|
Item ID |
Photo |
Short Description |
Product Type / Details |
#
|
Price |
Notes |
Location |
Make |
Model |
|
|
$ |
|
|
238042
|
Advantest
|
Advantest |
93000 |
in Metrology Equipment
ADVANTEST 93000, sn: DE04601132, Logic and Memory functional tester:ADVANTEST 93000, sn: DE04601132, Logic and Memory functional tester
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
238044
|
Advantest
|
Advantest |
93000 |
in Metrology Equipment
ADVANTEST 93000, sn: DE04601138, Logic and memory functional test:ADVANTEST 93000, sn: DE04601138, Logic and memory functional test
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
244640
|
Advantest
|
Advantest |
93000 |
in Metrology Equipment
ADVANTEST 93000, sn: DE04601388, Logic and memory functional test:ADVANTEST 93000, sn: DE04601388, Logic and memory functional test
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
238045
|
Advantest
|
Advantest |
93000 |
in Metrology Equipment
ADVANTEST 93000, sn: MY04600193, Logic and memory functional test:ADVANTEST 93000, sn: MY04600193, Logic and memory functional test
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
238046
|
Advantest
|
Advantest |
93000 |
in Metrology Equipment
ADVANTEST 93000, sn: MY04600539, Logic and memory functional test:ADVANTEST 93000, sn: MY04600539, Logic and memory functional test
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
246604
|
Applied Materials
|
Applied Materials |
CENTURA EPI |
in Wafer Fabrication Equipment
AMAT, CENTURA EPI, 200mm, S/N 21792:AMAT, CENTURA EPI, 200mm, S/N 21792
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
246375
|
Applied Materials
|
Applied Materials |
CENTURA |
in Wafer Fabrication Equipment
AMAT, Centura, sn: 402970-R3-MAC, 300mm:AMAT Centura 300mm
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
248208
|
Applied Materials
|
Applied Materials |
G3 Lite |
in Microscopes, Optical Inspection
AMAT, G3 Lite, 300mm, S/N W3041:AMAT, G3 Lite, 300mm, S/N W3041
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
|
204911
|
Applied Materials
|
Applied Materials |
Uvision 5 |
in Microscopes, Optical Inspection
Applied Materials, Uvision5, Bright Field Inspection, 300mm:Applied Materials, Uvision5, Bright Field Inspection, 300mm In the fab, Idle
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
248206
|
ASM
|
ASM |
ASM3200 |
in Wafer Fabrication Equipment
ASM, ASM3200, 300mm, S/N 034120:ASM, ASM3200, 300mm, S/N 034120
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
|
241154
|
Bruker
|
Bruker |
D8 Fabline |
in Metrology Equipment
BRUKER, D8 Fabline, 300 mm, BRUKER D8 FABLINE XRAY DEFRACTION:BRUKER, D8 Fabline, 300 mm BRUKER D8 FABLINE XRAY DEFRACTION
|
1
|
|
Inquire |
|
Dresden, Saxony, Germany |
|
|
209828
|
Bruker, D8FABLINE, 300mm, X-Ray Metrology
|
Bruker, D8FABLINE, 300mm, X-Ray Metrology |
in Microscopes, Optical Inspection
Bruker, D8FABLINE, 300mm, X-Ray Metrology:Bruker, D8FABLINE, 300mm, X-Ray Metrology
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
240475
|
ECEC
|
ECEC |
Micron2 |
in Metrology Equipment
ECEC, Micron2, s/n:15-308, Assembly, Die Attach:ECEC, Micron2, s/n:15-308, Assembly, Die Attach
|
1
|
|
Inquire |
|
Dresden, Saxony, Germany |
|
|
242920
|
Electroglas
|
Electroglas |
2001X |
in Test, Analysis and Measurement Equipment
Electroglas, 2001X, s/n: 96040033. Tool ID: 514164B:Electroglas, 2001X, s/n: 96040033. Tool ID: 514164B ELECTROGLAS 2001X Wafer Prober
|
1
|
|
Inquire |
|
Santa Clara, California, United States |
|
|
242919
|
Electroglas
|
Electroglas |
2001X |
in Test, Analysis and Measurement Equipment
Electroglas, 2001X, s/n: P84020452/110152. Tool ID: 79X6817AG:Electroglas, 2001X, s/n: P84020452/110152. Tool ID: 79X6817AG ELECTROGLAS 2001X Wafer Prober
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
242917
|
Electroglas
|
Electroglas |
2001X |
in Test, Analysis and Measurement Equipment
Electroglas, 2001X, s/n: Unknown. Tool ID: 4785151CZ:Electroglas, 2001X, s/n: Unknown. Tool ID: 4785151CZ ELECTROGLAS 2001X Wafer Prober
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
242916
|
Electroglas
|
Electroglas |
2001X |
in Test, Analysis and Measurement Equipment
Electroglas, 2001X, s/n: WMP91030194/141911, ELECTROGLAS 2001X Wafer Prober:Electroglas, 2001X, s/n: WMP91030194/141911 ELECTROGLAS 2001X Wafer Prober
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
242918
|
Electroglas
|
Electroglas |
2001X |
