 |
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
Make |
Model |
|
|
$ |
|
 |
259217
|
Adixen
|
Adixen |
APA 302 |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
 |
259244
|
Aetrium
|
Aetrium |
1164 |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Dresden, Saxony, Germany |
|
 |
257118
|
Aetrium
|
Aetrium |
1164 |
in Metrology Equipment
AETRIUM 1164, S/N: 130:Reliability Test System
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
257119
|
Aetrium
|
Aetrium |
1164 |
in Metrology Equipment
AETRIUM 1164, S/N: 130:Reliability Test System
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
257146
|
Aetrium
|
Aetrium |
1164 |
in Metrology Equipment
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
257148
|
Aetrium
|
Aetrium |
1164 |
in Metrology Equipment
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
257147
|
Aetrium
|
Aetrium |
1164 |
in Metrology Equipment
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
259246
|
Agilent
|
Agilent |
7500 |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
 |
251076
|
Applied Materials In
|
Applied Materials In |
NanoSEM 3D |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
259219
|
AMAT
|
AMAT |
UVision 3 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
 |
252611
|
Applied Materials In
|
Applied Materials In |
Verity1 SEM |
in Microscopes, Optical Inspection
AMAT Verity1 SEM, 300mm, s/n: U-757:Applied VeritySEM
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
257175
|
AMAT
|
AMAT |
Verity2 SEM |
in Metrology Equipment
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
248208
|
Applied Materials In
|
Applied Materials In |
G3 Lite |
in Microscopes, Optical Inspection
AMAT, G3 Lite, 300mm, S/N W3041:AMAT, G3 Lite, 300mm, S/N W3041
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
257150
|
Arcadia Engineering
|
Arcadia Engineering |
AG-112A |
in Metrology Equipment
Arcadia AG-112A, 300mm, s/n: N331372:CONTACT ANGLE MEASUREMENT
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
254199
|
ASML
|
ASML |
Yieldstar S-200B |
in Metrology Equipment
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
252767
|
Bruker
|
Bruker |
D8 Davinci |
in Metrology Equipment
BRUKER D8 Davinci, s/n: 12/12-113:Bruker D8 DaVinci X-Ray Diffractometer
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
254246
|
Bruker
|
Bruker |
D8 Discover |
in Metrology Equipment
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
252770
|
Bruker
|
Bruker |
D8 Fabline |
in Metrology Equipment
BRUKER D8 Fabline, 300mm, s/n: 205934:Bruker D8 Fabline X-Ray Diffractometer
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
253457
|
Bruker
|
Bruker |
D8 Fabline |
in Metrology Equipment
BRUKER D8 Fabline, 300mm, s/n: 208564:BRUKER D8 FABLINE XRAY DEFRACTION
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
259227
|
Bruker
|
Bruker |
D8 Fabline |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Malta, New York, United States |
|
 |
252773
|
Bruker
|
Bruker |
Dimension 5000 |
in Metrology Equipment
BRUKER Dimension 5000, 300mm, s/n: 239-CAP:Bruker Dimension 5000 AFM
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
252774
|
Cameca
|
Cameca |
FlexTAP |
in Metrology Equipment
CAMECA FlexTAP, s/n: 16:Atom Probe Tomography
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
252772
|
Cameca
|
Cameca |
LEAP 4000x Si |
in Metrology Equipment
CAMECA LEAP 4000x Si, s/n: 5059:Cameca LEAP 4000x Si Atom Probe Tomography
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
259304
|
FSI
|
FSI |
Polaris 1000 |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Burlington, Vermont, United States |
|
 |
259302
|
FSI
|
FSI |
Polaris 2000 |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Burlington, Vermont, United States |
|
 |
259303
|
FSI
|
FSI |
Polaris 2000 |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Burlington, Vermont, United States |
|
 |
251081
|
HMI
|
HMI |
ESCAN380 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
259251
|
Hewlett Packard
|
Hewlett Packard |
4140B |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
 |
259212
|
HSEB
|
HSEB |
Axiospect 300 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
N* |
Dresden, Saxony, Germany |
|
 |
259211
|
HSEB
|
HSEB |
Axiospect 300 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
N* |
Dresden, Saxony, Germany |
|
 |
253752
|
HSEB
|
HSEB |
MMT 300 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
253234
|
HSEB
|
HSEB |
MMT300 V2 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
202816
|
HSEB
|
HSEB |
Axiospect 301 |
in Microscopes, Optical Inspection
HSEB, Axiospect 301, Optical Microscope, 300mm:HSEB, Axiospect 301, Optical Microscope, 300mm Cold. Not working parts include: - Tango Controller (Microscope Stage controller
- Joystick and keyboard controller
- Micromotor for fingers edge gripper
- few powers supplies
The tool was running with Windows XP professional 2002 service pack 3.
