Your reliable source for surplus semiconductor equipment!
 Fast¬†¬†FIND      full search   tips    
SPECIALS LISTINGS About Us Contact Us
Serving  Our Guest Log in    Register to manage deal making
ALL CATEGORIES   Metrology Equipment   View   Search-by-Specs   
View All Listings Under

Microscopes, Optical Inspection


» Switch Major Category
Click an item's ID# below for its full specifications , or:

Group Listings into sub-categories under Microscopes, Optical InspectionGroup Listings into sub-categories under Microscopes, Optical Inspection

List all 6 product types under Microscopes, Optical InspectionList all 6 product types under Microscopes, Optical Inspection


  • To sort on a column, click the column head; click it again to reverse the sort.
  • Click the links under the Product Type column head to see other like items of that type.
 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
213283
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes, Optical Inspection

AMAT, Nanosem 3D, 300mm.:

AMAT, Nanosem 3D, 300mm

In warehouse.

S/N : U-664

Vintage : 2004 

 

1 Inquire Singapore, Singapore
213284
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes, Optical Inspection

AMAT, Nanosem 3D, 300mm.:

AMAT, Nanosem 3D, 300mm.

Installed.  Operational.

Vintage : 2004

S'N : U-666

 

 

1 Inquire Singapore, Singapore
180474
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes, Optical Inspection

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

MULTIPLE UNITS AVAILBLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

 

1 Inquire East Fishkill, New York, United States
180514
Applied Materials  

Applied Materials  

NanoSEM 3D 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes, Optical Inspection

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM:

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

 

Tool ID: KA03

 

1 Inquire East Fishkill, New York, United States
204911
KLA-Tencor  

KLA-Tencor  

Uvision 5 

List all items of this typeOptical Inspection - Other

in Microscopes, Optical Inspection

Applied Materials, Uvision5, Bright Field Inspection, 300mm:

Applied Materials, Uvision5, Bright Field Inspection, 300mm

In the fab, Idle

 

 

 

1 Inquire Malta, New York, United States
205259
Applied Materials  

Applied Materials  

Uvision 5 

List all items of this typeOptical Inspection - Other

in Microscopes, Optical Inspection

Applied Materials, Uvision5, Bright Field Inspection, 300mm:

Applied Materials, Uvision5, Bright Field Inspection, 300mm

 

 

1 Inquire Malta, New York, United States
207935
Bruker, AFM, 300mm, InSight 3D-DR 
Bruker, AFM, 300mm, InSight 3D-DR 

List all items of this typeMicroscope Inspection Items - Other

in Microscopes, Optical Inspection

Bruker, AFM, 300mm, InSight 3D-DR:

Bruker, AFM, 300mm, InSight 3D-DR

 

DOM : 2017

 

S/N : 112

 

1 Inquire Burlington, Vermont, United States
199447
Bruker, D8FABLINE, 300mm, X-Ray Metrology 
Bruker, D8FABLINE, 300mm, X-Ray Metrology 

List all items of this typeMicroscope Inspection Items - Other

in Microscopes, Optical Inspection

Bruker, D8FABLINE, 300mm, X-Ray Metrology:

Bruker, D8FABLINE, 300mm, X-Ray Metrology

S/N 204500

2009 

The tool is an automated High resolution X-ray diffractometer, clean room
(class 1 US-FED-STD 209 or Class 2 ISO 14644-1) compatible, with full 300
mm wafer mapping capabilities.
The D8 FABLINE consists of two stainless steal cabinets attached to each
other.
The first one is an X-ray analytical module composed of: radiation safe
enclosure, vertical D8 goniometer, UMC 300mm wafer stage and dedicated
optical set-ups, and all required supplies. The second is a handling module
Equipment Front End Module (EFEM) Bridge tool Startan from Asyst.The wafers
are carried either in FOUP (Front Opening Unified Pod) for 300mm or in FOUP
[INVALID] for 200mm..
 
1 Inquire East Fishkill, New York, United States
223274
Bruker, X3D, 300mm, S/N 104 
Bruker, X3D, 300mm, S/N 104 

List all items of this typeMicroscope Inspection Items - Other

in Microscopes, Optical Inspection

Bruker, X3D, 300mm, S/N 104:

Bruker, X3D, 300mm, S/N 104

1 Inquire Fishkill, New York, United States
205918
Camtek  

Camtek  

X-ACT 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

CAMTEK X-ACT System with EM3:

CAMTEK X-ACT System with EM3

 

Idle.  Shut Down.

