|
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
Make |
Model |
|
|
$ |
|
|
238042
|
Advantest
|
Advantest |
93000 |
in Metrology Equipment
ADVANTEST 93000, sn: DE04601132, Logic and Memory functional tester:ADVANTEST 93000, sn: DE04601132, Logic and Memory functional tester
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
238044
|
Advantest
|
Advantest |
93000 |
in Metrology Equipment
ADVANTEST 93000, sn: DE04601138, Logic and memory functional test:ADVANTEST 93000, sn: DE04601138, Logic and memory functional test
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
244640
|
Advantest
|
Advantest |
93000 |
in Metrology Equipment
ADVANTEST 93000, sn: DE04601388, Logic and memory functional test:ADVANTEST 93000, sn: DE04601388, Logic and memory functional test
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
238045
|
Advantest
|
Advantest |
93000 |
in Metrology Equipment
ADVANTEST 93000, sn: MY04600193, Logic and memory functional test:ADVANTEST 93000, sn: MY04600193, Logic and memory functional test
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
238046
|
Advantest
|
Advantest |
93000 |
in Metrology Equipment
ADVANTEST 93000, sn: MY04600539, Logic and memory functional test:ADVANTEST 93000, sn: MY04600539, Logic and memory functional test
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
254245
|
Advantest
|
Advantest |
V93000 |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Malta, New York, United States |
|
|
249580
|
Advantest
|
Advantest |
Verigy |
in Metrology Equipment
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
251076
|
Applied Materials
|
Applied Materials |
NanoSEM 3D |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
254249
|
AMAT
|
AMAT |
UVision 6 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
N* |
Malta, New York, United States |
|
|
254250
|
AMAT
|
AMAT |
UVision 6 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
N* |
Malta, New York, United States |
|
|
252611
|
Applied Materials
|
Applied Materials |
Verity1 SEM |
in Microscopes, Optical Inspection
AMAT Verity1 SEM, 300mm, s/n: U-757:Applied VeritySEM
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
248208
|
Applied Materials
|
Applied Materials |
G3 Lite |
in Microscopes, Optical Inspection
AMAT, G3 Lite, 300mm, S/N W3041:AMAT, G3 Lite, 300mm, S/N W3041
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
204911
|
Applied Materials
|
Applied Materials |
Uvision 5 |
in Microscopes, Optical Inspection
Applied Materials, Uvision5, Bright Field Inspection, 300mm:Applied Materials, Uvision5, Bright Field Inspection, 300mm In the fab, Idle
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
254199
|
ASML
|
ASML |
Yieldstar S-200B |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Dresden, Saxony, Germany |
|
|
253753
|
Asymtek
|
Asymtek |
X-1010 |
in Metrology Equipment
Asymtek X-1010, s/n: X12451:Dispensing of paste
|
1
|
|
Inquire |
|
Dresden, Saxony, Germany |
|
|
254167
|
Axcelis Technologies
|
Axcelis Technologies |
PCU 200 |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
|
254164
|
Axcelis Technologies
|
Axcelis Technologies |
PCU 200 |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
|
254163
|
Axcelis Technologies
|
Axcelis Technologies |
PCU 200 |
in Metrology Equipment
AXCELIS PCU 200, 200mm, s/n: PU6C289X:PHOTOSTABILIZER
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
|
254165
|
Axcelis Technologies
|
Axcelis Technologies |
PCU 200 |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
|
254166
|
Axcelis Technologies
|
Axcelis Technologies |
PCU 200 |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
|
252767
|
Bruker
|
Bruker |
D8 Davinci |
in Metrology Equipment
BRUKER D8 Davinci, s/n: 12/12-113:Bruker D8 DaVinci X-Ray Diffractometer
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
254246
|
Bruker
|
Bruker |
D8 Discover |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Malta, New York, United States |
|
|
252770
|
Bruker
|
Bruker |
D8 Fabline |
in Metrology Equipment
BRUKER D8 Fabline, 300mm, s/n: 205934:Bruker D8 Fabline X-Ray Diffractometer
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
253457
|
Bruker
|
Bruker |
D8 Fabline |
in Metrology Equipment
BRUKER D8 Fabline, 300mm, s/n: 208564:BRUKER D8 FABLINE XRAY DEFRACTION
|
1
|
|
Inquire |
|
Dresden, Saxony, Germany |
|
|
252773
|
Bruker
|
Bruker |
Dimension 5000 |
in Metrology Equipment
BRUKER Dimension 5000, 300mm, s/n: 239-CAP:Bruker Dimension 5000 AFM
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
209828
|
Bruker, D8FABLINE, 300mm, X-Ray Metrology
|
Bruker, D8FABLINE, 300mm, X-Ray Metrology |
in Microscopes, Optical Inspection
Bruker, D8FABLINE, 300mm, X-Ray Metrology:Bruker, D8FABLINE, 300mm, X-Ray Metrology
