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Item ID  Photo Short Description Product Type / Details # Price Notes Location Make Model   $   238042 Advantest   Advantest   93000  Reliability Test Equipment in Metrology Equipment ADVANTEST 93000, sn: DE04601132, Logic and Memory functional tester: ADVANTEST 93000, sn: DE04601132, Logic and Memory functional tester 1 Inquire East Fishkill, New York, United States 238044 Advantest   Advantest   93000  Reliability Test Equipment in Metrology Equipment ADVANTEST 93000, sn: DE04601138, Logic and memory functional test: ADVANTEST 93000, sn: DE04601138, Logic and memory functional test 1 Inquire East Fishkill, New York, United States 244640 Advantest   Advantest   93000  Reliability Test Equipment in Metrology Equipment ADVANTEST 93000, sn: DE04601388, Logic and memory functional test: ADVANTEST 93000, sn: DE04601388, Logic and memory functional test 1 Inquire East Fishkill, New York, United States 238045 Advantest   Advantest   93000  Reliability Test Equipment in Metrology Equipment ADVANTEST 93000, sn: MY04600193, Logic and memory functional test: ADVANTEST 93000, sn: MY04600193, Logic and memory functional test 1 Inquire East Fishkill, New York, United States 238046 Advantest   Advantest   93000  Reliability Test Equipment in Metrology Equipment ADVANTEST 93000, sn: MY04600539, Logic and memory functional test: ADVANTEST 93000, sn: MY04600539, Logic and memory functional test 1 Inquire East Fishkill, New York, United States 232897 Applied Materials In   Applied Materials In   0040-62020  Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items AMAT, 300mm, CMP Retaining Rings: AMAT, 300mm, CMP Retaining Rings 1 Inquire Malta, New York, United States 245216 Applied Materials   Applied Materials   Endura 5500  Plasma Processing Equipment and Tools - Other in Wafer Fabrication Equipment AMAT, Endura 5500, 200mm, S/N 317558: AMAT, Endura 5500, 200mm, S/N 317558 1 Inquire N* Singapore, Singapore 204911 Applied Materials   Applied Materials   Uvision 5  Optical Inspection - Other in Microscopes, Optical Inspection Applied Materials, Uvision5, Bright Field Inspection, 300mm: Applied Materials, Uvision5, Bright Field Inspection, 300mm In the fab, Idle       1 Inquire Malta, New York, United States 239851 ASML   ASML   Yieldstar S-200B  Lithography Equipment in Metrology Equipment ASML, Yieldstar S-200B, s/n: 9745, 300mm: ASML, Yieldstar S-200B, s/n: 9745, 300mm 1 Inquire Dresden, Saxony, Germany 243573 Axcelis Technologies   Axcelis Technologies   Optima MD  Ion Implanters in Wafer Fabrication Equipment Axcelis, Optima MD, 300mm, s/n: 083012, IMP202: Axcelis, Optima MD, 300mm, s/n: 083012 Medium Current Implant 1 Inquire Dresden, Saxony, Germany 241154 Bruker   Bruker   D8 Fabline  Xray Diffractometers in Metrology Equipment BRUKER, D8 Fabline, 300 mm, BRUKER D8 FABLINE XRAY DEFRACTION: BRUKER, D8 Fabline, 300 mm BRUKER D8 FABLINE XRAY DEFRACTION 1 Inquire Dresden, Saxony, Germany 209828 Bruker, D8FABLINE, 300mm, X-Ray Metrology  Bruker, D8FABLINE, 300mm, X-Ray Metrology  Microscope Inspection Items - Other in Microscopes, Optical Inspection Bruker, D8FABLINE, 300mm, X-Ray Metrology: Bruker, D8FABLINE, 300mm, X-Ray Metrology   1 Inquire Malta, New York, United States 242618 CFM Technologies   CFM Technologies   FullFlow 1/99 8100  Wafer Cleaners in Wafer Fabrication Equipment CFM, FullFlow 1/99 8100, s/n: Cont 1 1188, 200mm, Tool ID: 67R88V: CFM, FullFlow 1/99 8100, s/n: Cont 1 1188, 200mm, Tool ID: 67R88V 1 Inquire