 |
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
Make |
Model |
|
|
$ |
|
 |
212830
|
Rudolph Technologies
|
Rudolph Technologies |
Waferview 320 |
in Microscopes, Optical Inspection
Rudolph, WaferView 320 Macro Defect, 300mm:Rudolph, WaferView 320 Macro Defect, 300mm
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
213186
|
Rudolph Technologies
|
Rudolph Technologies |
Waferview 320 |
in Microscopes, Optical Inspection
Rudolph, WV320 Macro Defect, 300mm:Rudolph, WV320 Macro Defect, 300mmS/N : 2-05-W32-1485-BV-08
|
1
|
|
Inquire |
 |
Dresden, Saxony, Germany |
|
 |
230634
|
Rudolph Technologies
|
Rudolph Technologies |
AXI930 |
in Microscopes, Optical Inspection
Rudolph, AXI930, 300mm, S/N AXI-1196:Rudolph, AXI930, 300mm, S/N AXI-1196
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
 |
230635
|
Rudolph Technologies
|
Rudolph Technologies |
AXI930 |
in Microscopes, Optical Inspection
Rudolph, AXI930, 300mm, S/N AXI-1068:Rudolph, AXI930, 300mm, S/N AXI-1068
|
1
|
|
Inquire |
 |
Singapore, Singapore |
|
|
 |