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FULL DESCRIPTION of Item 180514

in Critical Dimension Scanning Electron Microscopes
Item ID: 180514

Offered1 Offered Inquire


Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM

MULTIPLE UNITS AVAILABLE.  PLEASE INQUIRE.


SEM - Critical Dimension (CD) Measurement

Currently configured for 300mm wafers

CE Marked

Install Type: Stand Alone

Cassette Interface:

• (3) 300mm FOUP

Roll-Around Ergo-Station w/Touch-Screen

Status Lamp

Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8)

Power Requirements: V 120/208, 8A, Single Phase / 3-Phase, 5-Wire, Freq 50/60Hz

 

Software Options:

• Slope Reconstruction

• CH Analysis

• Profile Grade

• Discrete Inspection

• Defect Review

• ARAMS (ES8

 

Tool ID: KA03

Tool ID: KA03

Applied Materials NanoSEM 3D, 300mm wafers, CD SEM
  Click to see additional image(s)... other image

Location: East Fishkill, NY, United States
Unit Price Inquire
Number of Units 1
Manufacturer Applied Materials
Model NanoSEM 3D
Wafer Size Range 
  Set Size 300 mm
Year of Manufacture 2002

Shipping & Handling:

All freight cost estimates are for dock to dock service only.
Any additional services, i.e. lift-gate, inside or residential delivery, must be requested at the time of sale and will be billed accordingly.
GLOBALFOUNDRIES is not responsible for any damage incurred during shipment. It is the buyer's responsibility to inspect packages for damage and to note any damage on bill of lading.
 
Payment:

All other sales, including foreign sales, are prepayment only.
MasterCard, VISA, Discover and AMEX are accepted at sellers discretion.