in Test, Analysis and Measurement Equipment
Electroglas, 2001X, s/n: WMP91110219/145449. Tool ID: 79X6817BX:Electroglas, 2001X, s/n: WMP91110219/145449. Tool ID: 79X6817BX ELECTROGLAS 2001X Wafer Prober
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
230317
|
FEI
|
FEI |
ExSolve CLM next Gen |
in Microscopes, Optical Inspection
FEI, ExSolve CLM next Gen, 300mm, S/N 9923535:FEI, ExSolve CLM next Gen, 300mm, S/N 9923535
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
230318
|
FEI
|
FEI |
ExSolve CLM next Gen |
in Microscopes, Optical Inspection
FEI, ExSolve CLM next Gen, 300mm, S/N 9923609:FEI, ExSolve CLM next Gen, 300mm, S/N 9923609
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
248238
|
Hitachi
|
Hitachi |
CG4100 |
in Microscopes, Optical Inspection
|
1
|
|
Inquire |
N* |
East Fishkill, New York, United States |
|
|
237745
|
HMI
|
HMI |
eScan 500 |
in Microscopes, Optical Inspection
HMI eScan 500, sn: ML07114, Defect Review, 300mm:HMI eScan 500, sn: ML07114, Defect Review, 300mm
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
202816
|
HSEB
|
HSEB |
Axiospect 301 |
in Microscopes, Optical Inspection
HSEB, Axiospect 301, Optical Microscope, 300mm:HSEB, Axiospect 301, Optical Microscope, 300mm Cold. Not working parts include: - Tango Controller (Microscope Stage controller
- Joystick and keyboard controller
- Micromotor for fingers edge gripper
- few powers supplies
The tool was running with Windows XP professional 2002 service pack 3.
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
202817
|
HSEB
|
HSEB |
Axiospect 301 |
in Microscopes, Optical Inspection
HSEB, Axiospect 301, Optical Microscope, 300mm:HSEB, Axiospect 301, Optical Microscope, 300mm
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
240478
|
Instron
|
Instron |
5564 |
in Metrology Equipment
INSTRON, 5564, s/n: 5564J2710, Pull Tester:INSTRON, 5564, s/n: 5564J2710, Pull Tester
|
1
|
|
Inquire |
|
Dresden, Saxony, Germany |
|
|
236360
|
Keithley
|
Keithley |
S425 |
in Metrology Equipment
KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2591:KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2591
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
236359
|
Keithley
|
Keithley |
S425 |
in Metrology Equipment
KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2593:KEITHLEY, S425, Kerf Parametric Tester, s/n: QMO2593
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
192419
|
Keithley Instruments
|
Keithley Instruments |
S425 |
in Metrology Equipment
Keithley, S425, Kerf Test, S/N QMO2572:Keithley, S425, Kerf Test, S/N QMO2572 Keithley standard matrix kerf tester
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
192418
|
Keithley Instruments
|
Keithley Instruments |
S425 |
in Metrology Equipment
Keithley, S450, Kerf Parametric Tester, S/N: QMO2573:Keithley, S450, Kerf Parametric Tester, S/N: QMO2573
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
238974
|
Keithley
|
Keithley |
S475 |
in Metrology Equipment
KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2593:KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2593
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
238977
|
Keithley
|
Keithley |
S475 |
in Metrology Equipment
KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2733:KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2733
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
238976
|
Keithley
|
Keithley |
S475 |
in Metrology Equipment
KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2734:KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2734
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
238975
|
Keithley
|
Keithley |
S475 |
in Metrology Equipment
KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2738:KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2738
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
238973
|
Keithley
|
Keithley |
S475 |
in Metrology Equipment
KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2792:KEITHLEY, S475, Kerf Parametric Tester, s/n: QMO2792
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
238978
|
Keithley
|
Keithley |
S600 |
in Metrology Equipment
KEITHLEY, S600, 25 pin kerf tester, s/n: QMO4104:KEITHLEY, S600, 25 pin kerf tester, s/n: QMO4104
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
242614
|
Keithley
|
Keithley |
S630 |
in Metrology Equipment
KEITHLEY, S630, 200mm, Parametric Test System, s/n: QMO4105:KEITHLEY, S630, Parametric Test System, s/n: QMO4105
