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Item ID  Photo Short Description Product Type / Details # Price Notes Location Make Model   $   236971 FSI   FSI   Mercury MP  Wafer Cleaners in Wafer Fabrication Equipment 93886X, FSI Mercury MP, s/n: 0106-0256-0995, Hot Process Tool: DHF, SP, Huang AB: 93886X, FSI Mercury MP, s/n: 0106-0256-0995, 200mm Hot Process Tool: DHF, SP, Huang AB 1 Inquire Burlington, Vermont, United States 236972 FSI   FSI   Mercury  Wafer Cleaners in Wafer Fabrication Equipment 93888X, FSI, Mercury, s/n: 0106-0178-0295, Hot Process Tool: DHF, SP, Huang AB: 93888X FSI Mercury (PN: 4079933-001), s/n: 0106-0178-0295, Hot Process Tool: DHF, SP, Huang AB, 200mm 1 Inquire Burlington, Vermont, United States 236973 FSI   FSI   Mercury MP  Wafer Cleaners in Wafer Fabrication Equipment 93889X, FSI Mercury MP, s/n: 0106-0257-099, Hot Process Tool, DHF, SP, Huang AB: 93889X FSI Mercury MP, s/n: 0106-0257-099, Hot Process Tool, DHF, SP, Huang AB, 200mm 1 Inquire Burlington, Vermont, United States 237614 ABLEPRINT TECHNOLOGY   ABLEPRINT TECHNOLOGY   VTS-60A  Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items AblePrint Technology Co. VTS-60A, sn: HU-17-020, Pressure Curing Oven: AblePrint Technology Co. VTS-60A, sn: HU-17-020 Pressure Curing Oven used for de-voiding in materials  PCO01 1 Inquire N* East Fishkill, New York, United States 237616 AIR-VAC   AIR-VAC   DRS2  Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items Air-Vac Engineering, DRS25, sn: U3093, Repair tool for Surface Mount Technology: Air-Vac Engineering, DRS25, sn: U3093, Repair tool for Surface Mount Technology 1 Inquire N* East Fishkill, New York, United States 236594 Advanced Energy   Advanced Energy   APEX 3013 1513  Radio Frequency (RF) Generators in Chambers, Components, Accessories and Other Items AMAT - Advanced Energy Generators, Apex 3013, 1513, Paramount 1513: AMAT - Advanced Energy Generators, Apex 3013, 1513, Paramount 1513 Apex 3013 qty 7  Apex 1513 qty 7  Paramount 3013 qty 2  Paramount 1513 qty 2 2010 Vintage    1 Inquire East Fishkill, New York, United States 236881 Applied Materials   Applied Materials   CENTURA  Atmospheric Pressure CVD Tools in Chemical Vapor Deposition Equipment AMAT Centura Mainfraim and Enabler Chambers: ETX659 - AMAT Centura Enabler, s/n 414191 1 Inquire Dresden, Saxony, Germany 237620 AMAT   AMAT   PRODUCER SE  Chemical Vapor Deposition Equipment - Other in Chemical Vapor Deposition Equipment AMAT Producer SE, sn:409829, UVC, eHARP, Nitride: AMAT Producer SE, sn:409829, UVC, eHARP, Nitride 1 Inquire N* East Fishkill, New York, United States 232897 Applied Materials In   Applied Materials In   0040-62020  Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items AMAT, 300mm, CMP Retaining Rings: AMAT, 300mm, CMP Retaining Rings 1 Inquire Malta, New York, United States 219723 Applied Materials   Applied Materials   PECVD Producer GT BDII ---- 3ch - CHA-BCHD, CHB-BC  Chemical Vapor Deposition Equipment - Other in Chemical Vapor Deposition Equipment AMAT, PECVD Producer GT BDII ---- 3ch - CHA-BCHD, CHB-BCHD, C, 300mm, S/N 428039: AMAT, PECVD Producer GT BDII ---- 3ch - CHA-BCHD, CHB-BCHD, CHC-BCHD, 300mm, S/N 428039 Tool is missing Many Parts. Inspection highly advised, to confirm tool serial ID. 1 Inquire Malta, New York, United States 233427 Applied Materials   Applied Materials   Producer SE  Chemical Vapor Deposition Equipment - Other in Chemical Vapor Deposition Equipment AMAT, Producer SE, 300mm, S/N 422966: AMAT, Producer SE, 300mm, S/N 422966 Please see pdf for missing parts. 