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
252774
|
Cameca
|
Cameca |
FlexTAP |
in Metrology Equipment
CAMECA FlexTAP, s/n: 16:Atom Probe Tomography
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
252772
|
CAMECA LEAP 4000x Si, s/n: 5059
|
CAMECA LEAP 4000x Si, s/n: 5059 |
in Metrology Equipment
CAMECA LEAP 4000x Si, s/n: 5059:Cameca LEAP 4000x Si Atom Probe Tomography
|
1
|
|
Inquire |
|
Santa Clara, California, United States |
|
|
254204
|
FEI
|
FEI |
ExSolve CLM next Gen |
in Metrology Equipment
FEI ExSolve CLM next Gen, 300mm, s/n: 9923535:FIB
|
1
|
|
Inquire |
N* |
Malta, New York, United States |
|
|
254205
|
FEI
|
FEI |
ExSolve CLM next Gen |
in Metrology Equipment
FEI ExSolve CLM next Gen, 300mm, s/n: 9923609:FIB
|
1
|
|
Inquire |
N* |
Malta, New York, United States |
|
|
251067
|
HIMS
|
HIMS |
HPI-1000 |
in Microscopes, Optical Inspection
HIMS HPI-1000, 200mm, s/n: 2605-W08-PI001:TRF6 HIMS-A01-T RETICLE MACRO INSPECTION TOOL(EVAL TOOL) (former LRIS-02)
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
251068
|
HIMS
|
HIMS |
HPI-1000 |
in Microscopes, Optical Inspection
HIMS HPI-1000, 200mm, s/n: 2605-W08-PI001:TRF6 HIMS-A01-T RETICLE MACRO INSPECTION TOOL(EVAL TOOL) (former LRIS-02)
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
237745
|
HMI
|
HMI |
eScan 500 |
in Microscopes, Optical Inspection
HMI eScan 500, sn: ML07114, Defect Review, 300mm:HMI eScan 500, sn: ML07114, Defect Review, 300mm
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
251081
|
HMI
|
HMI |
ESCAN380 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
253752
|
HSEB
|
HSEB |
MMT 300 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
|
Dresden, Saxony, Germany |
|
|
253234
|
HSEB
|
HSEB |
MMT300 V2 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
|
Dresden, Saxony, Germany |
|
|
202816
|
HSEB
|
HSEB |
Axiospect 301 |
in Microscopes, Optical Inspection
HSEB, Axiospect 301, Optical Microscope, 300mm:HSEB, Axiospect 301, Optical Microscope, 300mm Cold. Not working parts include: - Tango Controller (Microscope Stage controller
- Joystick and keyboard controller
- Micromotor for fingers edge gripper
- few powers supplies
The tool was running with Windows XP professional 2002 service pack 3.
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
202817
|
HSEB
|
HSEB |
Axiospect 301 |
in Microscopes, Optical Inspection
HSEB, Axiospect 301, Optical Microscope, 300mm:HSEB, Axiospect 301, Optical Microscope, 300mm
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
254223
|
Jordan Valley JVX6200i, 300mm, s/n: M872
|
Jordan Valley JVX6200i, 300mm, s/n: M872 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
N* |
Malta, New York, United States |
|
|
254152
|
Keysight
|
Keysight |
4062UX |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
|
254151
|
Keysight
|
Keysight |
4062UX |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
|
254153
|
Keysight
|
Keysight |
4062UX |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
|
254154
|
Keysight
|
Keysight |
4062UX |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
|
251079
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
251077
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
254255
|
KLA-Tencor
|
KLA-Tencor |
2835 |
in Microscopes, Optical Inspection
KLA 2835, 300mm, s/n: 1340334:Brightfield Inspection
|
1
|
|
Inquire |
N* |
Malta, New York, United States |
|
|
251078
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
251080
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
251617
|
KLA-Tencor
|
KLA-Tencor |
AITXUV |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
237748
|
KLA-Tencor
|
KLA-Tencor |
AMI2900 |
in Microscopes, Optical Inspection
KLA AMI2900, sn: V000283, 300mm:KLA AMI2900, sn: V000283, 300mm KLA Advanced Macro Inspection Module
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
254247
|
KLA-Tencor
|
KLA-Tencor |
Archer A500 AIM |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Malta, New York, United States |
|
|
252339
|
KLA-Tencor
|
KLA-Tencor |
SPECTRACD-XT |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
252340
|
KLA-Tencor
|
KLA-Tencor |
SPECTRACD-XT |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
253369
|
KLA-Tencor
|
KLA-Tencor |
5200 |
in Metrology Equipment
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
253040
|
KLA-Tencor
|
KLA-Tencor |
AIT II |
in Microscopes, Optical Inspection
KLA Tencor AIT II, 200mm, s/n: 9145:KLA-Tencor AIT II w/ ADC. Defect Inspection
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
253033
|
KLA-Tencor
|
KLA-Tencor |
AIT II |
in Microscopes, Optical Inspection
KLA Tencor AIT II, 200mm, s/n: 9234:AIT II w/ ADC. Defect Inspection Tool
