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Your search for Manufacturer: FEI
found:
  • 15 Listing(s) with a matching description:
 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
195353
FEI  

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, DA300, 300mm, FIB, Defect Analysis:

FEI, DA300, 300mm, FIB, Defect Analysis

S/N : D253


1 Inquire Taichung, Taichung City, Taiwan
202147
FEI  

FEI  

Ex-Situ Plucker 

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in Microscopes, Optical Inspection

FEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

S/N : 4471-03-05

2009 Vintage

1 Inquire East Fishkill, New York, United States
202148
FEI  

FEI  

CLM 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

FEI, CLM, TEM Sample Prep tool:

FEI, CLM, TEM Sample Prep tool

 

FEI CLM-3D SEM/DUAL BEAM FIB REFURB - TEM Preparation Tool

 

Cold Shutdown in the lab

1 Inquire East Fishkill, New York, United States
202837
FEI  

FEI  

Strata FIB 205 

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in Microscopes, Optical Inspection

FEI, Strata FIB 205, TEM Sample Preparation:

FEI, Strata FIB 205, TEM Sample Preparation

 

remarketing@surplusglobal.com

1 Inquire Singapore, Singapore
202853
FEI  

FEI  

FIB 200  

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in Microscopes, Optical Inspection

FEI, FIB, 200, TEM Sample Preparation:

FEI, FIB, 200, TEM Sample Preparation

in QRA Lab

 

1 Inquire Singapore, Singapore
202880
FEI  

FEI  

PHILIPS XL30S, SEM 

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in Microscopes, Optical Inspection

FEI PHILIPS XL30S, SEM:

FEI PHILIPS XL30S, SEM

 

PHILIPS XL 30S FEG SEM & DX4I SYSTEM

1 Inquire Singapore, Singapore
203114
FEI  

FEI  

TEMLINK - KY02, 14771-003 

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in Microscopes, Optical Inspection

FEI, Ex-Situ Plucker, TEM Prep ToolFEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

 

1 Inquire East Fishkill, New York, United States
205917
FEI  

FEI  

V600 

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in Microscopes, Optical Inspection

FEI, V600, 4022 262 70111, Single Beam FIB, :

FEI, V600, 4022 262 70111, Single Beam FIB, 

 S/N: D3019

In Lab.  Idle

2007 Vintage.

Maintenance was done by FEI

GIS - 

Tungsten Hexacarbonyl
Iodine
Magnesium Sulfate 7-Hydrate
Xeon Difluoride GIS injector removed for tool decon!
 
 
 
1 Inquire East Fishkill, New York, United States
210388
FEI  

FEI  

Micrion 2500 

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in Microscopes, Optical Inspection

FEI, Micrion 2500, FIB:

FEI, Micrion 2500, FIB

 

Installed.  Idle.

 

S/N : M2051

1 Inquire Burlington, Vermont, United States
210390
FEI  

FEI  

Micrion 9000 

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in Microscopes, Optical Inspection

FEI, Micrion 9000, FIB:

FEI, Micrion 9000, FIB

Installed.  Idle

S/N : M9023

1 Inquire Burlington, Vermont, United States
210391
FEI  

FEI  

Micrion 2500 

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in Microscopes, Optical Inspection

FEI, Micrion 2500, FIB:

FEI, Micrion 2500, FIB

Installed.  Idle.

S/N : M2051

1 Inquire Burlington, Vermont, United States
211893
FEI  

FEI  

TEMLINK 14771-003 

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in Microscopes, Optical Inspection

FEI, TEM Link, 14771-003, :

FEI, TEM Link, 14771-003, 

S/N : 4471-03-06

1 Inquire F* East Fishkill, New York, United States
211894
FEI  

FEI  

CLM 3D 

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in Microscopes, Optical Inspection

FEI, CLM + Dual Beam FIB, TEM Sample Prep tool:

FEI, CLM + Dual Beam FIB, TEM Sample Prep tool

Installed.  Idle.

1 Inquire East Fishkill, New York, United States
206667
FEI  

FEI  

835 

List all items of this typeScientific and Laboratory Equipment - Other

in Metrology Equipment

FEI, 835, Full Wafer Dual Beam FIB, 200mm :

FEI, 835, Full Wafer Dual Beam FIB, 200mm

Cold idle in Lab.

 

1999 Vintage

S/N : 994701

1 Inquire F* Burlington, Vermont, United States
211546
FEI  

FEI  

Meridian-IV 

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in Metrology Equipment

FEI, Meridian-IV, Fault localization and analysis:

FEI, Meridian-IV, Fault localization and analysis

1 Inquire Singapore, Singapore

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.