 |
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
Make |
Model |
|
|
$ |
|
 |
230317
|
FEI
|
FEI |
ExSolve CLM next Gen |
in Microscopes, Optical Inspection
FEI, ExSolve CLM next Gen, 300mm, S/N 9923535:FEI, ExSolve CLM next Gen, 300mm, S/N 9923535
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
230318
|
FEI
|
FEI |
ExSolve CLM next Gen |
in Microscopes, Optical Inspection
FEI, ExSolve CLM next Gen, 300mm, S/N 9923609:FEI, ExSolve CLM next Gen, 300mm, S/N 9923609
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
244283
|
FEI
|
FEI |
Helios NanoLab 1200HP |
in Wafer Fabrication Equipment
FEI, Helios NanoLab 1200HP, sn: 9921505, Failure Analysis:FEI, Helios NanoLab 1200HP, sn: 9921505, Failure Analysis
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
244286
|
FEI
|
FEI |
Titan cubed G2 60-300 |
in Microscopes, Optical Inspection
FEI, Titan cubed G2 60-300, sn: 9920142/D3205, Electron Microscope:FEI, Titan cubed G2 60-300, sn: 9920142/D3205, Electron Microscope
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
219850
|
FEI
|
FEI |
CLM3D |
in Metrology Equipment
FEI, CLM3D, 300mm, S/N CLM000070, FIB:FEI, CLM3D, 300mm, S/N CLM000070, FIB
|
1
|
|
Inquire |
 |
East Fishkill, New York, United States |
|
|
 |