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FULL DESCRIPTION of Item 190839

in FT-IR Spectrometers
Item ID: 190839

Offered1 Offered Inquire


Semilab, AMS, IR3100S, Small spot, IR-Near IR, Metrology, 300mm

Semilab, AMS, IR3100S, Small spot, IR-Near IR, Metrology, 300mm

Complete IR3100 small spot Model-Based IR to Near-IR
semiconductor metrology tool configured with a unique
all-optical method. The measurement is both non-contact
and non-destructive with rapid analysis of deep trenches
and other high aspect ratio structures on product wafers.

S/N: 3039s

Tool ID: AMS2100


Location: Malta, New York, United States
Unit Price Inquire
Number of Units 1
Manufacturer Semilab
Model IR3100s
Wafer Size Range 
  Set Size 300 mm
Extended Description  Details at ASM IR3100s Configuration.pdf
Condition Very Good
Year of Manufacture 2011

Shipping & Handling:

All freight cost estimates are for dock to dock service only.
Any additional services, i.e. lift-gate, inside or residential delivery, must be requested at the time of sale and will be billed accordingly.
GLOBALFOUNDRIES is not responsible for any damage incurred during shipment. It is the buyer's responsibility to inspect packages for damage and to note any damage on bill of lading.
 
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