Your reliable source for surplus semiconductor equipment!
 Fast¬†¬†FIND      full search   tips    
SPECIALS LISTINGS About Us Contact Us
Serving  Our Guest Log in    Register to manage deal making
ALL CATEGORIES   Metrology Equipment   Microscopes, Optical Inspection    View    Search-by-Specs   

FULL DESCRIPTION of Item 178296

in Scanning Electron Microscopes
Item ID: 178296

Offered1 Offered Inquire


Hitachi, Metrology, Microanalysis System 300mm

Status: Bagged and Skidded

Tool ID: MAC0813


Location: Taichung, Taichung City, Taiwan
Unit Price Inquire
Number of Units 1
Manufacturer Hitachi
Model Microanalysis System
Extended Description  Details at MAC0813 Tool configure.pdf
click to view document at right in new windowMore Information
click to view document at right in new windowMore Information