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FULL DESCRIPTION of Item 211894

in Other Microscopes
Item ID: 211894

Offered 1 Offered Inquire


FEI, CLM + Dual Beam FIB, TEM Sample Prep tool

FEI, CLM + Dual Beam FIB, TEM Sample Prep tool

Installed.  Idle.

Tool ID: 32N0120DA

FEI, CLM + Dual Beam FIB, TEM Sample Prep tool

Location: East Fishkill, New York, United States
Unit Price Inquire
Number of Units 1
Manufacturer FEI
Model CLM 3D
Description FEI CLM-3D SEM/DUAL BEAM FIB
Extended Description  Details at 32N0120DA.pdf

Shipping & Handling:

All freight cost estimates are for dock to dock service only.
Any additional services, i.e. lift-gate, inside or residential delivery, must be requested at the time of sale and will be billed accordingly.
GLOBALFOUNDRIES is not responsible for any damage incurred during shipment. It is the buyer's responsibility to inspect packages for damage and to note any damage on bill of lading.
 
Payment:

All other sales, including foreign sales, are prepayment only.
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