Displaying 1-100 of 112 Page 1 2 |
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Item ID |
Photo |
Short Description |
Product Type / Details |
#
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Price |
Notes |
Location |
Make |
Model |
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|
$ |
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238042
|
Advantest
|
Advantest |
93000 |
in Metrology Equipment
ADVANTEST 93000, sn: DE04601132, Logic and Memory functional tester:ADVANTEST 93000, sn: DE04601132, Logic and Memory functional tester
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
238044
|
Advantest
|
Advantest |
93000 |
in Metrology Equipment
ADVANTEST 93000, sn: DE04601138, Logic and memory functional test:ADVANTEST 93000, sn: DE04601138, Logic and memory functional test
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
244640
|
Advantest
|
Advantest |
93000 |
in Metrology Equipment
ADVANTEST 93000, sn: DE04601388, Logic and memory functional test:ADVANTEST 93000, sn: DE04601388, Logic and memory functional test
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
238045
|
Advantest
|
Advantest |
93000 |
in Metrology Equipment
ADVANTEST 93000, sn: MY04600193, Logic and memory functional test:ADVANTEST 93000, sn: MY04600193, Logic and memory functional test
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
238046
|
Advantest
|
Advantest |
93000 |
in Metrology Equipment
ADVANTEST 93000, sn: MY04600539, Logic and memory functional test:ADVANTEST 93000, sn: MY04600539, Logic and memory functional test
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
232897
|
Applied Materials In
|
Applied Materials In |
0040-62020 |
in Chambers, Components, Accessories and Other Items
AMAT, 300mm, CMP Retaining Rings:AMAT, 300mm, CMP Retaining Rings
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
246604
|
Applied Materials
|
Applied Materials |
CENTURA EPI |
in Wafer Fabrication Equipment
AMAT, CENTURA EPI, 200mm, S/N 21792:AMAT, CENTURA EPI, 200mm, S/N 21792
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
246375
|
Applied Materials
|
Applied Materials |
CENTURA |
in Wafer Fabrication Equipment
AMAT, Centura, sn: 402970-R3-MAC, 300mm:AMAT Centura 300mm
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
248208
|
Applied Materials
|
Applied Materials |
G3 Lite |
in Microscopes, Optical Inspection
AMAT, G3 Lite, 300mm, S/N W3041:AMAT, G3 Lite, 300mm, S/N W3041
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
|
245288
|
AMAT, P5000, 200mm, S/N 4862
|
AMAT, P5000, 200mm, S/N 4862 |
in Chemical Vapor Deposition Equipment
AMAT, P5000, 200mm, S/N 4862:AMAT, P5000, 200mm, S/N 4862
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
246605
|
Applied Materials
|
Applied Materials |
Ultima CENTURA DCVD |
in Chemical Vapor Deposition Equipment
AMAT, Ultima CENTURA DCVD, 200mm, S/N 302959:AMAT, Ultima CENTURA DCVD, 200mm, S/N 302959 2 chms.
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
204911
|
Applied Materials
|
Applied Materials |
Uvision 5 |
in Microscopes, Optical Inspection
Applied Materials, Uvision5, Bright Field Inspection, 300mm:Applied Materials, Uvision5, Bright Field Inspection, 300mm In the fab, Idle
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
248206
|
ASM
|
ASM |
ASM3200 |
in Wafer Fabrication Equipment
ASM, ASM3200, 300mm, S/N 034120:ASM, ASM3200, 300mm, S/N 034120
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
|
247608
|
ASML
|
ASML |
XT1900GI |
in Wafer Fabrication Equipment
ASML, XT1900GI, 300mm, S/N 4210:ASML, XT1900GI, 300mm, S/N 4210 The cymer laser is EOL.
