Scanning Electron Microscopes

List other sub-categories under Microscopes, Optical Inspection

Show other product types under Microscopes, Optical Inspection

	Item ID	Photo	Item Description		Resolution Å	Magnification	Gun Type	Vacuum System	Power Requirements		#		Price	Notes	Location
			Make	Model					Voltage	Amps
					(Å)	(kX)			(V)	(A)			$
	227359		Applied Materials	Semvision G3							1		Inquire		Central District, Taichung City, Taiwan
	227360		Applied Materials	Semvision G3							1		Inquire		Central District, Taichung City, Taiwan
	227361		Applied Materials	Semvision G3							1		Inquire		Central District, Taichung City, Taiwan
	227826		FEI	FP5600 30 Titan80-300							1		Inquire		Dresden, Saxony, Germany
	225318		FEI	QUANTA 600F							1		Inquire		East Fishkill, New York, United States
	178294		Hitachi	AS5000							1		Inquire	F*	Singapore, Singapore
	178300		JEOL	7555							1		Inquire		Singapore, Singapore
	187765		JEOL	JWS 7555S							1		Inquire		Singapore, Singapore
	189689		JEOL	JWS-7515							1		Inquire		Singapore, Singapore
	202838		Zeiss	LEA 1530							1		Inquire		Singapore, Singapore

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.