1 Inquire East Fishkill, New York, United States
202147
FEI  

FEI  

Ex-Situ Plucker 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

S/N : 4471-03-05

2009 Vintage

1 Inquire East Fishkill, New York, United States
203114
FEI  

FEI  

TEMLINK - KY02, 14771-003 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, Ex-Situ Plucker, TEM Prep ToolFEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

 

 

1 Inquire East Fishkill, New York, United States
203117
FEI  

FEI  

ExSolve 2 WTP EFEM 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB:

FEI,  ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB

In the fab.  Warm shutdown.

 

1 Inquire Malta, New York, United States
225318
FEI  

FEI  

QUANTA 600F 

List all items of this typeScanning Electron Microscopes

in Microscopes, Optical Inspection

FEI, QUANTA 600F, S/N QFV17 / D8086:

FEI, QUANTA 600F, S/N QFV17 / D8086

1 Inquire East Fishkill, New York, United States
202146
Hitachi  

Hitachi  

HF-2000 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging:

Hitachi HF-2000, TEM, EDX, EELs, STEM Imaging

200KeV Advanced Analytical TEM  

1995 Vintage

S/N : 6214-3

Un-hooked in lab.

1 Inquire East Fishkill, New York, United States
178294
Hitachi  

Hitachi  

AS5000 

List all items of this typeScanning Electron Microscopes

in Microscopes, Optical Inspection

Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm:
Status: Cold Shutdown

Wafer Particle & Defect Analysis system AS5000

Defect data server




1 Inquire F* Singapore, Singapore
225319
Hitachi  

Hitachi  

TM-1000 

List all items of this typeScanning Electron Microscopes

in Microscopes, Optical Inspection

Hitachi, TM-1000, S/N 0613-11:

Hitachi, TM-1000, S/N 0613-11

1 Inquire East Fishkill, New York, United States
204305
HMI, eP4 320, 300mm, ebeam Inspection 
HMI, eP4 320, 300mm, ebeam Inspection 

List all items of this typeMicroscope Inspection Items - Other

in Microscopes, Optical Inspection

HMI, eP4 320, 300mm, ebeam Inspection:

HMI, eP4 320, 300mm, ebeam Inspection

 

In the Fab.  Cold Idle

 

 

1 Inquire Malta, New York, United States
202816
HSEB  

HSEB  

Axiospect 301 

List all items of this typeWafer Inspection Microscopes

in Microscopes, Optical Inspection

HSEB, Axiospect 301, Optical Microscope, 300mm:

HSEB, Axiospect 301, Optical Microscope, 300mm

Cold.  Not working parts include: 

  • Tango Controller (Microscope Stage controller
  • Joystick and keyboard controller
  • Micromotor for fingers edge gripper
  • few powers supplies

The tool was running with Windows XP professional 2002 service pack 3.

1 Inquire Malta, New York, United States
178300
JEOL  

JEOL  

7555 

List all items of this typeScanning Electron Microscopes

in Microscopes, Optical Inspection

JEOL, Defect Review, 200mm:

Status: Bagged & Skidded in warehouse

Parts tool.  Listed as major parts missing.

1 Inquire Singapore, Singapore
187765
JEOL  

JEOL  

JWS 7555S 

List all items of this typeScanning Electron Microscopes

in Microscopes, Optical Inspection

JEOL, JWS 7555S, Defect Review, 200mm:

JEOL, JWS 7555S, Defect Review, 200mm

1 Inquire Singapore, Singapore
189689
JEOL  

JEOL  

JWS-7515 

List all items of this typeScanning Electron Microscopes

in Microscopes, Optical Inspection

JEOL, JWS-7515, 200mm, SEM:

JEOL, JWS-7515, 200mm, SEM

S/N: WS179028-108

1 Inquire Singapore, Singapore
183758
Lasertech  

Lasertech  

Reticle Inspection Tool 

List all items of this typeOptical Inspection - Other

in Microscopes, Optical Inspection

Lasertech, Reticle Inspection System, 200mm, Lithography:

Lasertech, Reticle Inspection System, 200mm, Lithography

Tool ID: LRIS-01

 

 

1 Inquire Singapore, Singapore
209076
Leica  

Leica  

POLYLITE 88 METALLURGICAL SCOPE 

List all items of this typeWafer Inspection Microscopes

in Microscopes, Optical Inspection

Leica, POLYLITE 88 METALLURGICAL SCOPE:

Leica, POLYLITE 88 METALLURGICAL SCOPE

 

REICHERT INCIDENT LIGHT MICROSCOPE

Idle in the fab.

