 |
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
| Make |
Model |
| |
|
$ |
|
 |
202147
|
FEI
|
FEI |
Ex-Situ Plucker |
in Microscopes, Optical Inspection
FEI, Ex-Situ Plucker, TEM Prep Tool:FEI, Ex-Situ Plucker, TEM Prep Tool S/N : 4471-03-05 2009 Vintage
|
1
|
|
Inquire |
 |
East Fishkill, New York, United States |
|
|
202148
|
FEI
|
FEI |
CLM |
in Microscopes, Optical Inspection
FEI, CLM, TEM Sample Prep tool:FEI, CLM, TEM Sample Prep tool FEI CLM-3D SEM/DUAL BEAM FIB REFURB - TEM Preparation Tool Cold Shutdown in the lab
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
202853
|
FEI
|
FEI |
FIB 200 |
in Microscopes, Optical Inspection
FEI, FIB, 200, TEM Sample Preparation:FEI, FIB, 200, TEM Sample Preparation in QRA Lab
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
202895
|
FEI
|
FEI |
DA300 |
in Microscopes, Optical Inspection
FEI, DA300, FIB, TEM Sample Preparation:FEI, DA300, FIB, TEM Sample Preparation In RQA Lab. Unhooked
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
203114
|
FEI
|
FEI |
TEMLINK - KY02, 14771-003 |
in Microscopes, Optical Inspection
FEI, Ex-Situ Plucker, TEM Prep ToolFEI, Ex-Situ Plucker, TEM Prep Tool:FEI, Ex-Situ Plucker, TEM Prep Tool
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
203117
|
FEI
|
FEI |
ExSolve 2 WTP EFEM |
in Microscopes, Optical Inspection
FEI, ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB:FEI, ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB In the fab. Warm shutdown. 
remarketing@surplusglobal.com
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
203118
|
FEI
|
FEI |
TEM LINK |
in Microscopes, Optical Inspection
FEI, TEM Link:FEI, TEM Link
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
203121
|
FEI
|
FEI |
Tecnai G2 F20 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
205917
|
FEI
|
FEI |
V600 |
in Microscopes, Optical Inspection
FEI, V600, 4022 262 70111, Single Beam FIB, :FEI, V600, 4022 262 70111, Single Beam FIB, S/N: D3019 In Lab. Idle 2007 Vintage. Maintenance was done by FEI GIS - Tungsten Hexacarbonyl Iodine Magnesium Sulfate 7-Hydrate Xeon Difluoride GIS injector removed for tool decon!
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
210388
|
FEI
|
FEI |
Micrion 2500 |
in Microscopes, Optical Inspection
FEI, Micrion 2500, FIB:FEI, Micrion 2500, FIB Installed. Idle. S/N : M2051
|
1
|
|
Inquire |
N* |
Burlington, Vermont, United States |
|
|
210390
|
FEI
|
FEI |
Micrion 9000 |
in Microscopes, Optical Inspection
FEI, Micrion 9000, FIB:FEI, Micrion 9000, FIB Installed. Idle S/N : M9023
|
1
|
|
Inquire |
N* |
Burlington, Vermont, United States |
|
|
210391
|
FEI
|
FEI |
Micrion 2500 |
in Microscopes, Optical Inspection
FEI, Micrion 2500, FIB:FEI, Micrion 2500, FIB Installed. Idle. S/N : M2051
|
1
|
|
Inquire |
N* |
Burlington, Vermont, United States |
|
|
209735
|
FEI
|
FEI |
CM20 |
in Microscopes, Optical Inspection
FEI Philips, CM20, TEM, Microscope:FEI Philips , CM20, TEM, Microscope Philips Crated in warehouse. Dual Tilt and Mac Controller upgrades Tool was up and operational when it was taken down and crated.
|
1
|
|
Inquire |
F* |
East Fishkill, New York, United States |
|
|
206667
|
FEI
|
FEI |
835 |
in Metrology Equipment
FEI, 835, Full Wafer Dual Beam FIB, 200mm :FEI, 835, Full Wafer Dual Beam FIB, 200mm Cold idle in Lab. 1999 Vintage S/N : 994701
|
1
|
|
Inquire |
F* |
Burlington, Vermont, United States |
|
|
211546
|
FEI
|
FEI |
Meridian-IV |
in Metrology Equipment
FEI, Meridian-IV, Fault localization and analysis:FEI, Meridian-IV, Fault localization and analysis
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
|
|
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