1 Inquire Malta, New York, United States 219673 Applied Materials   Applied Materials   Producer SE  Chemical Vapor Deposition Equipment - Other in Chemical Vapor Deposition Equipment AMAT, Producer SE, 300mm, S/N 425704: AMAT, Producer SE, 300mm, S/N 425704, Low-K Dielectric CVD Please check out missing parts in the pdf. Inspection strongly advised. 1 Inquire Malta, New York, United States 204911 Applied Materials   Applied Materials   Uvision 5  Optical Inspection - Other in Microscopes, Optical Inspection Applied Materials, Uvision5, Bright Field Inspection, 300mm: Applied Materials, Uvision5, Bright Field Inspection, 300mm In the fab, Idle       1 Inquire Malta, New York, United States 237610 AQUEOUS   AQUEOUS   Trident LDO  Clean Room Equipment in Chambers, Components, Accessories and Other Items Aqueous Technologies Trident LDO, sn: 9679, Solder Clean Tool: Aqueous Technologies Trident LDO, sn: 9679, Solder Clean Tool, CLEN2 1 Inquire N* East Fishkill, New York, United States 209252 ASML   ASML   XT: 1250B  Wafer Production Equipment - Other in Wafer Fabrication Equipment ASML, XT:1250B, 300mm, ArF : ASML, XT:1250B, 300mm, ArF    In the Fab.  Running wafers.  1 Inquire Dresden, Saxony, Germany 230320 ASML   ASML   XT1250B  Deep UV Wafer Stepper in Wafer Fabrication Equipment ASML, XT1250B, 300mm, S/N 7924: ASML, XT1250B, 300mm, S/N 7924 1 Inquire Dresden, Saxony, Germany 226062 ASML   ASML   XT1250D  Deep UV Wafer Stepper in Wafer Fabrication Equipment ASML, XT1250D, 300mm, S/N 7337: ASML, XT1250D, 300mm, S/N 7337 1 Inquire Singapore, Singapore 230289 ASML   ASML   XT1700FI  Deep UV Wafer Stepper in Wafer Fabrication Equipment ASML, XT1700FI, 300mm S/N 5633: ASML, XT1700FI, 300mm S/N 5633 1 Inquire East Fishkill, New York, United States 233544 Brooks   Brooks   7850  Materials Handling Equipment - Other in Wafer Fabrication Equipment BROOKS, PRI 7850, 200mm, Reticle stocker, S/N 059972355: BROOKS, PRI 7850, 200mm, Reticle stocker, S/N 059972355 1 Inquire Singapore, Singapore 235938 Bruker-AXS   Bruker-AXS   D8S - 2DB10  Scientific and Laboratory Equipment - Other in Metrology Equipment Bruker AXS, D8S - 2DB10, S/N 202653: Bruker AXS, D8S - 2DB10, S/N 202653 1 Inquire Dresden, Saxony, Germany 209828 Bruker, D8FABLINE, 300mm, X-Ray Metrology  Bruker, D8FABLINE, 300mm, X-Ray Metrology  Microscope Inspection Items - Other in Microscopes, Optical Inspection Bruker, D8FABLINE, 300mm, X-Ray Metrology: Bruker, D8FABLINE, 300mm, X-Ray Metrology   1 Inquire Malta, New York, United States 204314 Check Point Technolo   Check Point Technolo   InfraScanTDM 300 TDE  Scientific and Laboratory Equipment - Other in Metrology Equipment CheckPoint, InfraScanTDM 300 TDE, Laser Scanning Emisson: CheckPoint, InfraScanTDM  300 TDE, Laser Scanning Emisson  The system is comprised of the following: 1 InfraScan 300 TDE Laser Probing / Emission System Includes the following assemblies: * LSM 300 scanner with integrated emission camera port; * CCD camera for sample navigation with separate display; * 5-position motorized turret; * X, Y, Z motorized movement of LSM assembly; * PC with digitizer, Windows XP, Proscan 2000 Acquisition Software; * Moveable Operator Console, with  flat panel displays, Semi S8 compliant; * SLS-1000 1064 nm 300 mW * SLS-1000 1319 nm 350 mW * ASP-1000 3A Amplifier source package * Laser power adjustment, 0 to 100%, with incident power monitoring for all objectives; * Dark chamber with laser safety interlock, Class