Your reliable source for surplus semiconductor equipment!
 Fast  FIND      full search   tips    
SPECIALS LISTINGS About Us Contact Us
Serving  Our Guest Log in    Register to manage deal making
ALL CATEGORIES   Metrology Equipment   Microscopes, Optical Inspection    View    Search-by-Specs   

FULL DESCRIPTION of Item 178300

in Scanning Electron Microscopes
Item ID: 178300

Offered1 Offered Inquire


JEOL, Defect Review, 200mm

Status: Bagged & Skidded in warehouse

Parts tool.  Listed as major parts missing.

Tool ID: YSEM*02


Location: Taichung, Taichung City, Taiwan
Unit Price Inquire
Number of Units 1
Manufacturer JEOL
Model 7555
Extended Description  Details at Configuration_YSEM-02.pdf