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Your search for Manufacturer: KLA-Tencor
found:
  • 27 individual listing(s) with a matching description:
 Offered (box) or Wanted (coins)  Item ID  Short Description Product Type / Details # Price Notes Location
Make Model
  $  
191528

KLA-Tencor  

8100XP 

List all items of this typeCritical Dimension Scanning Electron Microscopes

in Microscopes, Optical Inspection

1 Inquire N* Singapore, Singapore
KLA-Tencor, 8100XP, CD SEM, 200mm
KLA-Tencor, 8100XP, CD SEM, 200mm

S/N: 425
178306

KLA-Tencor  

OP-2600 

List all items of this typeInterferometers

in Metrology Equipment

1 Inquire F* Singapore, Singapore
KLA-Tencor, Metrology, Optiprobe 2600, 200mm
Manufactured in 2000; Status: Bagged and Skidded

Tool was acquired in a line buy purchase.
No configuration information available.
Will need buyer inspection.
180206

KLA-Tencor  

AIT XUV 

List all items of this typeInterferometers

in Metrology Equipment

1 Inquire Taichung, Taichung City, Taiwan
KLA Tencor AIT XUV Laser Scanning Wafer Inspection 300mm
KLA Tencor AIT XUV Laser Scanning Wafer Inspection 300mm

185268

KLA-Tencor  

UV 1050 

List all items of this typeInterferometers

in Metrology Equipment

1 Inquire Singapore, Singapore
KLA Tencor UV 1050, 200mm, Thin Film Thickness Measurement

KLA Tencor UV 1050, 200mm, Thin Film Thickness Measurement
TOOL ID: FLMTK-03


Tool is in warehouse in Vapor Barrier Bag on Skids.

189333

KLA-Tencor  

Ultrapointe CRS 1010-S 

List all items of this typeInterferometers

in Metrology Equipment

1 Inquire Burlington, Vermont, United States
KLA-Tencor, Ultrapointe CRS 1010-S, 200mm
KLA-Tencor, Ultrapointe CRS 1010-S

Serial Number 59
189334

KLA-Tencor  

Ultrapointe CRS 1010-S, 

List all items of this typeInterferometers

in Metrology Equipment

1 Inquire Burlington, Vermont, United States
KLA-Tencor, Ultrapointe CRS 1010-S, 200mm

KLA-Tencor, Ultrapointe CRS 1010-S, 200mm

Hex No. 554X
KLA-Tencor 
Ultrapointe CR1010
Current Location:  tool Decon'd and moved to B. 966-1 Staging Area; tool wrapped in plastic

Condition - was operational when removed from Production 2-3+ yrs. ago.

 



Serial Number: 60

 
190103

KLA-Tencor  

Ultrapointe CRS 1010-S 

List all items of this typeInterferometers

in Metrology Equipment

1 Inquire F* Burlington, Vermont, United States
KLA-Tencor, Ultrapointe CRS 1010-S, 200mm

KLA-Tencor, Ultrapointe CRS 1010-S, 200mm

KLA-Tencor, Ultrapointe CRS 1010-S

Serial Number 55

 

Tool ID: 270X

190104

KLA-Tencor  

Ultrapointe CRS 1010-S 

List all items of this typeInterferometers

in Metrology Equipment

1 Inquire Burlington, Vermont, United States
KLA-Tencor, Ultrapointe CRS 1010-S, 200mm

KLA-Tencor, Ultrapointe CRS 1010-S, 200mm

KLA-Tencor, Ultrapointe CRS 1010-S

Serial Number 57

 

Tool ID: 271X

192344

KLA-Tencor  

Aleris Spectra CD 

List all items of this typeInterferometers

in Metrology Equipment

1 Inquire N* Singapore, Singapore
KLA - Tencor, Aleris Spectra DX, 300mm, Thin Film Measurement System
KLA - Tencor, Aleris Spectra DX, 300mm, Thin Film Measurement System

S/N : 200709100028

DOM : 6/1/2007
191538

KLA-Tencor  

5300 

List all items of this typeLithography Equipment

in Metrology Equipment

1 Inquire F* Singapore, Singapore
KLA- Tencor, 5300, Overlay, 200mm,
KLA- Tencor, 5300, Overlay, 200mm, 

Tool is Power On in Fab.

S/N: 3021R
189332

KLA-Tencor  

 

List all items of this typeMicroscope Inspection Items - Other

in Microscopes, Optical Inspection

1 Inquire Burlington, Vermont, United States
KLA-Tencor, Ultrapointe CRS 1010-S, 200mm
KLA-Tencor, Ultrapointe CRS 1010-S

Serial Number: 20


178314

KLA-Tencor  

2132 

List all items of this typeOptical Inspection - Other

in Microscopes, Optical Inspection

1 Inquire Singapore, Singapore
KLA-Tencor, Bright Field Inspection, 200mm
Manufactured in 1995; Status: Bagged and Skidded
178315

KLA-Tencor  

2132 

List all items of this typeOptical Inspection - Other

in Microscopes, Optical Inspection

1 Inquire Singapore, Singapore
KLA-Tencor, 2132 Bright Field Inspection, 200mm
Manufactured in 1996; Status: Bagged and Skidded
178321

KLA-Tencor  

Wafersight 

List all items of this typeOptical Inspection - Other

in Microscopes, Optical Inspection

1 Inquire F*N* Taichung, Taichung City, Taiwan
KLA-Tencor, Wafersight , 300mm
Manufactured in 2006; Status: Bagged and Skidded
189678