Burlington, Vermont, United States 242203 CFM Technologies   CFM Technologies   HP 8050  Wafer Cleaners in Wafer Fabrication Equipment CFM, HP 8050, s/n: 5046, 200mm, Tool ID: 93557X: CFM, CFM HP 8050, s/n: 5046, 200mm, Tool ID: 93557X 1 Inquire Burlington, Vermont, United States 242486 Chiron Technology   Chiron Technology   F21657  Reliability Test Equipment in Metrology Equipment Chiron Technology, F21657, multiple units available.: Chiron Technology, F21657, multiple units available. Please enquire for more details. Serial number plate not available. Faulty and parts are in unknown conditions. 1 Inquire Singapore, Singapore 239700 Dainippon Screen   Dainippon Screen   SU3100  Wet Process Equipment - Other in Wafer Fabrication Equipment DAINIPPON SCREEN, SU3100, s/n: 530L00402A, 300mm: DAINIPPON SCREEN, SU3100, s/n: 530L00402A, 300mm 1 Inquire Malta, New York, United States 240475 ECEC   ECEC   Micron2  Scientific and Laboratory Equipment - Other in Metrology Equipment ECEC, Micron2, s/n:15-308, Assembly, Die Attach: ECEC, Micron2, s/n:15-308, Assembly, Die Attach 1 Inquire Dresden, Saxony, Germany 242920 Electroglas   Electroglas   2001X  Parametric Wafer Testers in Test, Analysis and Measurement Equipment Electroglas, 2001X, s/n: 96040033. Tool ID: 514164B: Electroglas, 2001X, s/n: 96040033. Tool ID: 514164B ELECTROGLAS 2001X Wafer Prober 1 Inquire Santa Clara, California, United States 242919 Electroglas   Electroglas   2001X  Parametric Wafer Testers in Test, Analysis and Measurement Equipment Electroglas, 2001X, s/n: P84020452/110152. Tool ID: 79X6817AG: Electroglas, 2001X, s/n: P84020452/110152. Tool ID: 79X6817AG ELECTROGLAS 2001X Wafer Prober 1 Inquire Burlington, Vermont, United States 242917 Electroglas   Electroglas   2001X  Parametric Wafer Testers in Test, Analysis and Measurement Equipment Electroglas, 2001X, s/n: Unknown. Tool ID: 4785151CZ: Electroglas, 2001X, s/n: Unknown. Tool ID: 4785151CZ ELECTROGLAS 2001X Wafer Prober 1 Inquire Burlington, Vermont, United States 242916 Electroglas   Electroglas   2001X  Parametric Wafer Testers in Test, Analysis and Measurement Equipment Electroglas, 2001X, s/n: WMP91030194/141911, ELECTROGLAS 2001X Wafer Prober: Electroglas, 2001X, s/n: WMP91030194/141911 ELECTROGLAS 2001X Wafer Prober 1 Inquire Burlington, Vermont, United States 242918 Electroglas   Electroglas   2001X  Parametric Wafer Testers in Test, Analysis and Measurement Equipment Electroglas, 2001X, s/n: WMP91110219/145449. Tool ID: 79X6817BX: Electroglas, 2001X, s/n: WMP91110219/145449. Tool ID: 79X6817BX ELECTROGLAS 2001X Wafer Prober 1 Inquire Burlington, Vermont, United States 239383 ENTEGRIS   ENTEGRIS   N/A  Materials Handling Equipment - Other in Wafer Fabrication Equipment Entegris, FOUP N2 Purge Station, 300mm: Entegris, FOUP N2 Purge Station, 300mm 1 Inquire Dresden, Saxony, Germany 219850 FEI   FEI   CLM3D  Scientific and Laboratory Equipment - Other in Metrology Equipment FEI, CLM3D, 300mm, S/N CLM000070, FIB: FEI, CLM3D, 300mm, S/N CLM000070, FIB 1 Inquire East Fishkill, New York, United States 230317 FEI   FEI   ExSolve CLM next Gen  Microscopes - Other in Microscopes, Optical Inspection FEI, ExSolve CLM next Gen, 300mm, S/N 9923535: FEI, ExSolve CLM next Gen, 300mm, S/N 9923535 1 Inquire Malta, New York, United States 230318 FEI   FEI   ExSolve CLM next Gen  Microscopes - Other in Microscopes, Optical Inspection FEI, ExSolve CLM next Gen, 300mm, S/N 9923609: FEI, ExSolve CLM next Gen, 300mm, S/N 9923609 1 Inquire Malta, New York, United States 244283 FEI   