Your reliable source for surplus semiconductor equipment!
 Fast  FIND      full search   tips    
SPECIALS LISTINGS About Us Contact Us
Serving  Our Guest Log in    Register to manage deal making
ALL CATEGORIES   Metrology Equipment   Microscopes, Optical Inspection    View    Search-by-Specs   

FULL DESCRIPTION of Item 180474

in Critical Dimension Scanning Electron Microscopes
Item ID: 180474

Offered 1 Offered Inquire


Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

MULTIPLE UNITS AVAILBLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

Tool ID: KA07

 Applied Materials NanoSEM 3D, 300mm wafers, CD SEM
  Click to see additional image(s)... other image

Location: East Fishkill, NY, United States
Unit Price Inquire
Number of Units 1
Manufacturer Applied Materials
Model NanoSEM 3D
Wafer Size Range 
  Set Size 300 mm
Year of Manufacture 2002
Condition Excellent

Shipping & Handling:

All freight cost estimates are for dock to dock service only.
Any additional services, i.e. lift-gate, inside or residential delivery, must be requested at the time of sale and will be billed accordingly.
GLOBALFOUNDRIES is not responsible for any damage incurred during shipment. It is the buyer's responsibility to inspect packages for damage and to note any damage on bill of lading.
 
Payment:

All other sales, including foreign sales, are prepayment only.
MasterCard, VISA, Discover and AMEX are accepted at sellers discretion.