|
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
Make |
Model |
|
|
$ |
|
|
248208
|
Applied Materials
|
Applied Materials |
G3 Lite |
in Microscopes, Optical Inspection
AMAT, G3 Lite, 300mm, S/N W3041:AMAT, G3 Lite, 300mm, S/N W3041
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
204911
|
Applied Materials
|
Applied Materials |
Uvision 5 |
in Microscopes, Optical Inspection
Applied Materials, Uvision5, Bright Field Inspection, 300mm:Applied Materials, Uvision5, Bright Field Inspection, 300mm In the fab, Idle
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
209828
|
Bruker, D8FABLINE, 300mm, X-Ray Metrology
|
Bruker, D8FABLINE, 300mm, X-Ray Metrology |
in Microscopes, Optical Inspection
Bruker, D8FABLINE, 300mm, X-Ray Metrology:Bruker, D8FABLINE, 300mm, X-Ray Metrology
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
230317
|
FEI
|
FEI |
ExSolve CLM next Gen |
in Microscopes, Optical Inspection
FEI, ExSolve CLM next Gen, 300mm, S/N 9923535:FEI, ExSolve CLM next Gen, 300mm, S/N 9923535
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
230318
|
FEI
|
FEI |
ExSolve CLM next Gen |
in Microscopes, Optical Inspection
FEI, ExSolve CLM next Gen, 300mm, S/N 9923609:FEI, ExSolve CLM next Gen, 300mm, S/N 9923609
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
237745
|
HMI
|
HMI |
eScan 500 |
in Microscopes, Optical Inspection
HMI eScan 500, sn: ML07114, Defect Review, 300mm:HMI eScan 500, sn: ML07114, Defect Review, 300mm
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
202816
|
HSEB
|
HSEB |
Axiospect 301 |
in Microscopes, Optical Inspection
HSEB, Axiospect 301, Optical Microscope, 300mm:HSEB, Axiospect 301, Optical Microscope, 300mm Cold. Not working parts include: - Tango Controller (Microscope Stage controller
- Joystick and keyboard controller
- Micromotor for fingers edge gripper
- few powers supplies
The tool was running with Windows XP professional 2002 service pack 3.
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
202817
|
HSEB
|
HSEB |
Axiospect 301 |
in Microscopes, Optical Inspection
HSEB, Axiospect 301, Optical Microscope, 300mm:HSEB, Axiospect 301, Optical Microscope, 300mm
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
237748
|
KLA-Tencor
|
KLA-Tencor |
AMI2900 |
in Microscopes, Optical Inspection
KLA AMI2900, sn: V000283, 300mm:KLA AMI2900, sn: V000283, 300mm KLA Advanced Macro Inspection Module
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
241510
|
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm
|
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm |
in Microscopes, Optical Inspection
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm:NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
245895
|
RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa
|
RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa |
in Microscopes, Optical Inspection
RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa:RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa RVSI VISUAL DEFECT SCANNER
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
245894
|
RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra
|
RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra |
in Microscopes, Optical Inspection
RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra:RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra inspection scanner
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
244284
|
Zeiss
|
Zeiss |
Merlin |
in Microscopes, Optical Inspection
ZEISS, Merlin, sn: 4234, Zeiss Merlin Scanning Electron Microscope:ZEISS, Merlin, sn: 4234, Zeiss Merlin Scanning Electron Microscope
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
|