FEI   Helios NanoLab 1200HP  Plasma Processing Equipment and Tools - Other in Wafer Fabrication Equipment FEI, Helios NanoLab 1200HP, sn: 9921505, Failure Analysis: FEI, Helios NanoLab 1200HP, sn: 9921505, Failure Analysis 1 Inquire Malta, New York, United States 244286 FEI   FEI   Titan cubed G2 60-300  Scanning Electron Microscopes in Microscopes, Optical Inspection FEI, Titan cubed G2 60-300, sn: 9920142/D3205, Electron Microscope: FEI, Titan cubed G2 60-300, sn: 9920142/D3205, Electron Microscope 1 Inquire Malta, New York, United States 242487 Formfactor   Formfactor     Reliability Test Equipment in Metrology Equipment Formfactor, 300mm AETRIUM WLR Tester: Formfactor, 300mm AETRIUM WLR Tester. Serial ID plate not available. Faulty unit. Inspection is strongly advised. 1 Inquire Singapore, Singapore 233426 Genmark Automation   Genmark Automation   Porta300P  Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items Genmark, Porta300P, 2 loadports: Genmark, Porta300P, 2 loadports with some spare parts. See pdf for details. 1 Inquire Malta, New York, United States 202834 Kokusai   Kokusai   DJ-1236VN-DF  Vertical LPCVD Furnaces in Chemical Vapor Deposition Equipment HITACHI KOKUSAI, DJ-1236VN-DF, 300mm: HITACHI KOKUSAI, DJ-1236VN-DF, 300mm 1 Inquire Malta, New York, United States 243313 Hitachi Kokusai Elec   Hitachi Kokusai Elec   DJ-1236VN-DF  Vertical LPCVD Furnaces in Chemical Vapor Deposition Equipment HITACHI KOKUSAI, DJ-1236VN-DF, 300mm, s/n: DN23300, FVX2488: HITACHI KOKUSAI, DJ-1236VN-DF, 300mm, FVX2488 Vertical LPCVD Furnace 1 Inquire Malta, New York, United States 204280 Hitachi   Hitachi   M-8190XT  Plasma Processing Equipment and Tools - Other in Wafer Fabrication Equipment Hitachi, M-8190XT, 300mm, Plasma Etch: Hitachi, M-8190XT, 300mm, Plasma Etch 3 Chambers In Fab, Warm Idle 1 Inquire Malta, New York, United States 245217 Hitachi   Hitachi   S8840  Critical Dimension Scanning Electron Microscopes in Microscopes, Optical Inspection Hitachi, S8840, 200mm, S/N 9110-02: Hitachi, S8840, 200mm, S/N 9110-02 1 Inquire N* Singapore, Singapore 237745 HMI   HMI   eScan 500  Scanning Electron Microscopes in Microscopes, Optical Inspection HMI eScan 500, sn: ML07114, Defect Review, 300mm: HMI eScan 500, sn: ML07114, Defect Review, 300mm 1 Inquire Malta, New York, United States 239702 HMI   HMI   eScan 500  Scanning Electron Microscopes in Microscopes, Optical Inspection HMI eScan 500, sn: NE07130, 300mm: HMI eScan 500, sn: NE07130, 300mm 1 Inquire Malta, New York, United States 202816 HSEB   HSEB   Axiospect 301  Wafer Inspection Microscopes in Microscopes, Optical Inspection HSEB, Axiospect 301, Optical Microscope, 300mm: HSEB, Axiospect 301, Optical Microscope, 300mm Cold.  Not working parts include:  Tango Controller (Microscope Stage controller Joystick and keyboard controller Micromotor for fingers edge gripper few powers supplies The tool was running with Windows XP professional 2002 service pack 3. 1 Inquire Malta, New York, United States 202817 HSEB   HSEB   Axiospect 301  Wafer Inspection Microscopes in Microscopes, Optical Inspection HSEB, Axiospect 301, Optical Microscope, 300mm: HSEB, Axiospect 301, Optical Microscope, 300mm 1 Inquire Malta, New York, United States 240478 Instron   Instron   5564  Scientific and Laboratory Equipment - Other in Metrology Equipment INSTRON, 5564, s/n: 5564J2710, Pull Tester: INSTRON, 5564, s/n: 5564J2710, Pull Tester 1 Inquire Dresden, Saxony, Germany 245218 Keithley   Keithley   QUANTOX 64000  Xray Diffractometers in Metrology