I (with service override), vibration isolation * User’s manual. Emission Camera Options InGaAs LN2 cooled 640 x 640 array 18 ?m pixels. LN2 Auto-fill system with two (2) 160 L Dewars InfraScan™ LTM 9Hz laser timing module. Includes the following: 9 GHz laser timing module Digital Oscilloscope 12.5 GHz Bandwidth Electronic Spectrum Analyzer APD and electronic amplifier High power/ high stability laser for timing stimulus Objective Options 5X NIR, Mitutoyo 378-822 20X IR Plan Apo, NA 0.5, Seiwa 50X IR Plan Apo, NA 0.6, Seiwa 100X NIR HR Mitutoyo 378-864-5 1X Macro Lens Specifications and Features: LSM 300/Optics- Optimized for high transmission at 1064nm and 1340nm. * T => 100mW at 1064nm 5X objective; T =>300mW at 1340nm 5X objective Image distortion <2%, 2X slow scan. Spot size 0.61?/NA of objective. * Scan rate 310 lines/sec to 2 sec/line. Field of view with 5X objective at 1X zoom: 3.2mm. Optical zoom range 1X to 8X (scanned field). * Image registration better than 2% for various wavelengths. * 5-position motorized turret, non-winding, Software settable crash protection limits for all objective lenses. Software controlled, par-centered and parfocal objectives. Built-in CCD camera for sample navigation with color monitor. External sync circuit. Computer and Inputs - PC with 3-channel digitizer input, one for LSM imaging and two for laser stimulation methods. Signal inputs are synchronized with LSM scan rate. Independent Gain and Offset control for input 1 and input 2. Scan rates adjustable from 310 lines/sec to 2048X slow to match response of DUT. 2-way communication with Knights CAD link. SLS 1000 RD – 300mW 1064 nm linearly polarized laser * Continuously adjustable Laser Power, from near 0% to full maximum. Real-time, incident laser power monitoring. Power limit feature to prevent overexposure of DUT. FC fiber optical coupler with 3 meter PM patchcord. ASP 1000 Amplifier-Source Package - Source Selections: Constant Current Programmable Range: 0.5nA – 1A; (3A optional) Minimum Program Step: .5nA Constant Voltage Programmable Range: 1uV – 10V (20V if protection diode removed) Minimum Program Step: 1uV Amplifier Selections: AC Voltage Amplifier Bias Current: .5nA - 1A; (3A optional) Maximum Input: 10V Input impedance: >4.7M Ohm Maximum Gain: 120 dB Detectability: 1 nV at full gain Bandwidth: 0.3 to 400K Hz High Pass Filter: .3, 50, 100, 200, 400, 800, 1.6K, 3.2K, 6.4K, 12.8K, 25K, 50K, 100K, 200K, 400K HZ, Low Pass Filter: 50, 100, 200, 400, 800, 1.6K, 3.2K, 6.4K, 12.8K, 25K, 50K, 100K, 200K, 400K HZ Output Offset Voltage: +/- 5V DC Current Amplifier (OBIC mode) Bias Voltage Range: 1uV - 10V Maximum Input: 20 mA Maximum Gain: 80 V/nA Detectability: 1 pA at full gain Bandwidth: DC to 400K Hz 1 Inquire Malta, New York, United States 237618 Crest Ultrasonics   Crest Ultrasonics   SS-1550A  Clean Room Equipment in Chambers, Components, Accessories and Other Items Crest Ultrasonics, SS-1550A, SN: 0815ST 290 0020, Stencil Clean: Crest Ultrasonics, SS-1550A, SN: 0815ST 290 0020, Stencil Clean 1 Inquire N* East Fishkill, New York, United States 236199 Despatch   Despatch   PWB-48X38X64-3E,   Reliability Test Equipment in Metrology Equipment DESPATCH, PWB-48X38X64-3E, Bake Out Oven Cabinet, S/N 183009: DESPATCH, PWB-48X38X64-3E, Bake Out Oven Cabinet, S/N 183009 1 Inquire Malta, New York, United States 236200 Despatch   Despatch   PWB-48X38X64-3E  Reliability Test Equipment in Metrology Equipment DESPATCH, PWB-48X38X64-3E, Bake Out Oven Cabinet, S/N 183010: DESPATCH, PWB-48X38X64-3E, Bake Out Oven Cabinet, S/N 183010 1 Inquire Malta, New York, United States 211632 Despatch   Despatch   PWB-48X38X64-3E  Clean Room Equipment in Chambers, Components, Accessories and Other Items DESPATCH, PWB-48X38X64-3E, Bake-out Cabinet Oven : DESPATCH, PWB-48X38X64-3E, Bake-out Cabinet Oven    Installed. Idle. 1 Inquire F* Malta, New York, United States 207722 Disco   Disco   DFG-82IF/8  Reliability Test Equipment in Metrology Equipment Disco, DFG-82IF/8, Backside Grind, 200mm : Disco, DFG-82IF/8, Backside Grind, 200mm   S/N : GG0220 1 Inquire Burlington, Vermont, United States 226695 ESI   ESI   9300  Reliability Test Equipment in Metrology Equipment ESI, 9300, 200mm, S/N 64057: ESI, 9300, 200mm, S/N 64057 1 Inquire Burlington, Vermont, United States 215848 Estion   Estion   E-RETICLE V 4M  Scientific and Laboratory Equipment - Other in Metrology Equipment Estion, E-RETICLE V 4M, Electrostatic Charge Measurement: Estion, E-RETICLE V 4M, Electrostatic Charge Measurement Reticle Electrostatic Charge Measurement System Installed, Idle. Vintage :  2010 1 Inquire Burlington, Vermont, United States 236338 Extraction Systems I   Extraction Systems I   PROFILE DUV  Materials Handling Equipment - Other in Wafer Fabrication Equipment Extraction Systems Inc, PROFILE DUV, 200mm: Extraction Systems Inc, PROFILE DUV, 200mm No serial number, DUV MAKE-UP AIR FILTER PROFILE 1250F 1 Inquire Singapore, Singapore 236975 DEK International Gm   DEK International Gm   Galaxy  Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items F10 PRINT, DEK Galaxy, s/n: 282942: F10 PRINT, DEK Galaxy, s/n: 282942 Solder Paste Screen Dispense Tool 1 Inquire East Fishkill, New York, United States 236974 Applied Materials   Applied Materials     Radio Frequency (RF) Generators in Chambers, Components, Accessories and Other Items F10 RF Generators: Multiple RF Generators (source and bias) from AMAT Centura platform w/ Minos and Carina chambers AMAT - Advanced Energy Generators   1 Inquire East Fishkill, New York, United States 219850 FEI   FEI   CLM3D  Scientific and Laboratory Equipment - Other in Metrology Equipment FEI, CLM3D, 300mm, S/N CLM000070, FIB: FEI, CLM3D, 300mm, S/N CLM000070, FIB 1 Inquire East Fishkill, New York, United States 203117 FEI   FEI   ExSolve 2 WTP EFEM  Microscopes - Other in Microscopes, Optical Inspection FEI, ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB: FEI,  ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB In the fab.  Warm shutdown.   1 Inquire Malta, New York, United States 230317 FEI   FEI   ExSolve CLM next Gen  Microscopes - Other in Microscopes, Optical Inspection FEI, ExSolve CLM next Gen, 300mm, S/N 9923535: FEI, ExSolve CLM next Gen, 300mm, S/N 9923535 1 Inquire Malta, New York, United States 230318 FEI   FEI   ExSolve CLM next Gen  Microscopes - Other in Microscopes, Optical Inspection FEI, ExSolve CLM next Gen, 300mm, S/N 9923609: FEI, ExSolve CLM next Gen, 300mm, S/N 9923609 1 Inquire Malta, New York, United States 233426 Genmark Automation   Genmark Automation   Porta300P  Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items Genmark, Porta300P, 2 loadports: Genmark, Porta300P, 2 loadports with some spare parts. See pdf for details. 