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Your search for Manufacturer: FEI
found:
  • 3 individual listing(s) with a matching description:
 Offered (box) or Wanted (coins)  Item ID  Short Description Product Type / Details # Price Notes Location
Make Model
  $  
191594

FEI  

Tecnial TF-20 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

1 Inquire Burlington, Vermont, United States
FEI Tecnai F20 FE-TEM, :
FEI Tecnai F20 FE-TEM, 

S/N: D241

Main Instrument:  Tecnai F20 S-Twin 
 
FEI Accessories
 
STEM system for FEG
Tecnai Extended Workstation
HAADF Detector
TIA Software
Scanned Image Technique
EDX Spectroscopy Technique
EFTEM Technique
Tecnai Function with Digital Micrograph
EFTEM EELS Module
Tecnai Macro Facility
Compustage Rotation Holder
Compustage Low Background Double-Tilt Holder
Hingeable Mount, Binoculars
Tecnai Smart Tilt
Tecnai Compucentricity
 
Third-Party Accessories
 
NEC 20-inch LCD Monitor
EDAX Digital Pulse Processor, TEM
Gatan 794 MSC Camera, 1K (BROKEN)
Energy Filter, GIF 2001, Grade A, 1K (BROKEN)
Tecnai K Space Control
EDAX RTEM SUTW Detector
Gatan Single Tilt Rotation Holder, Low Background
Gatan Double Tilt Rotation Holder
 
Also, the Compustage has been upgraded to the newer Tecnai Osiris type.
191756

FEI  

Tecnia G2 30 S-TWIN 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

1 Inquire F*N* East Fishkill, New York, United States
FEI Tecnia G2 30 S-TWIN, TEM, 300KeV with LaB6 filament :
FEI Tecnia G2 30 S-TWIN: 300KeV LaB6 transmission electron microscope, volume imaging tool for semiconductor applications.  Also, can be used for biological samples.


Configuration :
  • CompuStage Single-tilt Holder   1ea. 
  • CompuStage Low-background Double-tilt Holder  2ea.
  • Gatan US1000 P (2k x 2k) Digital Camera on the microscope
  • Alignments for 300Kev and 200KeV but no alignments for 120KeV
  • Magnification Calibration Package  
  • Support PC
  • TEM Scripting  
  • LaB6 emitter (Denka / Mitsui)  
  • TMP and TMP Vacuum Software  





Cold idle in Lab.

2010 

S/N: 30TN6S / D906


FP 5032/20            Tecnai G2 30 S-TWIN

The Tecnai G2 30 S-TWIN is a 300 kV Transmission Electron Microscope. It is a high-resolution microscope, optimized for complete material characterization by combining analytical and imaging capabilities, and optimized tilt performance with ease of operation in all modes (TEM / STEM and analytical modes).

 

The Tecnai G2 TEM’s are equipped with the most advanced operating system currently available in the market of TEM systems, i.e. the Windows XP operating system. In the unique Tecnai concept, all microscope components, like the electron gun, the optical elements, the vacuum system and the stage, are completely digitally controlled. The task-oriented user interface allows users to automatically recall all optimized operating conditions including lens settings, gun parameters, optical alignments, aperture alignments (optional) for all the different techniques such as TEM, STEM, CBED, Diffraction and Analysis. Likewise, all detectors, such as CCD cameras, STEM detectors, EDS detectors and EELS detectors are computer controlled. Data acquisition, using these detectors, is embedded in the Tecnai G2 user interface and can be automated for acquisition processes, like tomography and spectrum imaging. Because of this sophisticated computer system, Tecnai G2 is especially suited for multi-user and multi-discipline environments.

In addition, the Tecnai G2 systems are equipped with the industry standard, reliable and fast FireWire data transfer technology. The system can be equipped with a single or dual monitor set-up depending on the number of detectors on the system.

Tecnai G2 can easily be connected to a network for exporting data and is ready for remote operation capabilities allowing for operation from an adjacent room and remote viewing during data acquisition.



195353

FEI  

DA300 

List all items of this typeMicroscopes - Other

in Microscopes, Optical Inspection

1 Inquire N* Taichung, Taichung City, Taiwan
FEI, DA300, 300mm, FIB, Defect Analysis:
FEI, DA300, 300mm, FIB, Defect Analysis

S/N : D253


NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.