Equipment Keithley, QUANTOX 64000, 200mm, S/N Q7042: Keithley, QUANTOX 64000, 200mm, S/N Q7042 1 Inquire N* Singapore, Singapore 236360 Keithley   Keithley   S425  Reliability Test Equipment in Metrology Equipment KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2591: KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2591 1 Inquire Burlington, Vermont, United States 236359 Keithley   Keithley   S425  Reliability Test Equipment in Metrology Equipment KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2593: KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2593 1 Inquire Burlington, Vermont, United States 192419 Keithley Instruments   Keithley Instruments   S425  Reliability Test Equipment in Metrology Equipment Keithley, S425, Kerf Test, S/N QMO2572: Keithley, S425, Kerf Test, S/N QMO2572 Keithley standard matrix kerf tester 1 Inquire Burlington, Vermont, United States 192418 Keithley Instruments   Keithley Instruments   S425  Reliability Test Equipment in Metrology Equipment Keithley, S450, Kerf Parametric Tester, S/N: QMO2573: Keithley, S450, Kerf Parametric Tester, S/N: QMO2573 1 Inquire Burlington, Vermont, United States 238974 Keithley   Keithley   S475  Reliability Test Equipment in Metrology Equipment KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2593: KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2593 1 Inquire Burlington, Vermont, United States 238977 Keithley   Keithley   S475  Reliability Test Equipment in Metrology Equipment KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2733: KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2733 1 Inquire Burlington, Vermont, United States 238976 Keithley   Keithley   S475  Reliability Test Equipment in Metrology Equipment KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2734: KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2734 1 Inquire Burlington, Vermont, United States 238975 Keithley   Keithley   S475  Reliability Test Equipment in Metrology Equipment KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2738: KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2738 1 Inquire Burlington, Vermont, United States 238973 Keithley   Keithley   S475  Reliability Test Equipment in Metrology Equipment KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2792: KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2792 1 Inquire Burlington, Vermont, United States 238978 Keithley   Keithley   S600  Reliability Test Equipment in Metrology Equipment KEITHLEY, S600, 25 pin kerf tester, s/n: QMO4104: KEITHLEY, S600, 25 pin kerf tester, s/n: QMO4104 1 Inquire Burlington, Vermont, United States 242614 Keithley   Keithley   S630  Reliability Test Equipment in Metrology Equipment KEITHLEY, S630, 200mm, Parametric Test System, s/n: QMO4105: KEITHLEY, S630, Parametric Test System, s/n: QMO4105 1 Inquire Burlington, Vermont, United States 237748 KLA-Tencor   KLA-Tencor   AMI2900  Wafer Inspection Microscopes in Microscopes, Optical Inspection KLA AMI2900, sn: V000283, 300mm: KLA AMI2900, sn: V000283, 300mm KLA Advanced Macro Inspection Module   1 Inquire Malta, New York, United States 237747 KLA-Tencor   KLA-Tencor   eDR 7100  Scanning Electron Microscopes in Microscopes, Optical Inspection KLA eDR 7100, sn: 0147052-000, 300mm: KLA eDR 7100, sn: 0147052-000, 300mm KLA eDR 7100 Defect Review Vacuum tool 1 Inquire Malta, New York, United States 245219 KLA-Tencor   KLA-Tencor   KLA5200  Lithography Equipment in Metrology Equipment KLA Tencor, KLA5200, 200mm, S/N 2247: KLA Tencor, KLA5200, 200mm, S/N 2247 1 Inquire N* Singapore, Singapore 245167 LAM Research Corp.   