Your search for Manufacturer: Applied Materials Inc
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12 Listing(s) with a matching description:

	Item ID	Photo	Short Description		Product Type / Details	#	Price	Notes	Location
	Item ID	Photo	Make	Model	Product Type / Details	#	Price	Notes	Location
							$
	198243	Applied Materials In	Applied Materials In	Endura2 CHAMBER RFTi	Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items	1	Inquire		Malta, New York, United States
	198243	Applied Materials In	Applied Materials In	Endura2 CHAMBER RFTi
Applied Materials, Endura2, 300mm, 2 x CHAMBERs, RFTi : Applied Materials, Endura2, 300mm, CHAMBER, RFTi Two Chambers
	198244	Applied Materials In	Applied Materials In	Chamber, Endura2, RF TiAl	Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items	1	Inquire		Malta, New York, United States
	198244	Applied Materials In	Applied Materials In	Chamber, Endura2, RF TiAl
Applied Materials, Endura2, 300mm, TWO CHAMBERs , RF TiAl/N: Applied Materials, Endura2, 300mm, CHAMBER, RF TiAl Two Chambers; 1 x RFPVD TiAl Chamber, 1 x RFPVD TiN Chamber
	199987	Applied Materials In	Applied Materials In	Endura2 SiCoNi Chamber	Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items	1	Inquire		Malta, New York, United States
	199987	Applied Materials In	Applied Materials In	Endura2 SiCoNi Chamber
AMAT, Endura2, SiCoNi, Process Chamber, 300mm: AMAT, Endura2, SiCoNi, Process Chamber, 300mm
	203111	Applied Materials In	Applied Materials In	Endura2 Chamber CVD ALD TiN	Other Items and Mixed Lots in Chambers, Components, Accessories and Other Items	1	Inquire		East Fishkill, New York, United States
	203111	Applied Materials In	Applied Materials In	Endura2 Chamber CVD ALD TiN
Applied Materials, Endura2, 300mm, CHAMBER, CVD ALD TiN: Applied Materials, Endura2, 300mm, CHAMBER, ALD TiN Removed. Shrink Wrapped.
	198240	Applied Materials In	Applied Materials In	Dfinder2	Particle Counters in Metrology Equipment	1	Inquire		Malta, New York, United States
	198240	Applied Materials In	Applied Materials In	Dfinder2
Applied Materials, DFinder2, 300mm Particle Counter,: Applied Materials, DFinder2, 300mm Particle Counter,
	202815	Applied Materials In	Applied Materials In	Dfinder2	Particle Counters in Metrology Equipment	1	Inquire		Malta, New York, United States
	202815	Applied Materials In	Applied Materials In	Dfinder2
Applied Materials, DFinder2, 300mm Particle Counter,: Applied Materials, DFinder2, 300mm Particle Counter,
	201155	Applied Materials In	Applied Materials In	SEMVision G3 Lite	Scanning Electron Microscopes in Microscopes, Optical Inspection	1	Inquire		Dresden, Saxony, Germany
	201155	Applied Materials In	Applied Materials In	SEMVision G3 Lite
SEMVision G3, Applied Materials, 300mm, Defect Review System: SEMVision G3, Applied Materials, 300mm, Defect Review System S/N : W-3002 Warm idle, in the Fab.
	201153	Applied Materials In	Applied Materials In	Centura RTP XE	Single Chamber RTP Tools in Wafer Fabrication Equipment	1	Inquire		Singapore, Singapore
	201153	Applied Materials In	Applied Materials In	Centura RTP XE
Applied Materials, Centura RTP XE, MOD1, 200mm: Applied Materials, Centura RTP XE, MOD1, 200mm<br /><br />2 Chamber, SMIF<br /><br />On line in the fab.<br /><br />S/N: ;;2979
	195483	Applied Materials In	Applied Materials In	Raider ECD	Wet Process Equipment - Other in Wafer Fabrication Equipment	1	Inquire		Malta, New York, United States
	195483	Applied Materials In	Applied Materials In	Raider ECD
Semitool, Plating, Raider ECD 300mm: Semitool, Plating, Raider ECD 300mm
	195979	Applied Materials In	Applied Materials In	Raider ECD 310	Wet Process Equipment - Other in Wafer Fabrication Equipment	1	Inquire		Dresden, Saxony, Germany
	195979	Applied Materials In	Applied Materials In	Raider ECD 310
Semitool, Plating, Raider ECD 310 300mm: Semitool, Plating, Raider ECD 310 300mm Cu, Sn, Ag plating system
	199708	Applied Materials In	Applied Materials In	Raider ECD	Wet Process Equipment - Other in Wafer Fabrication Equipment	1	Inquire		Dresden, Saxony, Germany
	199708	Applied Materials In	Applied Materials In	Raider ECD
Semitool, Plating, Raider ECD 300mm: Semitool, Plating, Raider ECD 300mm !!! Multiple Tools Available.... Please inquire !!!
	201826	Applied Materials In	Applied Materials In	Endura2	Wet Process Equipment - Other in Wafer Fabrication Equipment	1	Inquire		Seoul, South Korea
	201826	Applied Materials In	Applied Materials In	Endura2
Applied Materials, Endura2, 300mm, Co/TTN, PVD Depositon: Applied Materials, Endura2, 300mm, Co/TTN, PVD Depositon 2x DG / 2x Std Co / 2x DS TTN S/N : 409621 80% Refurbished

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

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Wafer Fabrication Equipment
Metrology Equipment
Laboratory Equipment
Reliability and Material Test Equipment
Automatic Test Equipment
Chambers, Components, Accessories and Other Items

ALL CATEGORIES

Applied Materials In

Endura2 CHAMBER RFTi

in Chambers, Components, Accessories and Other Items

Applied Materials In

Chamber, Endura2, RF TiAl

in Chambers, Components, Accessories and Other Items

Applied Materials In

Endura2 SiCoNi Chamber

in Chambers, Components, Accessories and Other Items

Applied Materials In

Endura2 Chamber CVD ALD TiN

in Chambers, Components, Accessories and Other Items

Applied Materials In

Dfinder2

in Metrology Equipment

Applied Materials, DFinder2, 300mm Particle Counter,

Applied Materials In

Dfinder2

in Metrology Equipment

Applied Materials, DFinder2, 300mm Particle Counter,

Applied Materials In

SEMVision G3 Lite

in Microscopes, Optical Inspection

SEMVision G3, Applied Materials, 300mm, Defect Review SystemS/N : W-3002Warm idle, in the Fab.

Applied Materials In

Centura RTP XE

in Wafer Fabrication Equipment

Applied Materials In

Raider ECD

in Wafer Fabrication Equipment

Semitool, Plating, Raider ECD 300mm

Applied Materials In

Raider ECD 310

in Wafer Fabrication Equipment

Semitool, Plating, Raider ECD 310 300mmCu, Sn, Ag plating system

Applied Materials In

Raider ECD

in Wafer Fabrication Equipment

Applied Materials In

Endura2

in Wafer Fabrication Equipment

SEMVision G3, Applied Materials, 300mm, Defect Review System

S/N : W-3002

Warm idle, in the Fab.

Semitool, Plating, Raider ECD 310 300mm

Cu, Sn, Ag plating system