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1
|
|
Inquire |
|
Singapore, Singapore |
|
|
239851
|
ASML
|
ASML |
Yieldstar S-200B |
in Metrology Equipment
ASML, Yieldstar S-200B, s/n: 9745, 300mm:ASML, Yieldstar S-200B, s/n: 9745, 300mm
|
1
|
|
Inquire |
|
Dresden, Saxony, Germany |
|
|
243574
|
Axcelis Technologies
|
Axcelis Technologies |
Optima MD |
in Wafer Fabrication Equipment
Axcelis, Optima MD, 300mm, s/n: 083011, IMP203:Axcelis, Optima MD, 300mm, s/n: 083011 Medium Current Implant
|
1
|
|
Inquire |
|
Dresden, Saxony, Germany |
|
|
241154
|
Bruker
|
Bruker |
D8 Fabline |
in Metrology Equipment
BRUKER, D8 Fabline, 300 mm, BRUKER D8 FABLINE XRAY DEFRACTION:BRUKER, D8 Fabline, 300 mm BRUKER D8 FABLINE XRAY DEFRACTION
|
1
|
|
Inquire |
|
Dresden, Saxony, Germany |
|
|
209828
|
Bruker, D8FABLINE, 300mm, X-Ray Metrology
|
Bruker, D8FABLINE, 300mm, X-Ray Metrology |
in Microscopes, Optical Inspection
Bruker, D8FABLINE, 300mm, X-Ray Metrology:Bruker, D8FABLINE, 300mm, X-Ray Metrology
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
242618
|
CFM Technologies
|
CFM Technologies |
FullFlow 1/99 8100 |
in Wafer Fabrication Equipment
CFM, FullFlow 1/99 8100, s/n: Cont 1 1188, 200mm, Tool ID: 67R88V:CFM, FullFlow 1/99 8100, s/n: Cont 1 1188, 200mm, Tool ID: 67R88V
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
242619
|
CFM Technologies
|
CFM Technologies |
FullFlow 1/99 8100 |
in Wafer Fabrication Equipment
CFM, FullFlow 1/99 8100, s/n: Cont 2 1188, 200mm, Tool ID: 67R89V:CFM, FullFlow 1/99 8100, s/n: Cont 2 1188, 200mm, Tool ID: 67R89V
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
242203
|
CFM Technologies
|
CFM Technologies |
HP 8050 |
in Wafer Fabrication Equipment
CFM, HP 8050, s/n: 5046, 200mm, Tool ID: 93557X:CFM, CFM HP 8050, s/n: 5046, 200mm, Tool ID: 93557X
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
237959
|
Ebara
|
Ebara |
F-REX300 |
in Wafer Fabrication Equipment
EBARA F-REX300, sn: PZC10954WX, 300 mm, Cu CMP Polish:EBARA F-REX300, sn: PZC10954WX, 300 mm, Cu CMP Polish
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
248240
|
Ebara
|
Ebara |
F-REX300 |
in Wafer Fabrication Equipment
|
1
|
|
Inquire |
N* |
East Fishkill, New York, United States |
|
|
246602
|
Ebara
|
Ebara |
EPO-2228 |
in Wafer Fabrication Equipment
EBARA, EPO-2228, 200mm, S/N PTD90457EX:EBARA, EPO-2228, 200mm, S/N PTD90457EX Oxide CMP
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
240475
|
ECEC
|
ECEC |
Micron2 |
in Metrology Equipment
ECEC, Micron2, s/n:15-308, Assembly, Die Attach:ECEC, Micron2, s/n:15-308, Assembly, Die Attach
|
1
|
|
Inquire |
|
Dresden, Saxony, Germany |
|
|
242920
|
Electroglas
|
Electroglas |
2001X |
in Test, Analysis and Measurement Equipment
Electroglas, 2001X, s/n: 96040033. Tool ID: 514164B:Electroglas, 2001X, s/n: 96040033. Tool ID: 514164B ELECTROGLAS 2001X Wafer Prober
|
1
|
|
Inquire |
|
Santa Clara, California, United States |
|
|
242919
|
Electroglas
|
Electroglas |
2001X |
in Test, Analysis and Measurement Equipment
Electroglas, 2001X, s/n: P84020452/110152. Tool ID: 79X6817AG:Electroglas, 2001X, s/n: P84020452/110152. Tool ID: 79X6817AG ELECTROGLAS 2001X Wafer Prober
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
242917
|
Electroglas
|
Electroglas |
2001X |
in Test, Analysis and Measurement Equipment
Electroglas, 2001X, s/n: Unknown. Tool ID: 4785151CZ:Electroglas, 2001X, s/n: Unknown. Tool ID: 4785151CZ ELECTROGLAS 2001X Wafer Prober
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
