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ALL CATEGORIES   Metrology Equipment   Microscopes, Optical Inspection    View    Search-by-Specs   
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Scanning Electron Microscopes

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Item IDPhotoItem DescriptionResolution ÅMagnificationGun TypeVacuum SystemPower Requirements#PriceNotes Location
178294 Hitachi AS5000 1 Inquire F* Singapore, Singapore
178300 JEOL 7555 1 Inquire Singapore, Singapore
203119 JEOL ARM200CF Super X 1 Inquire Malta, New York, United States
187765 JEOL JWS 7555S 1 Inquire Singapore, Singapore
189689 JEOL JWS-7515 1 Inquire Singapore, Singapore
178304 KLA-Tencor ES31 1 Inquire Singapore, Singapore
202838 Zeiss LEA 1530 1 Inquire Singapore, Singapore

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  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.