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FULL DESCRIPTION of Item 203116

in Other Microscopes
Item ID: 203116

Offered 1 Offered Inquire


FEI, CLM + Dual Beam FIB, TEM Sample Prep tool

FEI, CLM + Dual Beam FIB, TEM Sample Prep tool

In Lab.  Idle

Tool ID: FIB2102

FEI, CLM + Dual Beam FIB, TEM Sample Prep tool

Location: Malta, New York, United States
Unit Price Inquire
Number of Units 1
Manufacturer FEI
Model CLM + Dual Beam
Description TEM Sample Prep
Extended Description  Details at FIB2102..pdf

Shipping & Handling:

All freight cost estimates are for dock to dock service only.
Any additional services, i.e. lift-gate, inside or residential delivery, must be requested at the time of sale and will be billed accordingly.
GLOBALFOUNDRIES is not responsible for any damage incurred during shipment. It is the buyer's responsibility to inspect packages for damage and to note any damage on bill of lading.
 
Payment:

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