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Your search for Manufacturer: FEI
found:
  • 18 Listing(s) with a matching description:
 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
195353
FEI  

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, DA300, 300mm, FIB, Defect Analysis:
FEI, DA300, 300mm, FIB, Defect Analysis

S/N : D253


 1 Inquire Taichung, Taichung City, Taiwan
202147
FEI  

FEI  

Ex-Situ Plucker 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

S/N : 4471-03-05

2009 Vintage

 1 Inquire East Fishkill, New York, United States
202148
FEI  

FEI  

CLM 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, CLM, TEM Sample Prep tool:

FEI, CLM, TEM Sample Prep tool

 

FEI CLM-3D SEM/DUAL BEAM FIB REFURB - TEM Preparation Tool

 

Cold Shutdown in the lab

 1 Inquire East Fishkill, New York, United States
202837
FEI  

FEI  

Strata FIB 205 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, Strata FIB 205, TEM Sample Preparation:

FEI, Strata FIB 205, TEM Sample Preparation

 1 Inquire Singapore, Singapore
202853
FEI  

FEI  

FIB 200  

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, FIB, 200, TEM Sample Preparation:

FEI, FIB, 200, TEM Sample Preparation

in QRA Lab

 

 1 Inquire Singapore, Singapore
202880
FEI  

FEI  

PHILIPS XL30S, SEM 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI PHILIPS XL30S, SEM:

FEI PHILIPS XL30S, SEM

 

PHILIPS XL 30S FEG SEM & DX4I SYSTEM

 1 Inquire Singapore, Singapore
202895
FEI  

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, DA300, FIB, TEM Sample Preparation:

FEI, DA300, FIB, TEM Sample Preparation

 

In RQA Lab.  Unhooked

 

 1 Inquire Singapore, Singapore
203114
FEI  

FEI  

TEMLINK - KY02, 14771-003 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, Ex-Situ Plucker, TEM Prep ToolFEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

 

 1 Inquire East Fishkill, New York, United States
203115
FEI  

FEI  

CLM 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, CLM, TEM Sample Prep tool:

FEI, CLM, TEM Sample Prep tool

 

Connected Idle.

 

 1 Inquire Malta, New York, United States
203116
FEI  

FEI  

CLM + Dual Beam 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, CLM + Dual Beam FIB, TEM Sample Prep tool:

FEI, CLM + Dual Beam FIB, TEM Sample Prep tool

In Lab.  Idle

 1 Inquire Malta, New York, United States
203117
FEI  

FEI  

ExSolve 2 WTP EFEM 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB:

FEI,  ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB

In the fab.  Warm shutdown.

 1 Inquire Malta, New York, United States
203118
FEI  

FEI  

TEM LINK 

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in Microscopes, Optical Inspection

FEI, TEM Link:

FEI, TEM Link

 1 Inquire F* Malta, New York, United States
203120
FEI  

FEI  

Technia G2 F20 TEM 

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in Microscopes, Optical Inspection

FEI, TEM Tecnai G2 F20, TEM,:

FEI, TEM Tecnai G2 F20, TEM

,

 1 Inquire Malta, New York, United States
203121
FEI  

FEI  

Tecnai G2 F20 

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in Microscopes, Optical Inspection

FEI, TEM Tecnai G2 F20, TEM,:

FEI, TEM Tecnai G2 F20, TEM,

 

On line, operational

 1 Inquire Malta, New York, United States
199704
FEI  

FEI  

EXPIDA 

List all items of this typeScanning Electron Microscopes

in Microscopes, Optical Inspection

FEI, EXPIDA, Dual Beam FIB, 300mm :
FEI, EXPIDA, Dual Beam FIB, 300mm 

COLD.  Off Line


 1 Inquire F* Dresden, Saxony, Germany
202496
FEI  

FEI  

Helios 600 NanoLab 

List all items of this typeScientific and Laboratory Equipment - Other

in Metrology Equipment

FEI, Helios 600, NanoLab, Dual Beam FIB, :

FEI, Helios 600 NanoLab, Dual Beam FIB

 

S/N : D404

 

Vintage : 2009 

 

 

 1 Inquire Dresden, Saxony, Germany
203122
FEI  

FEI  

Helios 400 

List all items of this typeScientific and Laboratory Equipment - Other

in Metrology Equipment

FEI, Helios 400, NanoLab Dual Beam FIB :

FEI, Helios 400, NanoLab Dual Beam FIB 

 1 Inquire Malta, New York, United States
203283
FEI  

FEI  

Helios 400 

List all items of this typeScientific and Laboratory Equipment - Other

in Metrology Equipment

FEI, Helios 400, NanoLab Dual Beam FIB :

FEI, Helios 400, NanoLab Dual Beam FIB 

 

 1 Inquire East Fishkill, New York, United States

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.