Your reliable source for surplus semiconductor equipment!
 Fast  FIND      full search   tips    
SPECIALS LISTINGS About Us Contact Us
Serving  Our Guest Log in    Register to manage deal making
ALL CATEGORIES   Metrology Equipment   Microscopes, Optical Inspection    View    Search-by-Specs   

FULL DESCRIPTION of Item 199447

in Other Microscope Inspection Items
Item ID: 199447

Offered 1 Offered Inquire


Bruker, D8FABLINE, 300mm, X-Ray Metrology

Bruker, D8FABLINE, 300mm, X-Ray Metrology

S/N 204500

2009 

The tool is an automated High resolution X-ray diffractometer, clean room
(class 1 US-FED-STD 209 or Class 2 ISO 14644-1) compatible, with full 300
mm wafer mapping capabilities.
The D8 FABLINE consists of two stainless steal cabinets attached to each
other.
The first one is an X-ray analytical module composed of: radiation safe
enclosure, vertical D8 goniometer, UMC 300mm wafer stage and dedicated
optical set-ups, and all required supplies. The second is a handling module
Equipment Front End Module (EFEM) Bridge tool Startan from Asyst.The wafers
are carried either in FOUP (Front Opening Unified Pod) for 300mm or in FOUP
[INVALID] for 200mm..
remarketing@surplusglobal.com

Tool ID: KZD1

 Bruker, D8FABLINE, 300mm, X-Ray Metrology

Location: East Fishkill, New York, United States
Unit Price Inquire
Number of Units 1
Manufacturer Bruker
Model D8 Fabline
Description Xray Metrology
Extended Description  Details at KZD1.pdf

Shipping & Handling:

All freight cost estimates are for dock to dock service only.
Any additional services, i.e. lift-gate, inside or residential delivery, must be requested at the time of sale and will be billed accordingly.
GLOBALFOUNDRIES is not responsible for any damage incurred during shipment. It is the buyer's responsibility to inspect packages for damage and to note any damage on bill of lading.
 
Payment:

All other sales, including foreign sales, are prepayment only.
MasterCard, VISA, Discover and AMEX are accepted at sellers discretion.