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Your search for Manufacturer: FEI
found:
  • 6 Listing(s) with a matching description:
 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
195353
FEI  

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

1 Inquire Taichung, Taichung City, Taiwan
FEI, DA300, 300mm, FIB, Defect Analysis:
FEI, DA300, 300mm, FIB, Defect Analysis

S/N : D253


199967
FEI  

FEI  

Titan 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

1 Inquire East Fishkill, New York, United States
FEI, TITAN, Advanced Analytical TEM, :
FEI, TITAN, Advanced Analytical TEM, 

S/N : SN#D3209
202147
FEI  

FEI  

Ex-Situ Plucker 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

1 Inquire East Fishkill, New York, United States
FEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

S/N : 4471-03-05

2009 Vintage

202148
FEI  

FEI  

CLM 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

1 Inquire East Fishkill, New York, United States
FEI, CLM, TEM Sample Prep tool:

FEI, CLM, TEM Sample Prep tool

 

FEI CLM-3D SEM/DUAL BEAM FIB REFURB - TEM Preparation Tool

 

Cold Shutdown in the lab

199704
FEI  

FEI  

EXPIDA 

List all items of this typeScanning Electron Microscopes

in Microscopes, Optical Inspection

1 Inquire F* Dresden, Saxony, Germany
FEI, EXPIDA, Dual Beam FIB, 300mm :
FEI, EXPIDA, Dual Beam FIB, 300mm 

COLD.  Off Line


202496
FEI  

FEI  

Helios 600 NanoLab 

List all items of this typeScientific and Laboratory Equipment - Other

in Metrology Equipment

1 Inquire Dresden, Saxony, Germany
FEI, Helios 600, NanoLab, Dual Beam FIB, :

FEI, Helios 600 NanoLab, Dual Beam FIB

 

S/N : D404

 

Vintage : 2009 

 

 

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.