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	View All Listings Under Microscopes, Optical Inspection » Switch Major Category		Click an item's ID# below for its full specifications , or: Group Listings into sub-categories under Microscopes, Optical Inspection List all 6 product types under Microscopes, Optical Inspection

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Item ID  Photo Short Description Product Type / Details # Price Notes Location Make Model   $   213283 Applied Materials   Applied Materials   NanoSEM 3D  Critical Dimension Scanning Electron Microscopes in Microscopes, Optical Inspection AMAT, Nanosem 3D, 300mm.: AMAT, Nanosem 3D, 300mm In warehouse. S/N : U-664 Vintage : 2004    1 Inquire Singapore, Singapore 213284 Applied Materials   Applied Materials   NanoSEM 3D  Critical Dimension Scanning Electron Microscopes in Microscopes, Optical Inspection AMAT, Nanosem 3D, 300mm.: AMAT, Nanosem 3D, 300mm. Installed.  Operational. Vintage : 2004 S'N : U-666     1 Inquire Singapore, Singapore 180474 Applied Materials   Applied Materials   NanoSEM 3D  Critical Dimension Scanning Electron Microscopes in Microscopes, Optical Inspection Applied Materials NanoSEM 3D, 300mm wafers, CD SEM: MULTIPLE UNITS AVAILBLE.  PLEASE INQUIRE. SEM - Critical Dimension (CD) Measurement Currently configured for 300mm wafers CE Marked Install Type: Stand Alone Cassette Interface: • (3) 300mm FOUP Roll-Around Ergo-Station w/Touch-Screen Status Lamp Options: • Slope Reconstruction • CH Analysis • Profile Grade • Discrete Inspection • Defect Review • ARAMS (ES8) Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz   Software Options: • Slope Reconstruction • CH Analysis • Profile Grade • Discrete Inspection • Defect Review • ARAMS (ES8   1 Inquire East Fishkill, New York, United States 180514 Applied Materials   Applied Materials   NanoSEM 3D  Critical Dimension Scanning Electron Microscopes in Microscopes, Optical Inspection Applied Materials NanoSEM 3D, 300mm wafers, CD SEM: Applied Materials NanoSEM 3D, 300mm wafers, CD SEM MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE. SEM - Critical Dimension (CD) Measurement Currently configured for 300mm wafers CE Marked Install Type: Stand Alone Cassette Interface: • (3) 300mm FOUP Roll-Around Ergo-Station w/Touch-Screen Status Lamp Options: • Slope Reconstruction • CH Analysis • Profile Grade • Discrete Inspection • Defect Review • ARAMS (ES8) Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz   Software Options: • Slope Reconstruction • CH Analysis • Profile Grade • Discrete Inspection • Defect Review • ARAMS (ES8   Tool ID: KA03   1 Inquire East Fishkill, New York, United States 204911 KLA-Tencor   KLA-Tencor   Uvision 5  Optical Inspection - Other in Microscopes, Optical Inspection Applied Materials, Uvision5, Bright Field Inspection, 300mm: Applied Materials, Uvision5, Bright Field Inspection, 300mm In the fab, Idle       1 Inquire Malta, New York, United States 205259 Applied Materials   Applied Materials   Uvision 5  Optical Inspection - Other in Microscopes, Optical Inspection Applied Materials, Uvision5, Bright Field Inspection, 300mm: Applied Materials, Uvision5, Bright Field Inspection, 300mm     1 Inquire Malta, New York, United States 207935 Bruker, AFM, 300mm, InSight 3D-DR  Bruker, AFM, 300mm, InSight 3D-DR  Microscope Inspection Items - Other in Microscopes, Optical Inspection Bruker, AFM, 300mm, InSight 3D-DR: Bruker, AFM, 300mm, InSight 3D-DR   DOM : 2017   S/N : 112   1 Inquire Burlington, Vermont, United States 199447 Bruker, D8FABLINE, 300mm, X-Ray Metrology  Bruker, D8FABLINE, 300mm, X-Ray Metrology  Microscope Inspection Items - Other in Microscopes, Optical Inspection Bruker, D8FABLINE, 300mm, X-Ray Metrology: Bruker, D8FABLINE, 300mm, X-Ray Metrology S/N 204500 2009  The tool is an automated High resolution X-ray diffractometer, clean room (class 1 US-FED-STD 209 or Class 2 ISO 14644-1) compatible, with full 300 mm wafer mapping capabilities. The D8 FABLINE consists of two stainless steal cabinets attached to each