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
254150
|
KLA-Tencor
|
KLA-Tencor |
OP2600DUVI |
in Microscopes, Optical Inspection
KLA Tencor OP2600DUVI, 200mm, s/n: 6454:Film thickness measurement
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
|
254149
|
KLA-Tencor
|
KLA-Tencor |
OP3260I |
in Microscopes, Optical Inspection
KLA Tencor OP3260I, 200mm, s/n: 6678:Film thickness measurement
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
|
254148
|
KLA-Tencor
|
KLA-Tencor |
OP5240I |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
N* |
Santa Clara, California, United States |
|
|
254147
|
KLA-Tencor
|
KLA-Tencor |
UV1280SE |
in Microscopes, Optical Inspection
KLA Tencor UV1280SE, 200mm, s/n: 991098:Film thickness measurement tool
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
|
253038
|
KLA-Tencor
|
KLA-Tencor |
AIT II |
in Microscopes, Optical Inspection
KLA-Tencor AIT II, 200mm, s/n: 9152:AIT II w/ ADC. Defect Inspection
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
253037
|
KLA-Tencor
|
KLA-Tencor |
AIT II |
in Microscopes, Optical Inspection
KLA-Tencor AIT II, 200mm, s/n: 9262:AIT II w/ ADC. Defect Inspection Tool
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
253039
|
KLA-Tencor
|
KLA-Tencor |
AIT |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
254084
|
KLA-Tencor
|
KLA-Tencor |
EDR 5200 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
254087
|
KLA-Tencor
|
KLA-Tencor |
EDR 5210 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
254086
|
KLA-Tencor
|
KLA-Tencor |
EDR 5210 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
254085
|
KLA-Tencor
|
KLA-Tencor |
EDR 5210 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
252775
|
Kobelco
|
Kobelco |
HRBS |
in Metrology Equipment
KOBELCO HRBS, s/n: ED10020:High Resolution Rutherford Backscattering
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
254226
|
Lasertec
|
Lasertec |
BI100 |
in Metrology Equipment
Lasertec BI100, s/n: BA002A408JR:EUV Reticle Back Side Inspection
|
1
|
|
Inquire |
N* |
Malta, New York, United States |
|
|
236970
|
Advantest
|
Advantest |
V93000 |
in Metrology Equipment
LD96, Advantest, V93000, s/n PL000396, Logic and Memory Functional Tester:LD96 Advantest, V93000, s/n PL000396, Logic and Memory Functional Tester
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
250990
|
MDC
|
MDC |
SIGNATION S480 |
in Metrology Equipment
MDC, SIGNATION S480, 200mm, sn: 309:MDC FOR GATE OXIDE ANALYSIS
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
241510
|
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm
|
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm |
in Microscopes, Optical Inspection
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm:NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
252620
|
Nova
|
Nova |
4069MN |
in Microscopes, Optical Inspection
NOVA T600, 300mm, s/n: 4069MN:Nova T600 3LP Single-MU Basic Tool
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
252607
|
Nova
|
Nova |
T500 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
253236
|
Phoenix
|
Phoenix |
Micromex SE160T |
in Metrology Equipment
PHOENIX Micromex SE160T, 300mm, s/n: PA1529:PHOENIX_X-Ray Systems
|
1
|
|
Inquire |
|
Dresden, Saxony, Germany |
|
|
249037
|
RCS
|
RCS |
300PS-M100 |
in Metrology Equipment
RCS 300PS-M100, SN: B141PS-001, 300 mm:Semi Auto Pad Shave Tool RSV Automation PDS01
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
253450
|
Rigaku
|
Rigaku |
TXRF-V300 |
in Metrology Equipment
|
1
|
|
Inquire |
|
Dresden, Saxony, Germany |
|
|
254236
|
Rigaku
|
Rigaku |
TXRF-V310 |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Malta, New York, United States |
|
|
253031
|
Rudolph Technologies
|
Rudolph Technologies |
S3000-S |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
250932
|
Rudolph Research
|
Rudolph Research |
ws-3000hs |
in Metrology Equipment
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
254201
|
RVSI
|
RVSI |
ws3500/3800 upgrade |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Burlington, Vermont, United States |
|
|
254200
|
RVSI
|
RVSI |
ws3500/3800 upgrade |
in Metrology Equipment
|
1
|
|
Inquire |
N* |
Burlington, Vermont, United States |
|
|
254079
|
Sartorius
|
Sartorius |
LA310S |
in Metrology Equipment
Sartorius LA310S, s/n: 13110486:Scale for Weight Control
|
1
|
|
Inquire |
|
Dresden, Saxony, Germany |
|
|
248242
|
Tokyo Electron Ltd
|
Tokyo Electron Ltd |
P12XL |
in Metrology Equipment
TEL, P12XL, 300mm, s/n: PH04204:TEL P12XL Prober
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
254108
|
Zeiss
|
Zeiss |
NanoFab |
in Metrology Equipment
Zeiss NanoFab, s/n: 6015:Focus Ion Beam Mill
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|