 |
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
Make |
Model |
|
|
$ |
|
 |
195353
|
FEI
|
FEI |
DA300 |
in Microscopes, Optical Inspection
FEI, DA300, 300mm, FIB, Defect Analysis:FEI, DA300, 300mm, FIB, Defect Analysis
S/N : D253
|
1
|
|
Inquire |
|
Taichung, Taichung City, Taiwan |
|
 |
202147
|
FEI
|
FEI |
Ex-Situ Plucker |
in Microscopes, Optical Inspection
FEI, Ex-Situ Plucker, TEM Prep Tool:FEI, Ex-Situ Plucker, TEM Prep Tool S/N : 4471-03-05 2009 Vintage
|
1
|
|
Inquire |
 |
East Fishkill, New York, United States |
|
 |
202148
|
FEI
|
FEI |
CLM |
in Microscopes, Optical Inspection
FEI, CLM, TEM Sample Prep tool:FEI, CLM, TEM Sample Prep tool FEI CLM-3D SEM/DUAL BEAM FIB REFURB - TEM Preparation Tool Cold Shutdown in the lab
|
1
|
|
Inquire |
 |
East Fishkill, New York, United States |
|
 |
203114
|
FEI
|
FEI |
TEMLINK - KY02, 14771-003 |
in Microscopes, Optical Inspection
FEI, Ex-Situ Plucker, TEM Prep ToolFEI, Ex-Situ Plucker, TEM Prep Tool:FEI, Ex-Situ Plucker, TEM Prep Tool
|
1
|
|
Inquire |
 |
East Fishkill, New York, United States |
|
 |
211893
|
FEI
|
FEI |
TEMLINK 14771-003 |
in Microscopes, Optical Inspection
FEI, TEM Link, 14771-003, :FEI, TEM Link, 14771-003, S/N : 4471-03-06
|
1
|
|
Inquire |
 |
East Fishkill, New York, United States |
|
 |
211894
|
FEI
|
FEI |
CLM 3D |
in Microscopes, Optical Inspection
FEI, CLM + Dual Beam FIB, TEM Sample Prep tool:FEI, CLM + Dual Beam FIB, TEM Sample Prep tool Installed. Idle.
|
1
|
|
Inquire |
 |
East Fishkill, New York, United States |
|
 |
211546
|
FEI
|
FEI |
Meridian-IV |
in Metrology Equipment
FEI, Meridian-IV, Fault localization and analysis:FEI, Meridian-IV, Fault localization and analysis
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
 |