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
257149
|
Instron
|
Instron |
5564 |
in Metrology Equipment
INSTRON 5564, s/n: 5564J2710:Pull Tester
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
259157
|
KLA -Tencor
|
KLA -Tencor |
2401 Viper |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Burlington, Vermont, United States |
|
 |
251079
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
251078
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
251080
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
251617
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
251077
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
257171
|
KLA -Tencor
|
KLA -Tencor |
alpha step |
in Metrology Equipment
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
 |
257170
|
KLA -Tencor
|
KLA -Tencor |
alpha step |
in Metrology Equipment
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
253369
|
KLA-Tencor
|
KLA-Tencor |
5200 |
in Metrology Equipment
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
253040
|
KLA-Tencor
|
KLA-Tencor |
AIT II |
in Microscopes, Optical Inspection
KLA Tencor AIT II, 200mm, s/n: 9145:KLA-Tencor AIT II w/ ADC. Defect Inspection
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
253033
|
KLA-Tencor
|
KLA-Tencor |
AIT II |
in Microscopes, Optical Inspection
KLA Tencor AIT II, 200mm, s/n: 9234:AIT II w/ ADC. Defect Inspection Tool
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
225920
|
KLA-Tencor
|
KLA-Tencor |
Viper 2435 |
in Metrology Equipment
KLA, Viper 2435, 300mm, S/N 2306070577:KLA, Viper 2435, 300mm, S/N 2306070577
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
253038
|
KLA-Tencor
|
KLA-Tencor |
AIT II |
in Microscopes, Optical Inspection
KLA-Tencor AIT II, 200mm, s/n: 9152:AIT II w/ ADC. Defect Inspection
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
253037
|
KLA-Tencor
|
KLA-Tencor |
AIT II |
in Microscopes, Optical Inspection
KLA-Tencor AIT II, 200mm, s/n: 9262:AIT II w/ ADC. Defect Inspection Tool
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
254084
|
KLA-Tencor
|
KLA-Tencor |
EDR 5200 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
254087
|
KLA-Tencor
|
KLA-Tencor |
EDR 5210 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
254086
|
KLA-Tencor
|
KLA-Tencor |
EDR 5210 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
254085
|
KLA-Tencor
|
KLA-Tencor |
EDR 5210 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
259181
|
KLA-Tencor
|
KLA-Tencor |
RS100C |
in Microscopes, Optical Inspection
KLA-Tencor RS100C, 300mm, s/n: 3405032782:KLA-Tencor RS100C Resistivity Measurement Tool
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
 |
259209
|
KLA -Tencor
|
KLA -Tencor |
Spectra FX100 |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
 |
259206
|
KLA -Tencor
|
KLA -Tencor |
Spectra FX100 |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
 |
259207
|
KLA -Tencor
|
KLA -Tencor |
Spectra FX100 |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
 |
259208
|
KLA -Tencor
|
KLA -Tencor |
Spectra FX100 |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
 |
252775
|
Kobelco
|
Kobelco |
HRBS |
in Metrology Equipment
KOBELCO HRBS, s/n: ED10020:High Resolution Rutherford Backscattering
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
259247
|
KEM
|
KEM |
AT-510 |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
 |
254226
|
Lasertec
|
Lasertec |
BI100 |
in Metrology Equipment
Lasertec BI100, s/n: BA002A408JR:EUV Reticle Back Side Inspection
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
259235
|
Leica
|
Leica |
INM300 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
 |
259248
|
Metrohm
|
Metrohm |
736 GP Titrino |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
 |
259204
|
Metryx
|
Metryx |
Mentor DF3 |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Dresden, Saxony, Germany |
|
 |
241510
|