242916
|
Electroglas
|
Electroglas |
2001X |
in Test, Analysis and Measurement Equipment
Electroglas, 2001X, s/n: WMP91030194/141911, ELECTROGLAS 2001X Wafer Prober:Electroglas, 2001X, s/n: WMP91030194/141911 ELECTROGLAS 2001X Wafer Prober
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
242918
|
Electroglas
|
Electroglas |
2001X |
in Test, Analysis and Measurement Equipment
Electroglas, 2001X, s/n: WMP91110219/145449. Tool ID: 79X6817BX:Electroglas, 2001X, s/n: WMP91110219/145449. Tool ID: 79X6817BX ELECTROGLAS 2001X Wafer Prober
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
239383
|
ENTEGRIS
|
ENTEGRIS |
N/A |
in Wafer Fabrication Equipment
Entegris, FOUP N2 Purge Station, 300mm:Entegris, FOUP N2 Purge Station, 300mm
|
1
|
|
Inquire |
|
Dresden, Saxony, Germany |
|
|
230317
|
FEI
|
FEI |
ExSolve CLM next Gen |
in Microscopes, Optical Inspection
FEI, ExSolve CLM next Gen, 300mm, S/N 9923535:FEI, ExSolve CLM next Gen, 300mm, S/N 9923535
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
230318
|
FEI
|
FEI |
ExSolve CLM next Gen |
in Microscopes, Optical Inspection
FEI, ExSolve CLM next Gen, 300mm, S/N 9923609:FEI, ExSolve CLM next Gen, 300mm, S/N 9923609
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
244283
|
FEI
|
FEI |
Helios NanoLab 1200HP |
in Wafer Fabrication Equipment
FEI, Helios NanoLab 1200HP, sn: 9921505, Failure Analysis:FEI, Helios NanoLab 1200HP, sn: 9921505, Failure Analysis
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
245290
|
FSI
|
FSI |
Excalibur ISR |
in Wafer Fabrication Equipment
FSI, Excalibur ISR 901499-314, 200mm, S/N 0902-0123-1094:FSI, Excalibur ISR 901499-314, 200mm, S/N 0902-0123-1094
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
233426
|
Genmark Automation
|
Genmark Automation |
Porta300P |
in Chambers, Components, Accessories and Other Items
Genmark, Porta300P, 2 loadports:Genmark, Porta300P, 2 loadports with some spare parts. See pdf for details.
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
248238
|
Hitachi
|
Hitachi |
CG4100 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
N* |
East Fishkill, New York, United States |
|
|
202834
|
Kokusai
|
Kokusai |
DJ-1236VN-DF |
in Chemical Vapor Deposition Equipment
HITACHI KOKUSAI, DJ-1236VN-DF, 300mm:HITACHI KOKUSAI, DJ-1236VN-DF, 300mm
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
243313
|
Hitachi Kokusai Elec
|
Hitachi Kokusai Elec |
DJ-1236VN-DF |
in Chemical Vapor Deposition Equipment
HITACHI KOKUSAI, DJ-1236VN-DF, 300mm, s/n: DN23300, FVX2488:HITACHI KOKUSAI, DJ-1236VN-DF, 300mm, FVX2488 Vertical LPCVD Furnace
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
204280
|
Hitachi
|
Hitachi |
M-8190XT |
in Wafer Fabrication Equipment
Hitachi, M-8190XT, 300mm, Plasma Etch:Hitachi, M-8190XT, 300mm, Plasma Etch 3 Chambers In Fab, Warm Idle
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
237745
|
HMI
|
HMI |
eScan 500 |
in Microscopes, Optical Inspection
HMI eScan 500, sn: ML07114, Defect Review, 300mm:HMI eScan 500, sn: ML07114, Defect Review, 300mm
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
202816
|
HSEB
|
HSEB |
Axiospect 301 |
in Microscopes, Optical Inspection
HSEB, Axiospect 301, Optical Microscope, 300mm:HSEB, Axiospect 301, Optical Microscope, 300mm Cold. Not working parts include: - Tango Controller (Microscope Stage controller
- Joystick and keyboard controller
- Micromotor for fingers edge gripper
- few powers supplies
The tool was running with Windows XP professional 2002 service pack 3.
