |
 |
Singapore, Singapore |
|
 |
236786
|
Tel
|
Tel |
ALPHA-303i-K |
in Chemical Vapor Deposition Equipment
TEL, ALPHA-303i-K, 300mm, S/N L00000735070:TEL, ALPHA-303i-K, 300mm, S/N L00000735070
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1
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|
Inquire |
 |
Singapore, Singapore |
|
 |
236787
|
Tel
|
Tel |
ALPHA-303i-K |
in Chemical Vapor Deposition Equipment
TEL, ALPHA-303i-K, 300mm, S/N L00000735071:TEL, ALPHA-303i-K, 300mm, S/N L00000735071
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1
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|
Inquire |
 |
Singapore, Singapore |
|
 |
236335
|
Tel
|
Tel |
ALPHA-8S-Z |
in Chemical Vapor Deposition Equipment
TEL, ALPHA-8S-Z, 200mm, S/N A00000165043:TEL, ALPHA-8S-Z, 200mm, S/N A00000165043
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1
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|
Inquire |
 |
Singapore, Singapore |
|
 |
236334
|
Tel
|
Tel |
ALPHA-8S-Z |
in Chemical Vapor Deposition Equipment
TEL, ALPHA-8S-Z, 200mm, S/N A000099X5141:TEL, ALPHA-8S-Z, 200mm, S/N A000099X5141
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1
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|
Inquire |
 |
Singapore, Singapore |
|
 |
226733
|
Tel
|
Tel |
CR385PH |
in Automatic Test Equipment
TEL, CR385PH, S/N 067004:TEL, CR385PH, S/N 067004
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1
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|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
230304
|
Tokyo Electron Ltd
|
Tokyo Electron Ltd |
Lithius Pro |
in Wafer Fabrication Equipment
TEL, Lithius Pro, 300mm, S/N N110495:TEL, Lithius Pro, 300mm, S/N N110495
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1
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|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
226738
|
Tel
|
Tel |
LTI unit |
in Automatic Test Equipment
TEL, LTI unit, S/N 12007:TEL, LTI unit, S/N 12007
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1
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|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
226737
|
Tel
|
Tel |
LTI chuck precio nano |
in Automatic Test Equipment
TEL, LTI unit, S/N Y661266:TEL, LTI unit, S/N Y661266
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1
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|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
204309
|
Tel
|
Tel |
Tactrus NCCP |
in Chambers, Components, Accessories and Other Items
TEL, Tactrus NCCP, 300mm, Etch:TEL, Tactrus NCCP, 300mm, Etch Connected in fab with 2 chms.
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1
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|
Inquire |
 |
Malta, New York, United States |
|
 |
235341
|
Tel
|
Tel |
Unity M SCCM |
in Wafer Fabrication Equipment
TEL, Unity M SCCM, 200 mm, S/N UM0075:TEL, Unity M SCCM, 200 mm, S/N UM0075
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1
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|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
236291
|
Tel
|
Tel |
Unity M SCCM |
in Wafer Fabrication Equipment
TEL, Unity M SCCM, SN UM0033, 200mm, Etch:TEL, Unity SCCM, SN UM0033, 200mm, Etch 1985 Vintage
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1
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|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
235937
|
Thermo Fisher
|
Thermo Fisher |
THETA300 |
in Metrology Equipment
THERMO FISHER, THETA300 MKII, s/n A1188:THERMO FISHER, THETA300 MKII, s/n A1188
|
1
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|
Inquire |
|
Dresden, Saxony, Germany |
|
 |
233408
|
Various turbo pumps, Adixen and Agilent
|
Various turbo pumps, Adixen and Agilent |
in Chambers, Components, Accessories and Other Items
Various turbo pumps, Adixen and Agilent:6 turbo pumps, Adixen and Agilent. Please see pdf for more details.
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1
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|
Inquire |
 |
East Fishkill, New York, United States |
|
 |
237615
|
Veeco
|
Veeco |
M3400ML |
in Chambers, Components, Accessories and Other Items
Veeco M3400ML, sn: 42553, Solvent Release Tool, RELSE:Veeco M3400ML, sn: 42553, Solvent Release Tool
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1
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|
Inquire |
N* |
East Fishkill, New York, United States |
|
|
 |