Laboratory Equipment

  1. Cameca IMS 6F, s/n: 643

    Other Scientific and Laboratory Equipment

    Cameca IMS 6F, s/n: 643

    Secondary Ion Mass Spectrometer

    Tool ID: MAL9250

  2. Hitachi S-9220, 200mm, s/n: 9749-10

    Scanning Electron Microscopes

    Hitachi S-9220, 200mm, s/n: 9749-10

    CD Measurement

    Tool ID: FSEM-X01

  3. HSEB, Axiospect 301, Optical Microscope, 300mm

    Wafer Inspection Microscopes

    HSEB, Axiospect 301, Optical Microscope, 300mm

    Cold.  Not working parts include: 

    • Tango Controller (Microscope Stage controller
    • Joystick and keyboard controller
    • Micromotor for fingers edge gripper
    • few powers supplies

      The tool was running with Windows XP professional 2002 service pack 3.

      Tool ID: OPI2800

  4. BRUKER D8 Fabline, 300mm, s/n: 208564

    Xray Diffractometers

    BRUKER D8 Fabline, 300mm, s/n: 208564

    XRAY DEFRACTION

    Tool ID: XRD4400

  5. KLA-Tencor AIT II, 200mm, s/n: 9262

    Wafer Inspection Microscopes

    KLA-Tencor AIT II, 200mm, s/n: 9262

    AIT II w/ ADC. Defect Inspection Tool

    Tool ID: V13V

  6. CAMECA LEAP 4000x Si, s/n: 5059

    Other Scientific and Laboratory Equipment

    CAMECA LEAP 4000x Si, s/n: 5059

    Cameca LEAP 4000x Si Atom Probe Tomography

    Tool ID: MAL2270

  7. BRUKER D8 Fabline, 300mm, s/n: 205934

    Xray Diffractometers

    BRUKER D8 Fabline, 300mm, s/n: 205934

    Bruker D8 Fabline X-Ray Diffractometer

    Tool ID: MAL2210

  8. KLA AITXUV, 300mm, s/n: UV1158

    Scanning Electron Microscopes

    KLA AITXUV, 300mm, s/n: UV1158

    Wafer scanning

    Tool ID: YDFI732

  9. SOLVISION, PRECIS 3D, s/n: C1W010150609

    Other Optical Inspection

    SOLVISION, PRECIS 3D, s/n: C1W010150609

    Wafer Inspection Tool

    Tool ID: INS906

  10. KLA SpectraShape 9010, 300mm, s/n: 7271469

    Other Optical Inspection

    KLA SpectraShape 9010, 300mm, s/n: 7271469

    Optical Critical Dimensions

    Tool ID: OCD2950

  11. JEOL JEM ARM-200CF, s/n: EM1710001350-135

    Other Optical Inspection

    JEOL JEM ARM-200CF, s/n: EM1710001350-135

    Transmission Electron Microscope

    Tool ID: MAL2105

  12. Zeiss Orion NanoFab, s/n: 6015

    Scanning Electron Microscopes

    Zeiss Orion NanoFab, s/n: 6015

    Focus Ion Beam Mill

    Tool ID: PKG9120

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