 

1 Inquire Singapore, Singapore
204285
Lyncee  

Lyncee  

Holographic Microscope 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

LYNCEE TEC, Holographic Microscope, :

LYNCEE TEC, Holographic Microscope, 

 

In Lab

1 Inquire F* Malta, New York, United States
179748
MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm 
MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm 

List all items of this typeMicroscope Inspection Items - Other

in Microscopes, Optical Inspection

MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm:
MULTIPROBE MP1, Atomic Force Prober (AFP), 300mm
tool for micro probing of transistors at contact level
3 Probe heads,
MP1-system with semiauto stage/optics
Comes with : 
electronic rack with controllers for heads + PCs, probing enclosure unit with optical microscope+3 probe heads
Upgrades Include:
semiautomatic stage, optics & probe head control, 4th probe head




1 Inquire F* Dresden, SN, Germany
205919
Olympus  

Olympus  

PMG3 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

Olympus Metallurgical Microscope, PMG3, :

Olympus Metallurgical Microscope, PMG3,

 

Idle.

1 Inquire F* East Fishkill, New York, United States
219775
Qcept, ChemetriQ-5000, 300mm, S/N 09-0212-SP01091 
Qcept, ChemetriQ-5000, 300mm, S/N 09-0212-SP01091 

List all items of this typeMicroscope Inspection Items - Other

in Microscopes, Optical Inspection

Qcept, ChemetriQ-5000, 300mm, S/N 09-0212-SP01091:

Qcept, ChemetriQ-5000, 300mm, S/N 09-0212-SP01091

Serial number is from Asyst, cos actual tool plate have no visible serial number.

1 Inquire East Fishkill, New York, United States
212830
Rudolph Technologies  

Rudolph Technologies  

Waferview 320  

List all items of this typeOptical Inspection - Other

in Microscopes, Optical Inspection

Rudolph, WaferView 320 Macro Defect, 300mm:

Rudolph, WaferView 320 Macro Defect, 300mm

 

1 Inquire Dresden, Saxony, Germany
213186
Rudolph Technologies  

Rudolph Technologies  

Waferview 320  

List all items of this typeOptical Inspection - Other

in Microscopes, Optical Inspection

Rudolph, WV320 Macro Defect, 300mm:

Rudolph, WV320 Macro Defect, 300mm

S/N : 2-05-W32-1485-BV-08

 

1 Inquire Dresden, Saxony, Germany
191626
Zeiss  

Zeiss  

Axiotron II 

List all items of this typeWafer Inspection Microscopes

in Microscopes, Optical Inspection

Zeiss, Axiotron II, 200mm Inspection Microscope:
Zeiss, Axiotron II, 200mm Inspection Microscope

Not working.
Manual XY Stage
1 Inquire Burlington, Vermont, United States
191627
Zeiss  

Zeiss  

Axiotron II 

List all items of this typeWafer Inspection Microscopes

in Microscopes, Optical Inspection

Zeiss, Axiotron II, 200mm Inspection Microscope:

Zeiss, Axiotron II, 200mm Inspection Microscope

Not working.
Manual XY Stage

S/N: 741481

1 Inquire Burlington, Vermont, United States
191631
Zeiss  

Zeiss  

Axiotron II 

List all items of this typeWafer Inspection Microscopes

in Microscopes, Optical Inspection

Zeiss, Axiotron II, 200mm Inspection Microscope:
Zeiss, Axiotron II, 200mm Inspection Microscope

Not working.
Manual XY Stage

S/N: 741567
1 Inquire F* Burlington, Vermont, United States
202838
Zeiss  

Zeiss  

LEA 1530 

List all items of this typeScanning Electron Microscopes

in Microscopes, Optical Inspection

Zeiss, LEO1530, SEM, :

Zeiss, LEO1530, SEM, 

 

LEO1530 FIELD EMISSION SCANNING ELECTRON MICROSCOPE

 No Backside Detector (BSD)

Able to house8" wafer.  No 8" wafer holder. No travel for 8" wafer.

 

 

Unhooked, in QRA Lab.

 

 

1 Inquire Singapore, Singapore


*   Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.