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Your search for Manufacturer: FEI
found:
  • 19 Listing(s) with a matching description:
 Offered (box) or Wanted (coins)  Item ID  Photo Short Description Product Type / Details # Price Notes Location
Make Model
  $  
195353
FEI  

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

 1 Inquire Taichung, Taichung City, Taiwan
FEI, DA300, 300mm, FIB, Defect Analysis:
FEI, DA300, 300mm, FIB, Defect Analysis

S/N : D253
202147
FEI  

FEI  

Ex-Situ Plucker 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

 1 Inquire East Fishkill, New York, United States
FEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

S/N : 4471-03-05

2009 Vintage
202148
FEI  

FEI  

CLM 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

 1 Inquire East Fishkill, New York, United States
FEI, CLM, TEM Sample Prep tool:

FEI, CLM, TEM Sample Prep tool

 

FEI CLM-3D SEM/DUAL BEAM FIB REFURB - TEM Preparation Tool

 

Cold Shutdown in the lab
202837
FEI  

FEI  

Strata FIB 205 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

 1 Inquire Singapore, Singapore
FEI, Strata FIB 205, TEM Sample Preparation:

FEI, Strata FIB 205, TEM Sample Preparation
202853
FEI  

FEI  

FIB 200  

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

 1 Inquire Singapore, Singapore
FEI, FIB, 200, TEM Sample Preparation:

FEI, FIB, 200, TEM Sample Preparation

in QRA Lab

 
202880
FEI  

FEI  

PHILIPS XL30S, SEM 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

 1 Inquire Singapore, Singapore
FEI PHILIPS XL30S, SEM:

FEI PHILIPS XL30S, SEM

 

PHILIPS XL 30S FEG SEM & DX4I SYSTEM
202881
FEI  

FEI  

Sirion XL30 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

 1 Inquire Singapore, Singapore
FEI, Sirion XL30, SEM:

FEI, Sirion XL30, SEM

SFEG Scanning Electron microscope with energy dispersive X-ray analys

In RQA Lab
202891
FEI  

FEI  

Sirion XL30 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

 1 Inquire Singapore, Singapore
FEI, Sirion XL30, SEM:

FEI, Sirion XL30, SEM
202895
FEI  

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

 1 Inquire Singapore, Singapore
FEI, DA300, FIB, TEM Sample Preparation:

FEI, DA300, FIB, TEM Sample Preparation

 

In RQA Lab.  Unhooked

 
203114
FEI  

FEI  

TEMLINK - KY02, 14771-003 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

 1 Inquire East Fishkill, New York, United States
FEI, Ex-Situ Plucker, TEM Prep ToolFEI, Ex-Situ Plucker, TEM Prep Tool:

FEI, Ex-Situ Plucker, TEM Prep Tool

 
203115
FEI  

FEI  

CLM 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

 1 Inquire Malta, New York, United States
FEI, CLM, TEM Sample Prep tool:

FEI, CLM, TEM Sample Prep tool

 

Connected Idle.

 
203116
FEI  

FEI  

CLM + Dual Beam 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

 1 Inquire Malta, New York, United States
FEI, CLM + Dual Beam FIB, TEM Sample Prep tool:

FEI, CLM + Dual Beam FIB, TEM Sample Prep tool

In Lab.  Idle
203117
FEI  

FEI  

ExSolve 2 WTP EFEM 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

 1 Inquire Malta, New York, United States
FEI, ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB:

FEI,  ExSolve 2 WTP EFEM, 300mm, High Accuracy FIB

In the fab.  Warm shutdown.
203120
FEI  

FEI  

Technia G2 F20 TEM 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

 1 Inquire Malta, New York, United States
FEI, TEM Tecnai G2 F20, TEM,:

FEI, TEM Tecnai G2 F20, TEM

,
203121
FEI  

FEI  

Tecnai G2 F20 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

 1 Inquire Malta, New York, United States
FEI, TEM Tecnai G2 F20, TEM,:

FEI, TEM Tecnai G2 F20, TEM,

 

On line, operational
199704
FEI  

FEI  

EXPIDA 

List all items of this typeScanning Electron Microscopes

in Microscopes, Optical Inspection

 1 Inquire F* Dresden, Saxony, Germany
FEI, EXPIDA, Dual Beam FIB, 300mm :
FEI, EXPIDA, Dual Beam FIB, 300mm 

COLD.  Off Line
202496
FEI  

FEI  

Helios 600 NanoLab 

List all items of this typeScientific and Laboratory Equipment - Other

in Metrology Equipment

 1 Inquire Dresden, Saxony, Germany
FEI, Helios 600, NanoLab, Dual Beam FIB, :

FEI, Helios 600 NanoLab, Dual Beam FIB

 

S/N : D404

 

Vintage : 2009 

 

 
203122
FEI  

FEI  

Helios 400 

List all items of this typeScientific and Laboratory Equipment - Other

in Metrology Equipment

 1 Inquire Malta, New York, United States
FEI, Helios 400, NanoLab Dual Beam FIB :

FEI, Helios 400, NanoLab Dual Beam FIB 
203283
FEI  

FEI  

Helios 400 

List all items of this typeScientific and Laboratory Equipment - Other

in Metrology Equipment

 1 Inquire East Fishkill, New York, United States
FEI, Helios 400, NanoLab Dual Beam FIB :

FEI, Helios 400, NanoLab Dual Beam FIB 

 

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.