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
237748
|
KLA-Tencor
|
KLA-Tencor |
AMI2900 |
in Microscopes, Optical Inspection
KLA AMI2900, sn: V000283, 300mm:KLA AMI2900, sn: V000283, 300mm KLA Advanced Macro Inspection Module
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
248207
|
KLA
|
KLA |
QTX-300 |
in Metrology Equipment
KLA, QTX-300, 300mm, S/N 1006304891:KLA, QTX-300, 300mm, S/N 1006304891
|
1
|
|
Inquire |
N* |
Singapore, Singapore |
|
|
243279
|
LAM
|
LAM |
2300 KIYO FX |
in Wafer Fabrication Equipment
LAM, 2300 KIYO FX, 300mm, ETX2300U6:ETX2300U2-T LAM-E5 KIYO FX HYDRA ARIA CORVUS-UPGRADE TO REPURPOSE ETX LAM, 2300 KIYO FX, 300mm, ETX2300U6 SN: KFXE-482(F1514910) - PM2 KFXE-482(F1514910) - PM3 KFXE-482(F1514910) - PM4
|
1
|
|
Inquire |
F* |
Malta, New York, United States |
|
|
236970
|
Advantest
|
Advantest |
V93000 |
in Metrology Equipment
LD96, Advantest, V93000, s/n PL000396, Logic and Memory Functional Tester:LD96 Advantest, V93000, s/n PL000396, Logic and Memory Functional Tester
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
241155
|
Lintec
|
Lintec |
RAD-2500M/8 |
in Metrology Equipment
Lintec Corp. RAD-2500M/8, 200mm, s/n: D1S-2575-AW:Lintec Corp. RAD-2500M/8, 200mm, s/n: D1S-2575-AW
|
1
|
|
Inquire |
|
Dresden, Saxony, Germany |
|
|
247204
|
Mattson Technology
|
Mattson Technology |
AST 2800 |
in Wafer Fabrication Equipment
Mattson, AST 2800, 200mm, S/N 97060361:Mattson, AST 2800, 200mm, S/N 97060361
|
1
|
|
Inquire |
|
Singapore, Singapore |
|
|
242617
|
Mosaid
|
Mosaid |
M420501 |
in Metrology Equipment
MOSAID, M420501, 200mm, s/n: 3654, Tool ID: KTH91M:MOSAID, M420501, 200mm, s/n: 3654, Tool ID: KTH91M MOSAID Memory Test System
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
242616
|
Mosaid
|
Mosaid |
M420501 |
in Metrology Equipment
MOSAID, M420501, 200mm, s/n: 3674, Tool ID: KTH90M:MOSAID, M420501, 200mm, s/n: 3674, Tool ID: KTH90M MOSAID Memory Test System
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
241510
|
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm
|
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm |
in Microscopes, Optical Inspection
NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm:NANOMETRICS, UNIFIRE 7900-L, s/n: Z3D-7900-0412-0028, 300 mm
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
246474
|
Nitto
|
Nitto |
NEL-DR3000IV |
in Metrology Equipment
NITTO, NEL-DR3000IV, sn: B491L22, 300mm, BSTA2:NITTO, NEL-DR3000IV, sn: B491L22, 300mm, BSTA2 Nitto Backside Taper
|
1
|
|
Inquire |
|
East Fishkill, New York, United States |
|
|
245895
|
RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa
|
RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa |
in Microscopes, Optical Inspection
RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa:RVSI, ws3500/3800 upgrade, s/n: ws-3015, 32a4qa RVSI VISUAL DEFECT SCANNER
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
245894
|
RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra
|
RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra |
in Microscopes, Optical Inspection
RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra:RVSI, ws3500/3800 upgrade, s/n: ws-3016, 32a4ra inspection scanner
|
1
|
|
Inquire |
|
Burlington, Vermont, United States |
|
|
240476
|
Sartorius
|
Sartorius |
LA310S |
in Metrology Equipment
SARTORIUS, LA310S, s/n: 13110486:SARTORIUS, LA310S, s/n: 13110486
|
1
|
|
Inquire |
|
Dresden, Saxony, Germany |
|
|
240456
|
Sonix
|
Sonix |
Quantum 350 |
in Metrology Equipment
SONIX, Quantum 350, s/n: Q350C018-0103M, analysis, reliability, investigation:SONIX, Quantum 350, s/n: Q350C018-0103M, analysis, reliability, investigation
|
1
|
|
Inquire |
|
Dresden, Saxony, Germany |
|
|
248242
|
Tokyo Electron Ltd
|
Tokyo Electron Ltd |
P12XL |
in Metrology Equipment
TEL, P12XL, 300mm, s/n: PH04204:TEL P12XL Prober
|
1
|
|
Inquire |
N* |
East Fishkill, New York, United States |
|
|
246567
|
Ultratech Inc
|
Ultratech Inc |
LSA100A |
in Wafer Fabrication Equipment
ULTRATECH LSA100A, s/n: 6114, Laser Spike Anneal:Laser Spike Anneal
|
1
|
|
Inquire |
|
Dresden, Saxony, Germany |
|
|
244284
|
Zeiss
|
Zeiss |
Merlin |
in Microscopes, Optical Inspection
ZEISS, Merlin, sn: 4234, Zeiss Merlin Scanning Electron Microscope:ZEISS, Merlin, sn: 4234, Zeiss Merlin Scanning Electron Microscope
|
1
|
|
Inquire |
|
Malta, New York, United States |
|
|
|