 |
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
Make |
Model |
|
|
$ |
|
 |
202147
|
FEI
|
FEI |
Ex-Situ Plucker |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
East Fishkill, New York, United States |
|
 |
203114
|
FEI
|
FEI |
TEMLINK - KY02, 14771-003 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
East Fishkill, New York, United States |
|
 |
203117
|
FEI
|
FEI |
ExSolve 2 WTP EFEM |
in Microscopes, Optical Inspection
FEI, ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB:FEI, ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB In the fab. Warm shutdown. 
remarketing@surplusglobal.com
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
203120
|
FEI
|
FEI |
Technia G2 F20 TEM |
in Microscopes, Optical Inspection
FEI, TEM Tecnai G2 F20, TEM,:FEI, TEM Tecnai G2 F20, TEM
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
230317
|
FEI
|
FEI |
ExSolve CLM next Gen |
in Microscopes, Optical Inspection
FEI, ExSolve CLM next Gen, 300mm, S/N 9923535:FEI, ExSolve CLM next Gen, 300mm, S/N 9923535
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
230318
|
FEI
|
FEI |
ExSolve CLM next Gen |
in Microscopes, Optical Inspection
FEI, ExSolve CLM next Gen, 300mm, S/N 9923609:FEI, ExSolve CLM next Gen, 300mm, S/N 9923609
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
230561
|
FEI
|
FEI |
TEMLink 150 |
in Microscopes, Optical Inspection
FEI, TEMLink 150, 300mm, S/N 4471-03-14:FEI, TEMLink 150, 300mm, S/N 4471-03-14
|
1
|
|
Inquire |
 |
Malta, New York, United States |
|
 |
230847
|
Fein Focus
|
Fein Focus |
FOX 160.25 |
in Metrology Equipment
Fein Focus, FOX 160.25, 300mm. S/N 112540 1764:Fein Focus, FOX 160.25, 300mm. S/N 112540 1764
|
1
|
|
Inquire |
N* |
East Fishkill, New York, United States |
|
 |
225318
|
FEI
|
FEI |
QUANTA 600F |
in Microscopes, Optical Inspection
FEI, QUANTA 600F, S/N QFV17 / D8086:FEI, QUANTA 600F, S/N QFV17 / D8086
|
1
|
|
Inquire |
 |
East Fishkill, New York, United States |
|
 |
227826
|
FEI
|
FEI |
FP5600 30 Titan80-300 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
211546
|
FEI
|
FEI |
Meridian-IV |
in Metrology Equipment
FEI, Meridian-IV, Fault localization and analysis:FEI, Meridian-IV, Fault localization and analysis
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
 |
219850
|
FEI
|
FEI |
CLM3D |
in Metrology Equipment
FEI, CLM3D, 300mm, S/N CLM000070, FIB:FEI, CLM3D, 300mm, S/N CLM000070, FIB
|
1
|
|
Inquire |
 |
East Fishkill, New York, United States |
|
 |
219851
|
FEI
|
FEI |
EX SITU PLUCKER |
in Metrology Equipment
|
1
|
|
Inquire |
 |
East Fishkill, New York, United States |
|
 |
221460
|
FEI
|
FEI |
300 |
in Metrology Equipment
FEI, 300, 300mm, S/N D234, FIB:FEI, 300, 300mm, S/N D234, FIB
|
1
|
|
Inquire |
 |
East Fishkill, New York, United States |
|
 |
225329
|
FEI
|
FEI |
Taipan |
in Metrology Equipment
FEI, Taipan, S/N 9940056:FEI, Taipan, S/N 9940056
|
1
|
|
Inquire |
 |
East Fishkill, New York, United States |
|
|
 |