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
202817
|
HSEB
|
HSEB |
Axiospect 301 |
in Microscopes, Optical Inspection
HSEB, Axiospect 301, Optical Microscope, 300mm:HSEB, Axiospect 301, Optical Microscope, 300mm
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
240478
|
Instron
|
Instron |
5564 |
in Metrology Equipment
INSTRON, 5564, s/n: 5564J2710, Pull Tester:INSTRON, 5564, s/n: 5564J2710, Pull Tester
|
1
|
|
Inquire |
|
Dresden, Saxony, Germany |
|
|
236360
|
Keithley
|
Keithley |
S425 |
in Metrology Equipment
KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2591:KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2591
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
236359
|
Keithley
|
Keithley |
S425 |
in Metrology Equipment
KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2593:KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2593
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
192419
|
Keithley Instruments
|
Keithley Instruments |
S425 |
in Metrology Equipment
Keithley, S425, Kerf Test, S/N QMO2572:Keithley, S425, Kerf Test, S/N QMO2572 Keithley standard matrix kerf tester
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
192418
|
Keithley Instruments
|
Keithley Instruments |
S425 |
in Metrology Equipment
Keithley, S450, Kerf Parametric Tester, S/N: QMO2573:Keithley, S450, Kerf Parametric Tester, S/N: QMO2573
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
238974
|
Keithley
|
Keithley |
S475 |
in Metrology Equipment
KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2593:KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2593
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
238977
|
Keithley
|
Keithley |
S475 |
in Metrology Equipment
KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2733:KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2733
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
238976
|
Keithley
|
Keithley |
S475 |
in Metrology Equipment
KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2734:KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2734
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
238975
|
Keithley
|
Keithley |
S475 |
in Metrology Equipment
KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2738:KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2738
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
238973
|
Keithley
|
Keithley |
S475 |
in Metrology Equipment
KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2792:KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2792
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
238978
|
Keithley
|
Keithley |
S600 |
in Metrology Equipment
KEITHLEY, S600, 25 pin kerf tester, s/n: QMO4104:KEITHLEY, S600, 25 pin kerf tester, s/n: QMO4104
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
242614
|
Keithley
|
Keithley |
S630 |
in Metrology Equipment
KEITHLEY, S630, 200mm, Parametric Test System, s/n: QMO4105:KEITHLEY, S630, Parametric Test System, s/n: QMO4105
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
237748
|
KLA-Tencor
|
KLA-Tencor |
AMI2900 |
in Microscopes, Optical Inspection
KLA AMI2900, sn: V000283, 300mm:KLA AMI2900, sn: V000283, 300mm KLA Advanced Macro Inspection Module
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
248207
|
KLA
|
KLA |
QTX-300 |
in Metrology Equipment
KLA, QTX-300, 300mm, S/N 1006304891:KLA, QTX-300, 300mm, S/N 1006304891
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
|
245167
|
LAM Research Corp.
|
LAM Research Corp. |
C3 |
in Chemical Vapor Deposition Equipment
LAM C3, Dual SPEED/Sequel, s/n:02-2-C30111, 300mm, JO01: LAM C3, Dual SPEED/Sequel, s/n:02-2-C30111, 300mm, JO01 300mm WTS with 2 HDP nitride SPEED chambers and 300mm Sequel chamber
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
243279
|
LAM
|
LAM |
2300 KIYO FX |
in Wafer Fabrication Equipment
LAM, 2300 KIYO FX, 300mm, ETX2300U6:ETX2300U2-T LAM-E5 KIYO FX HYDRA ARIA CORVUS-UPGRADE TO REPURPOSE ETX LAM, 2300 KIYO FX, 300mm, ETX2300U6 SN: KFXE-482(F1514910) - PM2 KFXE-482(F1514910) - PM3 KFXE-482(F1514910) - PM4
|
1
|
|
Inquire |
F* |
Malta, New York, United States |
|
|
219677
|
LAM Research Corp.