other. The first one is an X-ray analytical module composed of: radiation safe enclosure, vertical D8 goniometer, UMC 300mm wafer stage and dedicated optical set-ups, and all required supplies. The second is a handling module Equipment Front End Module (EFEM) Bridge tool Startan from Asyst.The wafers are carried either in FOUP (Front Opening Unified Pod) for 300mm or in FOUP [INVALID] for 200mm..   1 Inquire East Fishkill, New York, United States 223274 Bruker, X3D, 300mm, S/N 104  Bruker, X3D, 300mm, S/N 104  Microscope Inspection Items - Other in Microscopes, Optical Inspection Bruker, X3D, 300mm, S/N 104: Bruker, X3D, 300mm, S/N 104 1 Inquire Fishkill, New York, United States 205918 Camtek   Camtek   X-ACT  Microscopes - Other in Microscopes, Optical Inspection CAMTEK X-ACT System with EM3: CAMTEK X-ACT System with EM3   Idle.  Shut Down. 1 Inquire East Fishkill, New York, United States 202147 FEI   FEI   Ex-Situ Plucker  Microscopes - Other in Microscopes, Optical Inspection FEI, Ex-Situ Plucker, TEM Prep Tool: FEI, Ex-Situ Plucker, TEM Prep Tool S/N : 4471-03-05 2009 Vintage 1 Inquire East Fishkill, New York, United States 203114 FEI   FEI   TEMLINK - KY02, 14771-003  Microscopes - Other in Microscopes, Optical Inspection FEI, Ex-Situ Plucker, TEM Prep ToolFEI, Ex-Situ Plucker, TEM Prep Tool: FEI, Ex-Situ Plucker, TEM Prep Tool     1 Inquire East Fishkill, New York, United States 203117 FEI   FEI   ExSolve 2 WTP EFEM  Microscopes - Other in Microscopes, Optical Inspection FEI, ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB: FEI,  ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB In the fab.  Warm shutdown.   1 Inquire Malta, New York, United States 225318 FEI   FEI   QUANTA 600F  Scanning Electron Microscopes in Microscopes, Optical Inspection FEI, QUANTA 600F, S/N QFV17 / D8086: FEI, QUANTA 600F, S/N QFV17 / D8086 1 Inquire East Fishkill, New York, United States 202146 Hitachi   Hitachi   HF-2000  Microscopes - Other in Microscopes, Optical Inspection Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging: Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging 200KeV Advanced Analytical TEM   1995 Vintage S/N : 6214-3 Un-hooked in lab. 1 Inquire East Fishkill, New York, United States 178294 Hitachi   Hitachi   AS5000  Scanning Electron Microscopes in Microscopes, Optical Inspection Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm: Status: Cold Shutdown Wafer Particle & Defect Analysis system AS5000 Defect data server 1 Inquire F* Singapore, Singapore 225319 Hitachi   Hitachi   TM-1000  Scanning Electron Microscopes in Microscopes, Optical Inspection Hitachi, TM-1000, S/N 0613-11: Hitachi, TM-1000, S/N 0613-11 1 Inquire East Fishkill, New York, United States 204305 HMI, eP4 320, 300mm, ebeam Inspection  HMI, eP4 320, 300mm, ebeam Inspection  Microscope Inspection Items - Other in Microscopes, Optical Inspection HMI, eP4 320, 300mm, ebeam Inspection: HMI, eP4 320, 300mm, ebeam Inspection   In the Fab.  Cold Idle     1 Inquire Malta, New York, United States 202816 HSEB   HSEB   Axiospect 301  Wafer Inspection Microscopes in Microscopes, Optical Inspection HSEB, Axiospect 301, Optical Microscope, 300mm: HSEB, Axiospect 301, Optical Microscope, 300mm Cold.  Not working parts include:  Tango Controller (Microscope Stage controller Joystick and keyboard controller Micromotor for fingers edge gripper few powers supplies The tool was running with Windows XP professional 2002 service pack 3. 1 Inquire Malta, New York, United States 178300 JEOL   JEOL   7555  Scanning Electron Microscopes in Microscopes, Optical Inspection JEOL, Defect Review, 200mm: Status: Bagged & Skidded in warehouse Parts tool.  Listed as major parts missing. 