LAM Research Corp.   C3  Chemical Vapor Deposition Equipment - Other in Chemical Vapor Deposition Equipment LAM C3, Dual SPEED/Sequel, s/n:02-2-C30111, 300mm, JO01:  LAM C3, Dual SPEED/Sequel, s/n:02-2-C30111, 300mm, JO01 300mm WTS with 2 HDP nitride SPEED chambers and 300mm Sequel chamber 1 Inquire N* East Fishkill, New York, United States 243279 LAM   LAM   2300 KIYO FX  Single Chamber RTP Tools in Wafer Fabrication Equipment LAM, 2300 KIYO FX, 300mm, ETX2300U6: ETX2300U2-T LAM-E5 KIYO FX HYDRA ARIA CORVUS-UPGRADE TO REPURPOSE ETX LAM, 2300 KIYO FX, 300mm, ETX2300U6 SN: KFXE-482(F1514910) - PM2 KFXE-482(F1514910) - PM3 KFXE-482(F1514910) - PM4 1 Inquire F* Malta, New York, United States 219677 LAM Research Corp.   LAM Research Corp.   INOVA  Plasma Processing Equipment and Tools - Other in Wafer Fabrication Equipment LAM, INOVA, 300mm, S/N 007823-0389: LAM, INOVA, 300mm, S/N 007823-0389 1 Inquire Malta, New York, United States 219675 LAM Research Corp.   LAM Research Corp.   Vector Express  Chemical Vapor Deposition Equipment - Other in Chemical Vapor Deposition Equipment LAM, Vector Express, 300mm, S/N D22437A, Ashable Hard Mask CVD: LAM, Vector Express, 300mm, S/N D22437A, Ashable Hard Mask CVD 1 Inquire Malta, New York, United States 236970 Advantest   Advantest   V93000  Reliability Test Equipment in Metrology Equipment LD96, Advantest, V93000, s/n PL000396, Logic and Memory Functional Tester: LD96 Advantest, V93000, s/n PL000396, Logic and Memory Functional Tester 1 Inquire East Fishkill, New York, United States 241155 Lintec   Lintec   RAD-2500M/8  Scientific and Laboratory Equipment - Other in Metrology Equipment Lintec Corp. RAD-2500M/8, 200mm, s/n: D1S-2575-AW: Lintec Corp. RAD-2500M/8, 200mm, s/n: D1S-2575-AW 1 Inquire Dresden, Saxony, Germany 241157 Mattison   Mattison   MILLIOS HVM  Plasma Processing Equipment and Tools - Other in Wafer Fabrication Equipment Mattson, MILLIOS HVM, 300mm, s/n: 11043001, 09130001, 09250001: Mattson, MILLIOS HVM, 300mm, s/n: 11043001, 09130001, 09250001 1 Inquire Malta, New York, United States 242617 Mosaid   Mosaid   M420501  Reliability Test Equipment in Metrology Equipment MOSAID, M420501, 200mm, s/n: 3654, Tool ID: KTH91M: MOSAID, M420501, 200mm, s/n: 3654, Tool ID: KTH91M MOSAID Memory Test System 1 Inquire Burlington, Vermont, United States 242616 Mosaid   Mosaid   M420501  Reliability Test Equipment in Metrology Equipment MOSAID, M420501, 200mm, s/n: 3674, Tool ID: KTH90M: MOSAID, M420501, 200mm, s/n: 3674, Tool ID: KTH90M MOSAID Memory Test System 1 Inquire Burlington, Vermont, United States 241510 NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm  NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm  Microscope Inspection Items - Other in Microscopes, Optical Inspection NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm: NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm 1 Inquire Malta, New York, United States 245214 Nikon   Nikon   NSR-S208D  Deep UV Wafer Stepper in Wafer Fabrication Equipment Nikon, NSR-S208D, 300mm, S/N 8732041: Nikon, NSR-S208D, 300mm, S/N 8732041 1 Inquire N* Singapore, Singapore 220257 Nova   Nova   T600  Interferometers in Metrology Equipment NOVA, T600, 300mm, S/N 107242: NOVA, T600, 300mm, S/N 107242 1 Inquire East Fishkill, New York, United States 239647 Novellus Systems   Novellus Systems   INOVA NEXT  Plasma Processing Equipment and Tools - Other in Wafer Fabrication Equipment NOVELLUS, INOVA