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Your search for Manufacturer: FEI
found:
  • 17 Listing(s) with a matching description:
 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
195353
FEI  

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, DA300, 300mm, FIB, Defect Analysis:
FEI, DA300, 300mm, FIB, Defect Analysis

S/N : D253


1 Inquire Taichung, Taichung City, Taiwan
202147
FEI  

FEI  

Ex-Situ Plucker 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

S/N : 4471-03-05

2009 Vintage

1 Inquire East Fishkill, New York, United States
202148
FEI  

FEI  

CLM 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, CLM, TEM Sample Prep tool:

FEI, CLM, TEM Sample Prep tool

 

FEI CLM-3D SEM/DUAL BEAM FIB REFURB - TEM Preparation Tool

 

Cold Shutdown in the lab

1 Inquire East Fishkill, New York, United States
202837
FEI  

FEI  

Strata FIB 205 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, Strata FIB 205, TEM Sample Preparation:

FEI, Strata FIB 205, TEM Sample Preparation

 

remarketing@surplusglobal.com

1 Inquire Singapore, Singapore
202853
FEI  

FEI  

FIB 200  

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, FIB, 200, TEM Sample Preparation:

FEI, FIB, 200, TEM Sample Preparation

in QRA Lab

 

1 Inquire Singapore, Singapore
202880
FEI  

FEI  

PHILIPS XL30S, SEM 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI PHILIPS XL30S, SEM:

FEI PHILIPS XL30S, SEM

 

PHILIPS XL 30S FEG SEM & DX4I SYSTEM

1 Inquire Singapore, Singapore
202895
FEI  

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, DA300, FIB, TEM Sample Preparation:

FEI, DA300, FIB, TEM Sample Preparation

 

In RQA Lab.  Unhooked

 

1 Inquire Singapore, Singapore
203114
FEI  

FEI  

TEMLINK - KY02, 14771-003 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, Ex-Situ Plucker, TEM Prep ToolFEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

 

1 Inquire East Fishkill, New York, United States
203116
FEI  

FEI  

CLM + Dual Beam 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, CLM + Dual Beam FIB, TEM Sample Prep tool:

FEI, CLM + Dual Beam FIB, TEM Sample Prep tool

In Lab.  Idle

1 Inquire Malta, New York, United States
203117
FEI  

FEI  

ExSolve 2 WTP EFEM 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB:

FEI,  ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB

In the fab.  Warm shutdown.

remarketing@surplusglobal.com

1 Inquire Malta, New York, United States
203118
FEI  

FEI  

TEM LINK 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, TEM Link:

FEI, TEM Link

1 Inquire Malta, New York, United States
203120
FEI  

FEI  

Technia G2 F20 TEM 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, TEM Tecnai G2 F20, TEM,:

FEI, TEM Tecnai G2 F20, TEM

remarketing@surplusglobal.com

1 Inquire Malta, New York, United States
203121
FEI  

FEI  

Tecnai G2 F20 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, TEM Tecnai G2 F20, TEM,:

FEI, TEM Tecnai G2 F20, TEM,

 

On line, operational

remarketing@surplusglobal.com

1 Inquire Malta, New York, United States
205917
FEI  

FEI  

V600 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, V600, 4022 262 70111, Single Beam FIB, :

FEI, V600, 4022 262 70111, Single Beam FIB, 

 S/N: D3019

In Lab.  Idle

2007 Vintage.

Maintenance was done by FEI

1 Inquire East Fishkill, New York, United States
199704
FEI  

FEI  

EXPIDA 

List all items of this typeScanning Electron Microscopes

in Microscopes, Optical Inspection

FEI, EXPIDA, Dual Beam FIB, 300mm :

FEI, EXPIDA, Dual Beam FIB, 300mm 

COLD.  Off Line


remarketing@surplusglobal.com

1 Inquire F* Dresden, Saxony, Germany
206667
FEI  

FEI  

835 

List all items of this typeScientific and Laboratory Equipment - Other

in Metrology Equipment

FEI, 835, Full Wafer Dual Beam FIB, 200mm :

FEI, 835, Full Wafer Dual Beam FIB, 200mm

Cold idle in Lab.

 

1999 Vintage

S/N : 994701

1 Inquire F* Burlington, Vermont, United States
206668
FEI  

FEI  

200 

List all items of this typeScientific and Laboratory Equipment - Other

in Metrology Equipment

FEI, 200, FIB:

FEI, 200, FIB

 

Cold idle in Lab.

2000 vinatage.

1 Inquire F* Burlington, Vermont, United States

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.