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Critical Dimension Scanning Electron Microscopes


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Item IDPhotoItem DescriptionSize RangeResolution ÅCD Measure RangeCass to CassTilt Stage#PriceNotes Location
MakeModelSet SizeMinMax
(Å)(µm)(µm)$
207937 Advantest E3630 1 Inquire Burlington, Vermont, United States
210024 Applied Materials NanoSEM 3D 1 Inquire Burlington, Vermont, United States
180474 Applied Materials NanoSEM 3D300 mm 1 Inquire F* East Fishkill, New York, United States
180514 Applied Materials NanoSEM 3D300 mm 1 Inquire F* East Fishkill, New York, United States

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  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.