 |
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
| Make |
Model |
| |
|
$ |
|
 |
212147
|
KLA-Tencor
|
KLA-Tencor |
SLF576, TeraScan |
in Metrology Equipment
KLA-Tencor, Starlight, SLF576, TeraScan, Reticle Inspection Tool, :KLA-Tencor, SLF576, TeraScan, Reticle Inspection Tool, Known Faulty parts: | Part Number | Description | QTY | | | Laser head | 1 | | | Boxster board | 2 | | | UIC1 power supply | 1 | | | Fork assembly | 1 | | | IAF preamp enclosure | 1 | | 740-393655-000 | FRU,MODULE BEAM STAB | 1 | | 740-393658-000 | FRU,MODULE HOMOGENIZ | 1 | | 0252978-003 | FRU,MODULE,DIFFUSER,XR,5XX | 1 | | 740-393656-001 | FRU,MODULE LIGHT LEVEL / CTRL,5XX | 1 |
S/N : 5XX 5016
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
|
204277
|
KLA-Tencor
|
KLA-Tencor |
3905 |
in Microscopes, Optical Inspection
KLA-Tencor 3905, 300mm, Broadband Plasma Patterned Wafer Inspection :KLA-Tencor 3905, 300mm, Broadband Plasma Patterned Wafer Inspection Power OFF. Under N2 Purge. 
remarketing@surplusglobal.com
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
204281
|
KLA-Tencor
|
KLA-Tencor |
3905 |
in Microscopes, Optical Inspection
KLA-Tencor 3905, 300mm, Broadband Plasma Patterned Wafer Inspection :KLA-Tencor 3905, 300mm, Broadband Plasma Patterned Wafer Inspection Power Off. Under N2 Purge.
remarketing@surplusglobal.com
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
204911
|
KLA-Tencor
|
KLA-Tencor |
Uvision 5 |
in Microscopes, Optical Inspection
Applied Materials, Uvision5, Bright Field Inspection, 300mm:Applied Materials, Uvision5, Bright Field Inspection, 300mm In the fab, Idle
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
189683
|
KLA-Tencor
|
KLA-Tencor |
CRS1010 Review Station |
in Metrology Equipment
KLA- Tencor, Review Station, CRS1010, 200mm:KLA- Tencor, Review Station, CRS1010, 200mm
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
204283
|
KLA-Tencor
|
KLA-Tencor |
Viper 2435 |
in Metrology Equipment
KLA - Tencor, Viper 2435, Macro Defect Detection System, 300mm:KLA - Tencor, Viper, Macro Defect Detection System, 300mm
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
204284
|
KLA-Tencor
|
KLA-Tencor |
Viper 2438 |
in Metrology Equipment
KLA - Tencor, Viper2438, Macro Defect Detection System, 300mm:KLA - Tencor, Viper 2438, Macro Defect Detection System, 300mm Bagged & Skidded in Warehouse
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
178304
|
KLA-Tencor
|
KLA-Tencor |
ES31 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
178305
|
KLA-Tencor
|
KLA-Tencor |
ES32 |
in Microscopes, Optical Inspection
KLA-Tencor, ES32, E-beam Inspection, 300mm:Manufactured in 2007; Status: Bagged and Skidded
!!! MULTIPLE UNITS AVAILABLE!!! Please inquire
|
1
|
|
Inquire |
|
Taichung, Taichung City, Taiwan |
|
|
215849
|
KLA-Tencor
|
KLA-Tencor |
P2 Data Prep Station, |
in Metrology Equipment
KLA-Tencor, DP2 Data Prep Station, IPRO Data Prep:KLA-Tencor, DP2 Data Prep Station, IPRO Data Prep Deinstalled Vintage : 2012
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
|
Log in
View
Search-by-Specs 
reference document attached
Group Listings into sub-categories 