NEXT, s/n M23321A, 300mm: NOVELLUS, INOVA NEXT, s/n M23321A, 300mm 1 Inquire Malta, New York, United States 244285 Oxford Instruments   Oxford Instruments   OPAL  Plasma Processing Equipment and Tools - Other in Wafer Fabrication Equipment OXFORD INSTRUMENTS, OPAL, sn: 94-220255, RF/Plasma oxide deposition tool: OXFORD INSTRUMENTS, OPAL, sn: 94-220255, RF/Plasma oxide deposition tool 1 Inquire Malta, New York, United States 204935 Rorze   Rorze   RSR160  Wafer Production Equipment - Other in Wafer Fabrication Equipment Rorze, RSR160, Reticle Handler: Rorze, RSR160, Reticle Handler   1 Inquire Malta, New York, United States 240476 Sartorius   Sartorius   LA310S  Scientific and Laboratory Equipment - Other in Metrology Equipment SARTORIUS, LA310S, s/n: 13110486: SARTORIUS, LA310S, s/n: 13110486 1 Inquire Dresden, Saxony, Germany 240477 SOLVISION   SOLVISION   PRECIS 3D  Plasma Processing Equipment and Tools - Other in Wafer Fabrication Equipment SOLVISION, PRECIS 3D, s/n: C1W010150609: SOLVISION, PRECIS 3D, s/n: C1W010150609 1 Inquire F* Dresden, Saxony, Germany 240456 Sonix   Sonix   Quantum 350  Reliability Test Equipment in Metrology Equipment SONIX, Quantum 350, s/n: Q350C018-0103M, analysis, reliability, investigation: SONIX, Quantum 350, s/n: Q350C018-0103M, analysis, reliability, investigation 1 Inquire Dresden, Saxony, Germany 242488 Tabai-Espec   Tabai-Espec   Tabai TPC421 System  Reliability Test Equipment in Metrology Equipment TABAI, Tabai TPC421 System, S/N 1440706: TABAI, Tabai TPC421 System, S/N 1440706 Faulty. 1 Inquire Singapore, Singapore 237574 TAE YANG TECH   TAE YANG TECH   WET BENCH  Clean Room Equipment in Chambers, Components, Accessories and Other Items TAE YANG TECH, WET BENCH, 200mm, parts cleaning sink: TAE YANG TECH, WET BENCH, 200mm, parts cleaning sink 1 Inquire Singapore, Singapore 241022 Tel   Tel   Lithius  Manual Photoresist Coaters in Wafer Fabrication Equipment TEL Lithius, sn: MDG160683, ,300 mm: Coat only Tool 1 Inquire Dresden, Saxony, Germany 244660 Tel   Tel   P8XL  Probe Equipment - Other in Automatic Test Equipment TEL P8XL, sn: PL03648, TEL P8XL prober VIP 3: TEL P8XL, sn: PL03648, TEL P8XL prober VIP 3 1 Inquire Burlington, Vermont, United States 244659 Tel   Tel   P8XL  Probe Equipment - Other in Automatic Test Equipment TEL P8XL, sn: PL03667, TEL P8XL prober VIP 3: TEL P8XL, sn: PL03667, TEL P8XL prober VIP 3 1 Inquire Burlington, Vermont, United States 244658 Tel   Tel   P8XL  Probe Equipment - Other in Automatic Test Equipment TEL P8XL, sn: PL03670, TEL P8XL prober VIP 3: TEL P8XL, sn: PL03670, TEL P8XL prober VIP 3 1 Inquire Burlington, Vermont, United States 244662 Tel   Tel   P8XL  Probe Equipment - Other in Automatic Test Equipment TEL P8XL, sn: PL03702, TEL P8XL prober VIP 3: TEL P8XL, sn: PL03702, TEL P8XL prober VIP 3 1 Inquire Burlington, Vermont, United States 244656 Tel   Tel   P8XL  Probe Equipment - Other in Automatic Test Equipment TEL P8XL, sn: PL04406, TEL P8XL prober VIP 3: TEL P8XL, sn: PL04406, TEL P8XL prober VIP 3 1 Inquire Burlington, Vermont, United States 244655 Tel   Tel   P8XL  Probe Equipment - Other in Automatic Test Equipment TEL P8XL, sn: PL04407, TEL P8XL prober VIP 3: TEL P8XL, sn: PL04407, TEL P8XL prober VIP 3 1 Inquire Burlington, Vermont, United States 244657 Tel   Tel   P8XL  Probe Equipment - Other in Automatic Test Equipment TEL P8XL, sn: PL04551, TEL P8XL prober VIP 3: TEL P8XL, sn: PL04551, TEL P8XL prober VIP 3 1 Inquire Burlington, Vermont, United States 244661 Tel   Tel   P8XL  Probe Equipment - Other in Automatic Test Equipment TEL P8XL, sn: PL04552, TEL P8XL prober VIP 3: TEL P8XL, sn: PL04552, TEL P8XL prober VIP 3 1 Inquire Burlington, Vermont, United States 245215 Tel   Tel   ALPHA-8S-Z  Vertical LPCVD Furnaces in Chemical Vapor Deposition Equipment TEL, ALPHA-8S-Z, 200mm, S/N A00000075143: TEL, ALPHA-8S-Z, 200mm, S/N A00000075143 1 Inquire N* Singapore, Singapore 226733 Tel   Tel   CR385PH  Automatic Test Equipment - Other in Automatic Test Equipment TEL, CR385PH, S/N 067004: TEL, CR385PH, S/N 067004 1 Inquire Burlington, Vermont, United States 243004 Tel   Tel   FSI ORION  Wafer Cleaners in Wafer Fabrication Equipment TEL, FSI Orion, 300mm, sn: 1501-0004-0508, TOOL ID: DYD1: TEL, FSI Orion, 300mm, sn: 1501-0004-0508, TOOL ID: DYD1 LOW O2 HF AND CITRIC ACID 8 CHAMBER SWC 1 Inquire East Fishkill, New York, United States 241158 Tel   Tel   Indy Plus  Plasma Processing Equipment and Tools - Other in Wafer Fabrication Equipment TEL, Indy Plus, 300mm, s/n: S000009Z5062, TEL Furnace: TEL, Indy Plus, 300mm, s/n: S000009Z5062, TEL Furnace 1 Inquire East Fishkill, New York, United States 226738 Tel   Tel   LTI unit  Automatic Test Equipment - Other in Automatic Test Equipment TEL, LTI unit, S/N 12007: TEL, LTI unit, S/N 12007 1 Inquire Burlington, Vermont, United States 242651 Tel   Tel   P12XL Prober  Probe Equipment - Other in Automatic Test Equipment TEL, P12XL Prober, 300mm, s/n: PH01610, TEL P12XL Prober dual foup VIP3: TEL, P12XL Prober, 300mm, s/n: PH01610, TEL P12XL Prober dual foup VIP3 1 Inquire Burlington, Vermont, United States 242652 Tel   Tel   P12XL Prober  Probe Equipment - Other in Automatic Test Equipment TEL, P12XL Prober, 300mm, s/n: PH05501, TEL P12XL Prober single foup VIP3A: TEL, P12XL Prober, 300mm, s/n: PH05501, TEL P12XL Prober single foup VIP3A 1 Inquire Burlington, Vermont, United States 240392 Tel   Tel   P12XL  Probe Equipment - Other in Automatic Test Equipment TEL, P12XL, 300mm, s/n: PH02206: TEL, P12XL, 300mm, s/n: PH02206 1 Inquire Burlington, Vermont, United States 240391 Tel   Tel   P12XL  Probe Equipment - Other in Automatic Test Equipment TEL, P12XL, 300mm, s/n: PH03108: TEL, P12XL, 300mm, s/n: PH03108 1 Inquire Burlington, Vermont, United States 240396 Tel   Tel   P12XL  Probe Equipment - Other in Automatic Test Equipment TEL, P12XL, 300mm, s/n: PH03806: TEL, P12XL, 300mm, s/n: PH03806 1 Inquire Burlington, Vermont, United States 242878 Tel   Tel   P12XLn  Probe Equipment - Other in Automatic Test Equipment TEL, P12XLn, 300mm, S/N PN00453: TEL, P12XLn, 300mm, S/N PN00453 1 Inquire Singapore, Singapore 240393 Tel   Tel   P12XLn  Probe Equipment - Other in Automatic Test Equipment TEL, P12XLn, 300mm, s/n: PN00071: TEL, P12XL, 300mm, s/n: PN00071 1 Inquire Burlington, Vermont, United States 240395 Tel   Tel   P12XLn  Probe Equipment - Other in Automatic Test Equipment TEL, P12XLn, 300mm, s/n: PN02075: TEL, P12XL, 300mm, s/n: PN02075 1 Inquire Burlington, Vermont, United States 204309 Tel   Tel   Tactrus NCCP  Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items TEL, Tactrus NCCP, 300mm, Etch: TEL, Tactrus NCCP, 300mm, Etch   Connected in fab with 2 chms.     1 Inquire Malta, New York, United States 244284 Zeiss   Zeiss   Merlin  Scanning Electron Microscopes in Microscopes, Optical Inspection ZEISS, Merlin, sn: 4234, Zeiss Merlin Scanning Electron Microscope: ZEISS, Merlin, sn: 4234, Zeiss Merlin Scanning Electron Microscope   1 Inquire Malta, New York, United States

*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.