|
LAM Research Corp. |
INOVA |
in Wafer Fabrication Equipment
LAM, INOVA, 300mm, S/N 007823-0389:LAM, INOVA, 300mm, S/N 007823-0389
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
245286
|
LAM Research Corp.
|
LAM Research Corp. |
Rainbow 4428 |
in Wafer Fabrication Equipment
LAM, Rainbow 4428, 200mm, S/N 3533 :LAM, Rainbow 4428, 200mm, S/N 3533
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
245285
|
LAM Research Corp.
|
LAM Research Corp. |
TCP9408SE |
in Wafer Fabrication Equipment
LAM, TCP9408SE, 200mm, S/N 4545:LAM, TCP9408SE, 200mm, S/N 4545
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
219675
|
LAM Research Corp.
|
LAM Research Corp. |
Vector Express |
in Chemical Vapor Deposition Equipment
LAM, Vector Express, 300mm, S/N D22437A, Ashable Hard Mask CVD:LAM, Vector Express, 300mm, S/N D22437A, Ashable Hard Mask CVD
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
236970
|
Advantest
|
Advantest |
V93000 |
in Metrology Equipment
LD96, Advantest, V93000, s/n PL000396, Logic and Memory Functional Tester:LD96 Advantest, V93000, s/n PL000396, Logic and Memory Functional Tester
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
241155
|
Lintec
|
Lintec |
RAD-2500M/8 |
in Metrology Equipment
Lintec Corp. RAD-2500M/8, 200mm, s/n: D1S-2575-AW:Lintec Corp. RAD-2500M/8, 200mm, s/n: D1S-2575-AW
|
1
|
|
Inquire |
|
Dresden, Saxony, Germany |
|
|
247204
|
Mattson Technology
|
Mattson Technology |
AST 2800 |
in Wafer Fabrication Equipment
Mattson, AST 2800, 200mm, S/N 97060361:Mattson, AST 2800, 200mm, S/N 97060361
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
241157
|
Mattison
|
Mattison |
MILLIOS HVM |
in Wafer Fabrication Equipment
Mattson, MILLIOS HVM, 300mm, s/n: 11043001, 09130001, 09250001:Mattson, MILLIOS HVM, 300mm, s/n: 11043001, 09130001, 09250001
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
242617
|
Mosaid
|
Mosaid |
M420501 |
in Metrology Equipment
MOSAID, M420501, 200mm, s/n: 3654, Tool ID: KTH91M:MOSAID, M420501, 200mm, s/n: 3654, Tool ID: KTH91M MOSAID Memory Test System
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1
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Inquire |
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Burlington, Vermont, United States |
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242616
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Mosaid
|
Mosaid |
M420501 |
in Metrology Equipment
MOSAID, M420501, 200mm, s/n: 3674, Tool ID: KTH90M:MOSAID, M420501, 200mm, s/n: 3674, Tool ID: KTH90M MOSAID Memory Test System
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1
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Inquire |
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Burlington, Vermont, United States |
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241510
|
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm
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NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm |
in Microscopes, Optical Inspection
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm:NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm
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1
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Inquire |
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Malta, New York, United States |
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248319
|
Nikon
|
Nikon |
NSR-2205EX14C |
in Wafer Fabrication Equipment
Nikon, NSR-2205EX14C, 200mm, S/N 7573113:Nikon, NSR-2205EX14C, 200mm, S/N 7573113
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1
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Inquire |
N* |
Singapore, Singapore |
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245214
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Nikon
|
Nikon |
NSR-S208D |
in Wafer Fabrication Equipment
Nikon, NSR-S208D, 300mm, S/N 8732041:Nikon, NSR-S208D, 300mm, S/N 8732041
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1
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Inquire |
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Singapore, Singapore |
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247027
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Nikon
|
Nikon |
NSR-S208D |
in Wafer Fabrication Equipment
NIKON, NSR-S208D, 300mm, s/n: 8732048:NIKON, NSR-S208D, 300mm, s/n: 8732048 Lithography Step and repeat scanning system
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1
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Inquire |
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Dresden, Saxony, Germany |
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247605
