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Scanning Electron Microscopes


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Item IDPhotoItem DescriptionResolution ÅMagnificationGun TypeVacuum SystemPower Requirements#PriceNotes Location
MakeModelVoltageAmps
(Å)(kX)(V)(A)$
195983 Applied Materials Elite MS MC 1 Inquire Dresden, Saxony, Germany
192342 Applied Materials SEMVision G3 1 Inquire Taichung, Taichung City, Taiwan
199704 FEI EXPIDA 1 Inquire F* Dresden, Saxony, Germany
178294 Hitachi AS5000 1 Inquire F* Singapore, Singapore
178296 Hitachi Microanalysis System 1 Inquire F* Taichung, Taichung City, Taiwan
203281 Hitachi S-5200 1 Inquire East Fishkill, New York, United States
205916 Hitachi S-5200 1 Inquire East Fishkill, New York, United States
178299 Hitachi Z-5700 1 Inquire F* Taichung, Taichung City, Taiwan
178300 JEOL 7555 1 Inquire Taichung, Taichung City, Taiwan
203119 JEOL ARM200CF Super X 1 Inquire Malta, New York, United States
178302 JEOL JEM-2500SE 1 Inquire Taichung, Taichung City, Taiwan
178303 JEOL JEM-2500SE 1 Inquire Taichung, Taichung City, Taiwan
207371 JEOL JSM-7400F 1 Inquire Burlington, Vermont, United States
187765 JEOL JWS 7555S 1 Inquire F* Singapore, Singapore
189689 JEOL JWS-7515 1 Inquire F* Singapore, Singapore
178304 KLA-Tencor ES31 1 Inquire F* Singapore, Singapore
178305 KLA-Tencor ES32 1 Inquire Taichung, Taichung City, Taiwan
202838 Zeiss LEA 1530 1 Inquire Singapore, Singapore
202852 Zeiss Ultra 55 1 Inquire Singapore, Singapore

NOTE:
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   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.