KLA-Tencor  

AIT Surfscan 

List all items of this typeParticle Counters

in Metrology Equipment

1 Inquire Singapore, Singapore
KLA-TENCOR, AIT 1, Surfscan, Darkfield Defect Inspection, 200mm
KLA-TENCOR, AIT 1, Surfscan, Darkfield Defect Inspection, 200mm


189683

KLA-Tencor  

CRS1010 Review Station 

List all items of this typeParticle Counters

in Metrology Equipment

1 Inquire Singapore, Singapore
KLA- Tencor, Review Station, CRS1010, 200mm
KLA- Tencor, Review Station, CRS1010, 200mm
192339

KLA-Tencor  

PUMA 9000 

List all items of this typeParticle Counters

in Metrology Equipment

1 Inquire Singapore, Singapore
KLA Tencor, PUMA 9000, 300mm, Dark Field Defect Inspection
KLA Tencor, PUMA 9000, 300mm, Dark Field Defect Inspection

S/N: 1055

DOM : 10/1/2006

Multiple pixel sizes (sL10, sL15, sL20, sL40,and sL60)
Nd:Yag 355nm pulsed incident laser
3 channel defector:DF2 ; BF X1

192746

KLA-Tencor  

SP3 

List all items of this typeParticle Counters

in Metrology Equipment

1 Inquire N* East Fishkill, New York, United States
KLA-Tencor, SP3, 300mm, Particle Counter
KLA-Tencor, SP3, 300mm, Particle Counter
178304

KLA-Tencor  

ES31 

List all items of this typeScanning Electron Microscopes

in Microscopes, Optical Inspection

1 Inquire F* Singapore, Singapore
178305

KLA-Tencor  

ES32 

List all items of this typeScanning Electron Microscopes

in Microscopes, Optical Inspection

1 Inquire Taichung, Taichung City, Taiwan
KLA-Tencor, ES32, E-beam Inspection, 300mm
Manufactured in 2007; Status: Bagged and Skidded
188890

KLA-Tencor  

eS810 

List all items of this typeScanning Electron Microscopes

in Microscopes, Optical Inspection

1 Inquire East Fishkill, New York, United States
KLA-TENCOR, eS810, e-beam inspection, 300mm
KLA-TENCOR, eS810, e-beam inspection, 300mm
188891

KLA-Tencor  

eS810 

List all items of this typeScanning Electron Microscopes

in Microscopes, Optical Inspection

1 Inquire F* East Fishkill, NY, United States
KLA-TENCOR, eS810, e-beam inspection, 300mm
KLA-TENCOR, eS810, e-beam inspection, 300mm

S/N: 5158014


Voltage Contrast and Large Physical Defect Inspection, Electron Beam Inspection (EBI).  Most updated KLA Tencor EBI tool available including Super Wide Optics.  Two 300mm FOUP load ports.  Vendor maintained throughout.  

186829

KLA-Tencor  

RS55 

List all items of this typeScientific and Laboratory Equipment - Other

in Metrology Equipment

1 Inquire Singapore, Singapore
KLA-Tencor, Omnimap RS55/TC, 200mm, Resistivity Measurement
KLA-Tencor, Omnimap RS55/TC, 200mm, Resistivity Measurement

191544

KLA-Tencor  

RS 55 

List all items of this typeScientific and Laboratory Equipment - Other

in Metrology Equipment

1 Inquire F* Singapore, Singapore
KLA-Tencor, RESMAP 55, 200mm
KLA-Tencor, RESMAP 55, 200mm


178326

KLA-Tencor  

CRS1010 

List all items of this typeWafer Inspection Microscopes

in Microscopes, Optical Inspection

1 Inquire F* Singapore, Singapore
KLA-Tencor, CRS1010 Defect Review, 200mm
Manufactured in 1997; Status: Bagged and Skidded
178327

KLA-Tencor  

INS3300 

List all items of this typeWafer Inspection Microscopes

in Microscopes, Optical Inspection

1 Inquire N* Taichung, Taichung City, Taiwan
KLA-Tencor, INS3300 , Microscopes, 300mm
Manufactured in 2005; Status: Bagged and Skidded
187960

KLA-Tencor  

LMS IPRO5 

List all items of this typeWafer Production Equipment - Other

in Wafer Fabrication Equipment

1 Inquire Burlington, VT, United States
KLA-Tencor, LMS IPRO5, Photomask Registration and CD Metrology System
KLA-Tencor, IPRO5, Photomask Registration and CD Metrology System

6 by 0.25 inch photomask and EUV masks

Static Positional Repeatability 3s (short therm: 0.5 nm
Dynamic positional repeatability 99.7% limit (long term): 0.8 nm
Positional accuracy 99/7% limit (long term): 1.0 nm
 
Light mod: Reflective and Transmitted
Measurement Principle: Edge detection of parallel edges and "Center of Gravity" algorithm.
 
Pattern Centrality Measurement capability
 
Illumination Source Wavelength: Continuous Wave Laser Source. 266 nm
Objective Lens:  80x, NA 0.80, 6.9 mm working distance
Stage Laser Positioning System: 0.15 nm (Lamda/4096)
Wavelength compensation: by ETALON
Field of View: 22.5 microns by 22.5 microns
Handing: RSB 200 SMIF Input/Output
Mask Stocker capacity: 2 x 4 6025 reticles
 
Software:
MS-Windows 7
KLA Job Processor
KLA LMSCOrr
KLA Deva
KLA CDCalib
KLA System Monitor
KLA LMSASCII
KLA GEM Module


NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.