1 Inquire Malta, New York, United States 237624 Hitachi   Hitachi   CG4100  Reliability Test Equipment in Metrology Equipment HITACHI CG4100, sn: 4138-01, 300mm: HITACHI CG4100, sn: 4138-01, 300mm 1 Inquire N* East Fishkill, New York, United States 204280 Hitachi   Hitachi   M-8190XT  Plasma Processing Equipment and Tools - Other in Wafer Fabrication Equipment Hitachi, M-8190XT, 300mm, Plasma Etch: Hitachi, M-8190XT, 300mm, Plasma Etch 3 Chambers In Fab, Warm Idle 1 Inquire Malta, New York, United States 204305 HMI, eP4 320, 300mm, ebeam Inspection  HMI, eP4 320, 300mm, ebeam Inspection  Microscope Inspection Items - Other in Microscopes, Optical Inspection HMI, eP4 320, 300mm, ebeam Inspection: HMI, eP4 320, 300mm, ebeam Inspection   In the Fab.  Cold Idle   1 Inquire Malta, New York, United States 202816 HSEB   HSEB   Axiospect 301  Wafer Inspection Microscopes in Microscopes, Optical Inspection HSEB, Axiospect 301, Optical Microscope, 300mm: HSEB, Axiospect 301, Optical Microscope, 300mm Cold.  Not working parts include:  Tango Controller (Microscope Stage controller Joystick and keyboard controller Micromotor for fingers edge gripper few powers supplies The tool was running with Windows XP professional 2002 service pack 3. 1 Inquire Malta, New York, United States 202817 HSEB   HSEB   Axiospect 301  Wafer Inspection Microscopes in Microscopes, Optical Inspection HSEB, Axiospect 301, Optical Microscope, 300mm: HSEB, Axiospect 301, Optical Microscope, 300mm 1 Inquire Malta, New York, United States 236442 Insidix   Insidix   TDM Compact 3  Reliability Test Equipment in Metrology Equipment Insidix, TDM Compact 3, Topography & Deformation Measurement tool: Insidix, TDM Compact 3, Topography & Deformation Measurement tool 2017 Vintage, Serial Number : 2017/15/1 1 Inquire East Fishkill, New York, United States 202818 Jordan Valley   Jordan Valley   JVX6200i  Xray Diffractometers in Metrology Equipment Jordan Valley, JVX6200i, 300mm, Film Thickness Measurement: Jordan Valley, JVX6200i, 300mm, Film Thickness Measurement       1 Inquire Malta, New York, United States 236360 Keithley   Keithley   S425  Reliability Test Equipment in Metrology Equipment KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2591: KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2591 1 Inquire Burlington, Vermont, United States 236359 Keithley   Keithley   S425  Reliability Test Equipment in Metrology Equipment KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2593: KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2593 1 Inquire Burlington, Vermont, United States 192419 Keithley Instruments   Keithley Instruments   S425  Reliability Test Equipment in Metrology Equipment Keithley, S425, Kerf Test, S/N QMO2572: Keithley, S425, Kerf Test, S/N QMO2572 Keithley standard matrix kerf tester 1 Inquire Burlington, Vermont, United States 192418 Keithley Instruments   Keithley Instruments   S425  Reliability Test Equipment in Metrology Equipment Keithley, S450, Kerf Parametric Tester, S/N: QMO2573: Keithley, S450, Kerf Parametric Tester, S/N: QMO2573 1 Inquire Burlington, Vermont, United States 236337 KLA-Tencor   KLA-Tencor   5200XP  Lithography Equipment in Metrology Equipment KLA, 5200XP, 200mm, S/N 2200: KLA, 5200XP, 200mm, S/N 2200 1 Inquire Singapore, Singapore 231156 KLA-Tencor   KLA-Tencor   Archer AIM+  Lithography Equipment in Metrology Equipment KLA, Archer AIM+, 300m , S/N 3531: KLA, Archer AIM+, 300m , S/N 3531 NOTE : AVAILABLE -  21-OCT-22 1 Inquire Singapore, Singapore 231163 KLA-Tencor   KLA-Tencor   Archer AIM+  Lithography Equipment in Metrology Equipment KLA, Archer AIM+, 300m , S/N 3616: KLA, Archer AIM+, 300m, S/N 3616   NOTE: AVAILABLE - 4-NOV-22 1 Inquire Singapore, Singapore 235676 KLA-Tencor   KLA-Tencor   EDR 5200  Scanning Electron Microscopes in