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FULL DESCRIPTION of Item 178294

in Scanning Electron Microscopes
Item ID: 178294

Offered1 Offered Inquire


Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm

Status: Cold Shutdown

Wafer Particle & Defect Analysis system AS5000

Defect data server




Tool ID: J-J02

Hitachi, Metrology, Wafer Particle & Defect Analysis , AS50002, 200mm

Location: Singapore, Singapore
Unit Price Inquire
Number of Units 1
Manufacturer Hitachi
Model AS5000
Extended Description  Details at Configuration J-J02.pdf