|
Nikon
|
Nikon |
NSR-S208D |
in Wafer Fabrication Equipment
NIKON, NSR-S208D, 300mm, s/n: S62 0290202:Lithography Step and repeat scanning system
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1
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Inquire |
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Dresden, Saxony, Germany |
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246474
|
Nitto
|
Nitto |
NEL-DR3000IV |
in Metrology Equipment
NITTO, NEL-DR3000IV, sn: B491L22, 300mm, BSTA2:NITTO, NEL-DR3000IV, sn: B491L22, 300mm, BSTA2 Nitto Backside Taper
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1
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Inquire |
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East Fishkill, New York, United States |
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248239
|
Nova
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Nova |
T500 |
in Metrology Equipment
NOVA T550, sn: 3800MN -105949, 300mm:Nova T500 3LP Single-MU Basic Tool
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1
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Inquire |
N* |
East Fishkill, New York, United States |
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220257
|
Nova
|
Nova |
T600 |
in Metrology Equipment
NOVA, T600, 300mm, S/N 107242:NOVA, T600, 300mm, S/N 107242
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1
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Inquire |
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East Fishkill, New York, United States |
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239647
|
Novellus Systems
|
Novellus Systems |
INOVA NEXT |
in Wafer Fabrication Equipment
NOVELLUS, INOVA NEXT, s/n M23321A, 300mm:NOVELLUS, INOVA NEXT, s/n M23321A, 300mm
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1
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Inquire |
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Malta, New York, United States |
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|
244285
|
Oxford Instruments
|
Oxford Instruments |
OPAL |
in Wafer Fabrication Equipment
OXFORD INSTRUMENTS, OPAL, sn: 94-220255, RF/Plasma oxide deposition tool:OXFORD INSTRUMENTS, OPAL, sn: 94-220255, RF/Plasma oxide deposition tool
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1
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Inquire |
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Malta, New York, United States |
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|
248205
|
RICOR
|
RICOR |
FOUP Purge Station MK-2 |
in Chambers, Components, Accessories and Other Items
RICOR, FOUP Purge Station MK-2, 300mm, S/N 101919:RICOR, FOUP Purge Station MK-2, 300mm, S/N 101919
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1
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|
Inquire |
N* |
Singapore, Singapore |
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|
204935
|
Rorze
|
Rorze |
RSR160 |
in Wafer Fabrication Equipment
Rorze, RSR160, Reticle Handler:Rorze, RSR160, Reticle Handler
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1
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|
Inquire |
|
Malta, New York, United States |
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|
245895
|
RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa
|
RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa |
in Microscopes, Optical Inspection
RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa:RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa RVSI VISUAL DEFECT SCANNER
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1
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|
Inquire |
|
Burlington, Vermont, United States |
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|
245894
|
RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra
|
RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra |
in Microscopes, Optical Inspection
RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra:RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra inspection scanner
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1
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|
Inquire |
|
Burlington, Vermont, United States |
|
|
240476
|
Sartorius
|
Sartorius |
LA310S |
in Metrology Equipment
SARTORIUS, LA310S, s/n: 13110486:SARTORIUS, LA310S, s/n: 13110486
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1
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|
Inquire |
|
Dresden, Saxony, Germany |
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|
240477
|
SOLVISION
|
SOLVISION |
PRECIS 3D |
in Wafer Fabrication Equipment