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm
|
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm |
in Microscopes, Optical Inspection
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm:NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
259191
|
NI
|
NI |
PXIe 1095 |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
 |
259236
|
Nikon
|
Nikon |
Optiphot 300 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
 |
257115
|
Nova
|
Nova |
3090next |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
259225
|
Nova
|
Nova |
3090next |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
N* |
Dresden, Saxony, Germany |
|
 |
259226
|
Nova
|
Nova |
3090next |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
N* |
Dresden, Saxony, Germany |
|
 |
257116
|
Nova
|
Nova |
3090next |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
259222
|
Nova
|
Nova |
3090next |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
N* |
Dresden, Saxony, Germany |
|
 |
259224
|
Nova
|
Nova |
3090next |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
N* |
Dresden, Saxony, Germany |
|
 |
259223
|
Nova
|
Nova |
3090next |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
N* |
Dresden, Saxony, Germany |
|
 |
257117
|
Nova
|
Nova |
3090next |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
254369
|
Park System NX-Hivac, 300mm, s/n: 40788
|
Park System NX-Hivac, 300mm, s/n: 40788 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
259245
|
Perkin Elmer
|
Perkin Elmer |
TurboMatrix 40 Trap |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
 |
253236
|
Phoenix
|
Phoenix |
Micromex SE160T |
in Metrology Equipment
PHOENIX Micromex SE160T, 300mm, s/n: PA1529:PHOENIX_X-Ray Systems
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
259250
|
Quorumtech
|
Quorumtech |
K650X |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
 |
259228
|
Rudolph Technologies
|
Rudolph Technologies |
S3000-S |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
N* |
Malta, New York, United States |
|
 |
253031
|
Rudolph Technologies
|
Rudolph Technologies |
S3000-S |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
250932
|
RVSI
|
RVSI |
WS-3000HS |
in Metrology Equipment
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
254201
|
RVSI
|
RVSI |
ws3500/3800 upgrade |
in Metrology Equipment
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
254200
|
RVSI
|
RVSI |
ws3500/3800 upgrade |
in Metrology Equipment
|
1
|
|
Inquire |
 |
Burlington, Vermont, United States |
|
 |
254079
|
Sartorius
|
Sartorius |
LA310S |
in Metrology Equipment
Sartorius LA310S, s/n: 13110486:Scale for Weight Control
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
259249
|
SKC
|
SKC |
AirCheck Touch |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
 |
259194
|
SOLVISION
|
SOLVISION |
Precis 3D |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
N* |
Dresden, Saxony, Germany |
|
 |
259192
|
SOLVISION
|
SOLVISION |
Precis 3D |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
N* |
Dresden, Saxony, Germany |
|
 |
259193
|
SOLVISION
|
SOLVISION |
Precis 3D |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
N* |
Dresden, Saxony, Germany |
|
 |
240477
|
SOLVISION
|
SOLVISION |
PRECIS 3D |
in Microscopes, Optical Inspection
SOLVISION, PRECIS 3D, s/n: C1W010150609:SOLVISION, PRECIS 3D, s/n: C1W010150609
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
257172
|
Sonix
|
Sonix |
Quantum Q350 |
in Metrology Equipment
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
252776
|
TORR International
|
TORR International |
MSS3G2 |
in Metrology Equipment
TORR International, s/n: ECOL3710:Torr Nickel Deposition Tool
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
259180
|
Zeiss
|
Zeiss |
1540EsB |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
 |
259170
|
Zeiss
|
Zeiss |
Axiotron |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
|
 |