Microscopes, Optical Inspection KLA, EDR 5200, 300mm, S/N 5040128: KLA, EDR 5200, 300mm, S/N 5040128 1 Inquire Singapore, Singapore 235677 KLA-Tencor   KLA-Tencor   EDR 5210  Scanning Electron Microscopes in Microscopes, Optical Inspection KLA, EDR 5210, 300mm, S/N 5040135: KLA, EDR 5200, 300mm, S/N 5040135 1 Inquire Singapore, Singapore 190993 Kokusai   Kokusai   Quixace Ultimate  Vertical LPCVD Furnaces in Chemical Vapor Deposition Equipment Kokusai Quixace Ultimate, 300mm, DJ-1236VN-DF: Kokusai Quixace Ultimate, 300mm, DJ-1236VN-DF Low Temp Steam Anneal - for SOD Cure S/N: T2DD6-18711       1 Inquire Malta, New York, United States 190750 Kokusai   Kokusai   DD-1223VN  Vertical LPCVD Furnaces in Chemical Vapor Deposition Equipment Kokusai Quixace, 300mm, DD-1223VN, ALD-TiN: Kokusai Quixace, 300mm, DD-1223VN ALD-TiN  S/N T2DC6-16441       1 Inquire Malta, New York, United States 208405 Kokusai   Kokusai   Quixace  Vertical LPCVD Furnaces in Chemical Vapor Deposition Equipment Kokusai, Quixace, 300mm, Anneal, Cobalt : Kokusai, Quixace, 300mm, Anneal, Cobalt  Crated.  In warehouse.  Data Sheet is incorrect:  Model is DD-1223VN-DF as shown in the Serial Number Tag photo. DOM : 2014 S/N : T2DD6-18973-1       1 Inquire F* Malta, New York, United States 219677 LAM Research Corp.   LAM Research Corp.   INOVA  Plasma Processing Equipment and Tools - Other in Wafer Fabrication Equipment LAM, INOVA, 300mm, S/N 007823-0389: LAM, INOVA, 300mm, S/N 007823-0389 1 Inquire Malta, New York, United States 219675 LAM Research Corp.   LAM Research Corp.   Vector Express  Chemical Vapor Deposition Equipment - Other in Chemical Vapor Deposition Equipment LAM, Vector Express, 300mm, S/N D22437A, Ashable Hard Mask CVD: LAM, Vector Express, 300mm, S/N D22437A, Ashable Hard Mask CVD 1 Inquire Malta, New York, United States 204933 Lasertech   Lasertech   BI 100  Wafer Production Equipment - Other in Wafer Fabrication Equipment LaserTech, BI100, Reticle backside inspection, : LaserTech, BI100, Reticle backside inspection,        1 Inquire Malta, New York, United States 236970 Advantest   Advantest   V93000  Reliability Test Equipment in Metrology Equipment LD96, Advantest, V93000, s/n PL000396, Logic and Memory Functional Tester: LD96 Advantest, V93000, s/n PL000396, Logic and Memory Functional Tester 1 Inquire East Fishkill, New York, United States 204285 Lyncee   Lyncee   Holographic Microscope  Microscopes - Other in Microscopes, Optical Inspection LYNCEE TEC, Holographic Microscope, : LYNCEE TEC, Holographic Microscope,    In Lab 1 Inquire F* Malta, New York, United States 236069 Nikon   Nikon   NSR-EX14C  Deep UV Wafer Stepper in Wafer Fabrication Equipment Nikon, NSR-EX14C, 200mm, S/N 7573077: Nikon, NSR-EX14C, 200mm, S/N 7573077   1 Inquire Singapore, Singapore 237202 Nikon   Nikon   S204B  Deep UV Wafer Stepper in Wafer Fabrication Equipment Nikon, NSR-S204B, 200mm, S/N 6030253: Nikon, NSR-S204B, 200mm, S/N 6030253 1 Inquire Singapore, Singapore 234539 Nikon   Nikon   S204B  Deep UV Wafer Stepper in Wafer Fabrication Equipment Nikon, S204B, 200mm, S/N 6030134: Nikon, S204B, 200mm, S/N 6030134 67X92V Lens Data: Distortion =  0.015 µm IU Flare = 1.80% Lens Flare = 9.0% Uniformity = 5.3% Power = 779 mW Total Focus Deviation = 0.202 µm  Astigmatism = 0.081 µm  Coma = 0.062 µm Iso DOF = N/A µm (>35nm of CD Range at Best Focus) 1 Inquire Burlington, Vermont, United States 220257 Nova   Nova   T600  Interferometers in Metrology Equipment NOVA, T600, 300mm, S/N 107242: NOVA, T600, 300mm, S/N 107242 