1 Inquire Singapore, Singapore 187765 JEOL   JEOL   JWS 7555S  Scanning Electron Microscopes in Microscopes, Optical Inspection JEOL, JWS 7555S, Defect Review, 200mm: JEOL, JWS 7555S, Defect Review, 200mm 1 Inquire Singapore, Singapore 189689 JEOL   JEOL   JWS-7515  Scanning Electron Microscopes in Microscopes, Optical Inspection JEOL, JWS-7515, 200mm, SEM: JEOL, JWS-7515, 200mm, SEM S/N: WS179028-108 1 Inquire Singapore, Singapore 183758 Lasertech   Lasertech   Reticle Inspection Tool  Optical Inspection - Other in Microscopes, Optical Inspection Lasertech, Reticle Inspection System, 200mm, Lithography: Lasertech, Reticle Inspection System, 200mm, Lithography Tool ID: LRIS-01     1 Inquire Singapore, Singapore 209076 Leica   Leica   POLYLITE 88 METALLURGICAL SCOPE  Wafer Inspection Microscopes in Microscopes, Optical Inspection Leica, POLYLITE 88 METALLURGICAL SCOPE: Leica, POLYLITE 88 METALLURGICAL SCOPE   REICHERT INCIDENT LIGHT MICROSCOPE Idle in the fab.   1 Inquire Singapore, Singapore 204285 Lyncee   Lyncee   Holographic Microscope  Microscopes - Other in Microscopes, Optical Inspection LYNCEE TEC, Holographic Microscope, : LYNCEE TEC, Holographic Microscope,    In Lab 1 Inquire F* Malta, New York, United States 179748 MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm  MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm  Microscope Inspection Items - Other in Microscopes, Optical Inspection MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm: MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm tool for micro probing of transistors at contact level 3 Probe heads, MP1-system with semiauto stage/optics Comes with :  electronic rack with controllers for heads + PCs, probing enclosure unit with optical microscope+3 probe heads Upgrades Include: semiautomatic stage, optics & probe head control, 4th probe head 1 Inquire F* Dresden, SN, Germany 205919 Olympus   Olympus   PMG3  Microscopes - Other in Microscopes, Optical Inspection Olympus Metallurgical Microscope, PMG3, : Olympus Metallurgical Microscope, PMG3,   Idle. 1 Inquire F* East Fishkill, New York, United States 219775 Qcept, ChemetriQ-5000, 300mm, S/N 09-0212-SP01091  Qcept, ChemetriQ-5000, 300mm, S/N 09-0212-SP01091  Microscope Inspection Items - Other in Microscopes, Optical Inspection Qcept, ChemetriQ-5000, 300mm, S/N 09-0212-SP01091: Qcept, ChemetriQ-5000, 300mm, S/N 09-0212-SP01091 Serial number is from Asyst, cos actual tool plate have no visible serial number. 1 Inquire East Fishkill, New York, United States 212830 Rudolph Technologies   Rudolph Technologies   Waferview 320   Optical Inspection - Other in Microscopes, Optical Inspection Rudolph, WaferView 320 Macro Defect, 300mm: Rudolph, WaferView 320 Macro Defect, 300mm   1 Inquire Dresden, Saxony, Germany 213186 Rudolph Technologies   Rudolph Technologies   Waferview 320   Optical Inspection - Other in Microscopes, Optical Inspection Rudolph, WV320 Macro Defect, 300mm: Rudolph, WV320 Macro Defect, 300mm S/N : 2-05-W32-1485-BV-08   1 Inquire Dresden, Saxony, Germany 191626 Zeiss   Zeiss   Axiotron II  Wafer Inspection Microscopes in Microscopes, Optical Inspection Zeiss, Axiotron II, 200mm Inspection Microscope: Zeiss, Axiotron II, 200mm Inspection Microscope Not working. Manual XY Stage 1 Inquire Burlington, Vermont, United States 191627 Zeiss   Zeiss   Axiotron II  Wafer Inspection Microscopes in Microscopes, Optical Inspection Zeiss, Axiotron II, 200mm Inspection Microscope: Zeiss, Axiotron II, 200mm Inspection Microscope Not working. Manual XY Stage S/N: 741481 1 Inquire Burlington, Vermont, United States 191631 Zeiss   Zeiss   Axiotron II  Wafer Inspection Microscopes in Microscopes, Optical Inspection Zeiss, Axiotron II, 200mm Inspection Microscope: Zeiss, Axiotron II, 200mm Inspection Microscope Not working. Manual XY Stage S/N: 741567 1 Inquire F* Burlington, Vermont, United States 202838 Zeiss   Zeiss   LEA 1530  Scanning Electron Microscopes in Microscopes, Optical Inspection Zeiss, LEO1530, SEM, : Zeiss, LEO1530, SEM,    LEO1530 FIELD EMISSION SCANNING ELECTRON MICROSCOPE  No Backside Detector (BSD) Able to house8" wafer.  No 8" wafer holder. No travel for 8" wafer.     Unhooked, in QRA Lab.     1 Inquire Singapore, Singapore

*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

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  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.