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Your search for Manufacturer: FEI
found:
  • 7 Listing(s) with a matching description:
 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
195353
FEI  

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, DA300, 300mm, FIB, Defect Analysis:

FEI, DA300, 300mm, FIB, Defect Analysis

S/N : D253


 1 Inquire Taichung, Taichung City, Taiwan
202147
FEI  

FEI  

Ex-Situ Plucker 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

S/N : 4471-03-05

2009 Vintage

 1 Inquire East Fishkill, New York, United States
202148
FEI  

FEI  

CLM 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, CLM, TEM Sample Prep tool:

FEI, CLM, TEM Sample Prep tool

 

FEI CLM-3D SEM/DUAL BEAM FIB REFURB - TEM Preparation Tool

 

Cold Shutdown in the lab

 1 Inquire East Fishkill, New York, United States
203114
FEI  

FEI  

TEMLINK - KY02, 14771-003 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, Ex-Situ Plucker, TEM Prep ToolFEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

 

 1 Inquire East Fishkill, New York, United States
211893
FEI  

FEI  

TEMLINK 14771-003 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, TEM Link, 14771-003, :

FEI, TEM Link, 14771-003, 

S/N : 4471-03-06

 1 Inquire East Fishkill, New York, United States
211894
FEI  

FEI  

CLM 3D 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, CLM + Dual Beam FIB, TEM Sample Prep tool:

FEI, CLM + Dual Beam FIB, TEM Sample Prep tool

Installed.  Idle.

 1 Inquire East Fishkill, New York, United States
211546
FEI  

FEI  

Meridian-IV 

List all items of this typeScientific and Laboratory Equipment - Other

in Metrology Equipment

FEI, Meridian-IV, Fault localization and analysis:

FEI, Meridian-IV, Fault localization and analysis

 1 Inquire Singapore, Singapore

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.