1 Inquire East Fishkill, New York, United States 210035 Oryx   Oryx   EX11000S M65X  Automatic Test Equipment - Other in Automatic Test Equipment Oryx, EX11000S M65X, ESD Simulator , Final Test : Oryx, EX11000S M65X, ESD Simulator , Final Test    Idle.   1 Inquire Burlington, Vermont, United States 210036 Oryx   Oryx   EX11000S M65X  Automatic Test Equipment - Other in Automatic Test Equipment Oryx, EX11000S M65X, ESD Simulator , Final Test: Oryx, EX11000S M65X, ESD Simulator , Final Test   Idle 1 Inquire Burlington, Vermont, United States 237608 PACTECH   PACTECH   SB2-SM  Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items PacTech SB2-SM, SN: 14610116, C4 300MM, BGAAT: PacTech SB2-SM, SN: 14610116, C4 300MM, BGAAT 1 Inquire N* East Fishkill, New York, United States 217845 Phoenix   Phoenix   Micromex 160  Failure Analysis Test Instruments in Automatic Test Equipment Phoenix X-ray systems, Micromex 160, ANA01C0003-118507: Phoenix X-ray systems, Micromex 160, ANA01C0003-118507 Failure analysis 2-D Xray system   1 Inquire Burlington, Vermont, United States 237573 PSK   PSK   Tera 21  Plasma Processing Equipment and Tools - Other in Wafer Fabrication Equipment PSK, Tera 21, 300mm, S/N PTK07024: PSK, Tera 21, 300mm, S/N PTK07024 Platform only, no chms. Inspection is strongly advised. 1 Inquire N* Singapore, Singapore 237611 PVA   PVA   Delta 6  Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items PVA Delta 6, sn: W6789, Flux Spray Dispense Tool: PVA Delta 6, sn: W6789, Flux Spray Dispense Tool FSPR1 1 Inquire N* East Fishkill, New York, United States 236336 Rigaku   Rigaku   3640 WAFER ANALYZER  Scientific and Laboratory Equipment - Other in Metrology Equipment RIGAKU, 3640 WAFER ANALYZER, 200mm, S/N VR41002: RIGAKU, 3640 WAFER ANALYZER, 200mm, S/N VR41002 1 Inquire Singapore, Singapore 204935 Rorze   Rorze   RSR160  Wafer Production Equipment - Other in Wafer Fabrication Equipment Rorze, RSR160, Reticle Handler: Rorze, RSR160, Reticle Handler   1 Inquire Malta, New York, United States 215723 Semilab   Semilab   IR3100S  Interferometers in Metrology Equipment Semilab, IR3100S, micro spot spectroscopic ellipsometer, 300mm : Semilab, IR3100S, Micro-Spot spectraocopic ellipsometer, 300mm  Installed.  Operational. S/N: 4010 1 Inquire Dresden, Saxony, Germany 199985 SemiProbe   SemiProbe   PS4L FA-12  Reliability Test Equipment in Metrology Equipment SemiProbe, PS4L FA-12, Fully Automatic Prober with FOUP Capability, 300mm: SemiProbe, PS4L FA-12, Fully Automatic Prober with FOUP Capability, 300mm 1 Inquire Malta, New York, United States 237609 ShibuYa Co. Ltd.   ShibuYa Co. Ltd.   SBP696  Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items Shibuya SBP696, sn: CAW9006, Vacuum Ball Grid Array Screening: Shibuya SBP696, sn: CAW9006, Vacuum Ball Grid Array Screening 1 Inquire N* East Fishkill, New York, United States 237619 Speedline Tech   Speedline Tech   8300-1  Clean Room Equipment in Chambers, Components, Accessories and Other Items Speedline Technologies, 8300-1, sn: 8300-20651, Underfill Camalot Prodigy Tool: Speedline Technologies, 8300-1, sn: 8300-20651, Underfill Camalot Prodigy Tool 1 Inquire N* East Fishkill, New York, United States 237574 TAE YANG TECH   TAE YANG TECH   WET BENCH  Clean Room Equipment in Chambers, Components, Accessories and Other Items TAE YANG TECH, WET BENCH, 200mm, parts cleaning sink: TAE YANG TECH, WET BENCH, 200mm, parts cleaning sink 1 Inquire N* Singapore, Singapore 236332 Tel   Tel   ACT8  Manual Photoresist Coaters in