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Offered Inquire

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM
MULTIPLE UNITS AVAILBLE. PLEASE INQUIRE.
SEM - Critical Dimension (CD) Measurement Currently configured for 300mm wafers CE Marked Install Type: Stand Alone Cassette Interface: • (3) 300mm FOUP Roll-Around Ergo-Station w/Touch-Screen Status Lamp Options: • Slope Reconstruction • CH Analysis • Profile Grade • Discrete Inspection • Defect Review • ARAMS (ES8) Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz Software Options: • Slope Reconstruction • CH Analysis • Profile Grade • Discrete Inspection • Defect Review • ARAMS (ES8
Tool ID: KA07
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