SOLVISION, PRECIS 3D, s/n: C1W010150609:SOLVISION, PRECIS 3D, s/n: C1W010150609
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1
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|
Inquire |
F* |
Dresden, Saxony, Germany |
|
|
240456
|
Sonix
|
Sonix |
Quantum 350 |
in Metrology Equipment
SONIX, Quantum 350, s/n: Q350C018-0103M, analysis, reliability, investigation:SONIX, Quantum 350, s/n: Q350C018-0103M, analysis, reliability, investigation
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1
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|
Inquire |
|
Dresden, Saxony, Germany |
|
|
248241
|
Suss Tamarack Scient
|
Suss Tamarack Scient |
TAMARACK M423 EXCIMER |
in Wafer Fabrication Equipment
|
1
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|
Inquire |
N* |
East Fishkill, New York, United States |
|
|
237574
|
TAE YANG TECH
|
TAE YANG TECH |
WET BENCH |
in Chambers, Components, Accessories and Other Items
TAE YANG TECH, WET BENCH, 200mm, parts cleaning sink:TAE YANG TECH, WET BENCH, 200mm, parts cleaning sink
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1
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|
Inquire |
|
Singapore, Singapore |
|
|
245281
|
Tel
|
Tel |
Lithius Pro i |
in Wafer Fabrication Equipment
TEL Lithius Pro i, 300mm, s/n: N100463, TRK1372:TEL Lithius Pro i, 300mm, s/n: N100463, TRK1372 Coater/Developer Tool
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1
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|
Inquire |
|
Dresden, Saxony, Germany |
|
|
246930
|
Tel
|
Tel |
Lithius |
in Wafer Fabrication Equipment
TEL Lithius, sn: G391405 ,300 mm, TRK1420, KrF Litho:TEL Lithius, sn: G391405 ,300 mm, TRK1420 (ALC1420TRK)
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1
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|
Inquire |
|
Dresden, Saxony, Germany |
|
|
241022
|
Tel
|
Tel |
Lithius |
in Wafer Fabrication Equipment
TEL Lithius, sn: MDG160683, ,300 mm:Coat only Tool
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1
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|
Inquire |
|
Dresden, Saxony, Germany |
|
|
248321
|
Tokyo Electron Ltd
|
Tokyo Electron Ltd |
ACT8 |
in Wafer Fabrication Equipment
TEL, ACT8, 200mm, S/N 9101151:TEL, ACT8, 200mm, S/N 9101151
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1
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|
Inquire |
N* |
Singapore, Singapore |
|
|
226733
|
Tel
|
Tel |
CR385PH |
in Automatic Test Equipment
TEL, CR385PH, S/N 067004:TEL, CR385PH, S/N 067004
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1
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|
Inquire |
|
Burlington, Vermont, United States |
|
|
243004
|
Tel
|
Tel |
FSI ORION |
in Wafer Fabrication Equipment
TEL, FSI Orion, 300mm, sn: 1501-0004-0508, TOOL ID: DYD1:TEL, FSI Orion, 300mm, sn: 1501-0004-0508, TOOL ID: DYD1 LOW O2 HF AND CITRIC ACID 8 CHAMBER SWC
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1
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|
Inquire |
|
East Fishkill, New York, United States |
|
|
247197
|
Tel
|
Tel |
LITHIUS PRO V |
in Wafer Fabrication Equipment
TEL, LITHIUS PRO V, 300mm, sn: V110263, HM05:TEL, LITHIUS PRO V, 300mm, sn: V110263, Immersion Coater/Dev
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1
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|
Inquire |
|
East Fishkill, New York, United States |
|
|
247606
|
Tel
|
Tel |
LITHIUS |
in Wafer Fabrication Equipment
TEL, LITHIUS, 300mm, sn: MDG350168:2-Block-Machine
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1
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|
Inquire |
|
Dresden, Saxony, Germany |
|
|
226738
|
Tel
|
Tel |
LTI unit |
in Automatic Test Equipment
TEL, LTI unit, S/N 12007:TEL, LTI unit, S/N 12007
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
245289
|
Tokyo Electron Limit
|
Tokyo Electron Limit |
8181523 |
in Wafer Fabrication Equipment
TEL, Mark 8, 200mm, S/N 8181523:TEL, Mark 8, 200mm, S/N 8181523 SOG Coater. 2 coaters only.
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
242651
|
Tel
|
Tel |
P12XL Prober |
in Automatic Test Equipment
TEL, P12XL Prober, 300mm, s/n: PH01610, TEL P12XL Prober dual foup VIP3:TEL, P12XL Prober, 300mm, s/n: PH01610, TEL P12XL Prober dual foup VIP3
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
242652
|
Tel
|
Tel |
P12XL Prober |
in Automatic Test Equipment
TEL, P12XL Prober, 300mm, s/n: PH05501, TEL P12XL Prober single foup VIP3A:TEL, P12XL Prober, 300mm, s/n: PH05501, TEL P12XL Prober single foup VIP3A
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
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