Wafer Fabrication Equipment TEL, ACT8, 200mm, S/N 9201480: TEL, ACT8, 200mm, S/N 9201480 1 Inquire Singapore, Singapore 236788 Tel   Tel   ALPHA-303i  Vertical LPCVD Furnaces in Chemical Vapor Deposition Equipment TEL, ALPHA-303i, 300mm, S/N L00000545156: TEL, ALPHA-303i, 300mm, S/N L00000545156 1 Inquire Singapore, Singapore 236786 Tel   Tel   ALPHA-303i-K  Vertical LPCVD Furnaces in Chemical Vapor Deposition Equipment TEL, ALPHA-303i-K, 300mm, S/N L00000735070: TEL, ALPHA-303i-K, 300mm, S/N L00000735070 1 Inquire Singapore, Singapore 236787 Tel   Tel   ALPHA-303i-K  Vertical LPCVD Furnaces in Chemical Vapor Deposition Equipment TEL, ALPHA-303i-K, 300mm, S/N L00000735071: TEL, ALPHA-303i-K, 300mm, S/N L00000735071 1 Inquire Singapore, Singapore 236335 Tel   Tel   ALPHA-8S-Z  Vertical LPCVD Furnaces in Chemical Vapor Deposition Equipment TEL, ALPHA-8S-Z, 200mm, S/N A00000165043: TEL, ALPHA-8S-Z, 200mm, S/N A00000165043 1 Inquire Singapore, Singapore 236334 Tel   Tel   ALPHA-8S-Z  Vertical LPCVD Furnaces in Chemical Vapor Deposition Equipment TEL, ALPHA-8S-Z, 200mm, S/N A000099X5141: TEL, ALPHA-8S-Z, 200mm, S/N A000099X5141 1 Inquire Singapore, Singapore 226733 Tel   Tel   CR385PH  Automatic Test Equipment - Other in Automatic Test Equipment TEL, CR385PH, S/N 067004: TEL, CR385PH, S/N 067004 1 Inquire Burlington, Vermont, United States 230304 Tokyo Electron Ltd   Tokyo Electron Ltd   Lithius Pro  Manual Photoresist Coaters in Wafer Fabrication Equipment TEL, Lithius Pro, 300mm, S/N N110495: TEL, Lithius Pro, 300mm, S/N N110495 1 Inquire Dresden, Saxony, Germany 226738 Tel   Tel   LTI unit  Automatic Test Equipment - Other in Automatic Test Equipment TEL, LTI unit, S/N 12007: TEL, LTI unit, S/N 12007 1 Inquire Burlington, Vermont, United States 226737 Tel   Tel   LTI chuck precio nano  Automatic Test Equipment - Other in Automatic Test Equipment TEL, LTI unit, S/N Y661266: TEL, LTI unit, S/N Y661266 1 Inquire Burlington, Vermont, United States 204309 Tel   Tel   Tactrus NCCP  Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items TEL, Tactrus NCCP, 300mm, Etch: TEL, Tactrus NCCP, 300mm, Etch   Connected in fab with 2 chms.     1 Inquire Malta, New York, United States 235341 Tel   Tel   Unity M SCCM  Plasma Processing Equipment and Tools - Other in Wafer Fabrication Equipment TEL, Unity M SCCM, 200 mm, S/N UM0075: TEL, Unity M SCCM, 200 mm, S/N UM0075 1 Inquire Burlington, Vermont, United States 236291 Tel   Tel   Unity M SCCM  Plasma Processing Equipment and Tools - Other in Wafer Fabrication Equipment TEL, Unity M SCCM, SN UM0033, 200mm, Etch: TEL, Unity SCCM, SN UM0033, 200mm, Etch 1985 Vintage  1 Inquire Burlington, Vermont, United States 235937 Thermo Fisher   Thermo Fisher   THETA300  Scientific and Laboratory Equipment - Other in Metrology Equipment THERMO FISHER, THETA300 MKII, s/n A1188: THERMO FISHER, THETA300 MKII, s/n A1188 1 Inquire Dresden, Saxony, Germany 233408 Various turbo pumps, Adixen and Agilent  Various turbo pumps, Adixen and Agilent  Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items Various turbo pumps, Adixen and Agilent: 6 turbo pumps, Adixen and Agilent. Please see pdf for more details. 1 Inquire East Fishkill, New York, United States 237615 Veeco   Veeco   M3400ML  Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items Veeco M3400ML, sn: 42553, Solvent Release Tool, RELSE: Veeco M3400ML, sn: 42553, Solvent Release Tool 1 Inquire N* East Fishkill, New York, United States

*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.